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0.4-µm InP/InGaAs DHBT with a 380-GHz fT > 600-GHz fMAX and BVCE0 > 4.5 V

 Nil Davy , Virginie Nodjiadjim , Muriel Riet , Colin Mismer , Marina Deng , et al.
2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), Dec 2021, Monterey, United States. ⟨10.1109/BCICTS50416.2021.9682209⟩
Communication dans un congrès hal-03407761v1

Optically-Gated CNTFET compact model including source and drain Schottky barrier

 Si-Yu Liao , Montassar Najari , Cristell Maneux , Sebastien Fregonese , Thomas Zimmer , et al.
5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, Mar 2010, Hammamet, Tunisia. pp.1
Communication dans un congrès hal-00584845v1

A Scalable Model for Temperature Dependent Thermal Resistance of SiGe HBTs

 Kumar Sahoo Amit , Sebastien Fregonese , Mario Weib , Cristell Maneux , Thomas Zimmer
IEEE Bipolar / BiCMOS Circuits and Technology Meeting, Sep 2013, Bordeaux, France
Communication dans un congrès hal-00905673v1

Avalanche Compact model featuring SiGe HBTs Characteristics up to BVCBO

 Mathieu Jaoul , Didier Céli , Cristell Maneux
HICUM Workshop 2017, 2017, Dresden, Germany
Communication dans un congrès hal-02511645v1

Qualitative Assessment of Epitaxial Graphene FETs on SiC Substrates via Pulsed Measurements and Temperature Variation

 Mukherjee Chhandak , Sebastien Fregonese , Thomas Zimmer , H. Happy , David Mele , et al.
Solid State Device Research Conference (ESSDERC), 2014, 44th European, Sep 2014, Venise, Italy. ⟨10.1109/ESSDERC.2014.6948821⟩
Communication dans un congrès hal-01090864v1

Low frequency noise as a reliability diagnostic tool in compound semiconductor transistors

 Nathalie Labat , Nathalie Malbert , Cristell Maneux , Andre Touboul
Microelectronics Reliability, 2004, 44, pp.1
Article dans une revue hal-00183088v1

Experimental analysis and 2D simulation of AlGaAs/GaAs HBT base leakage current

 Cristell Maneux , Nathalie Labat , Nathalie Saysset , Andre Touboul , Yves Danto
Microelectronics Reliability, 1997, 37, pp.1
Article dans une revue hal-00183096v1

Analysis of avalanche regime in InP HBT's using physical simulation - Implementation in a DC Model

 Cristell Maneux , Jean-Christophe Martin , Nathalie Labat , Andre Touboul , Muriel Riet , et al.
International Conference on Industrial Technology, 2004, Tunisia. pp.1
Communication dans un congrès hal-00183100v1

A Hicum SOI extension

 Sébastien Fregonese , Gregory Avenier , Cristell Maneux , A. Chantre , Thomas Zimmer
5th European HICUM Workshop, 2005, France
Communication dans un congrès hal-00181989v1

Modélisation compacte du transistor à nanotube de carbone

 Cristell Maneux , Johnny Goguet , Thomas Zimmer
Journées thématiques du Club EEA, Nanoélectronique, Mar 2006, France
Communication dans un congrès hal-00181996v1

Compact Model of a Dual Gate CNTFET: Description and Circuit Application

 Johnny Goguet , Sebastien Fregonese , Cristell Maneux , Thomas Zimmer
8th IEEE Conference on Nanotechnology, Aug 2008, Arlington, TEXAS, USA, United States. pp.Page(s):388 - 389, ⟨10.1109/TED.2007.902719⟩
Communication dans un congrès hal-00319955v1
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SPICE Modeling in Verilog-A for Photo-Response in UTC-Photodiodes Targeting Beyond-5G Circuit Design

 Mukherjee Chhandak , D. Guendouz , M. Deng , H. Bertin , A. Bobin , et al.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2023, 42 (9), pp.3045-3052. ⟨10.1109/TCAD.2023.3236277⟩
Article dans une revue hal-04230873v1

CNTFET modeling and reconfigurable logic circuit design

 Ian O'Connor , Junchen Liu , Frédéric Gaffiot , Fabien Prégaldiny , Cristell Maneux , et al.
IEEE Transactions on Circuits and Systems, 2007, 54 (11), pp.2365-2379. ⟨10.1109/TCSI.2007.907835⟩
Article dans une revue hal-00187137v1

Why neuromorphic computing need novel 3D technologies? A view from FVLLMONTI European project consortium (Invited)

