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David Delafosse
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Documents
Identifiants chercheurs
- david-delafosse
- ResearcherId : D-5885-2013
- 0000-0002-4915-9173
- Google Scholar : https://scholar.google.fr/citations?user=OHfosH4AAAAJ&hl=fr
- IdRef : 057384258
- ResearcherId : http://www.researcherid.com/rid/D-5885-2013
- Google Scholar : https://scholar.google.fr/citations?user=OHfosH4AAAAJ
Présentation
Publications
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Anodized titanium oxide thickness estimation with ellipsometry, reflectance spectra extrema positions and electronic imaging: importance of the interfaces electromagnetic phase-shiftThin Solid Films, 2020, pp.138181. ⟨10.1016/j.tsf.2020.138181⟩
Article dans une revue
ujm-02861487v1
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