 Cristell Maneux , Mukherjee Chhandak , Marina Deng , Maeva Dubourg , Lucas Réveil , et al.
High Performance Embedded Architecture and Compilation, Computing Systems Week, (HiPEAC CSW) Autumn 2021, Oct 2021, Lyon, France
Communication dans un congrès hal-03408071v1
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Circuit Design Flow dedicated to 3D vertical nanowire FET

 Cristell Maneux , Mukherjee Chhandak , Marina Deng , Bruno Neckel Wesling , Lucas Réveil , et al.
IEEE Latin American Electron Devices Conference (LAEDC 2022), Jul 2022, Puebla, Mexico. ⟨10.1109/LAEDC54796.2022.9908233⟩
Communication dans un congrès hal-03765071v1
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Evidence of Trapping and Electrothermal Effects in Vertical Junctionless Nanowire Transistors

 Yifang Wang , Houssem Rezgui , Mukherjee Chhandak , Marina Deng , Abhishek Kumar , et al.
9th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS) 2023, May 2023, Tarragona, Spain
Communication dans un congrès hal-04231605v1

TCAD modeling of NPN-SI-BJT electrical performance improvement through SiGe extrinsic stress layer

 Al-Sadi Mahmoud , Sébastien Fregonese , Cristell Maneux , Thomas Zimmer
Materials Science in Semiconductor Processing, 2010, 13 (5-6), pp. 344-348. ⟨10.1016/j.mssp.2011.03.002⟩
Article dans une revue istex hal-00671678v1
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Analysis of Energy-Delay-Product of a 3D Vertical Nanowire FET Technology

 Ian O'Connor , Arnaud Poittevin , Sébastien Le Beux , Alberto Bosio , Zlatan Stanojevic , et al.
EuroSOI-ULIS, Sep 2021, Caen, France. ⟨10.1109/EuroSOI-ULIS53016.2021.9560180⟩
Communication dans un congrès hal-03407210v1

Multiscaled simulation methodology for neuro-inspired circuits demonstrated with an organic memristor

 Christopher Bennett , Jean-Etienne Lorival , François Marc , Théo Cabaret , Bruno Jousselme , et al.
IEEE Transactions on Multi-Scale Computing Systems, 2017, PP (99), pp.1 - 1. ⟨10.1109/TMSCS.2017.2773523⟩
Article dans une revue cea-01656702v1

Reliability-Aware Circuit Design Methodology for Beyond-5G Communication Systems

 Chhandak Mukherjee , Bertrand Ardouin , Jean-Yves Dupuy , Virginie Nodjiadjim , Muriel Riet , et al.
IEEE Transactions on Device and Materials Reliability, 2017, 17 (3), pp.490 - 506. ⟨10.1109/TDMR.2017.2710303⟩
Article dans une revue hal-01670929v1

1/f Noise in 3D vertical gate-all-around junction-less silicon nanowire transistors

 Chhandak Mukherjee , Cristell Maneux , Julien Pezard , Guilhem Larrieu
47th IEEE ESSDERC, Sep 2017, Leuven, Belgium. ⟨10.1109/ESSDERC.2017.8066585⟩
Communication dans un congrès hal-01695259v1
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Nanoscale Thermal Transport in Vertical Gate-All-Around Junctionless Nanowire Transistors—Part I: Experimental Methods

 Mukherjee Chhandak , H. Rezgui , Y. Wang , M. Deng , A. Kumar , et al.
IEEE Transactions on Electron Devices, 2023, pp.1-7. ⟨10.1109/TED.2023.3321277⟩
Article dans une revue hal-04296517v1

COMPACT MODELING OF THE SCHOTTKY BARRIER JUNCTION IN THE CARBON NANOTUBE FIELD EFFECT TRANSISTOR

 Montassar Najari , Sébastien Frégonèse , Cristell Maneux , Thomas Zimmer , Hasséne Mnif , et al.
JNTE 08, French Symposium on Emerging Technologies for micro-nanofabrication, Nov 2008, Toulouse, France
Communication dans un congrès hal-00337489v1

Si/SiGe:C and InP/GaAsSb Heterojunction Bipolar Transistors for THz Applications

 Pascal Chevalier , Michael Schroter , Colombo R. Bolognesi , Vincenzo d'Alessandro , Maria Alexandrova , et al.
Proceedings of the IEEE, 2017, 105 (6), pp.1035 - 1050. ⟨10.1109/JPROC.2017.2669087⟩
Article dans une revue hal-01639677v1

Fiabilité du TBH sur InP - Analyse du Bruit aux Basses Fréquences

 Jean-Christophe Martin , Cristell Maneux , Nathalie Labat , Andre Touboul , Muriel Riet , et al.
Journées Nationales Microondes - JNM, 2003, France. pp.1
Communication dans un congrès hal-00183470v1

Experimental Evidence of Impact Ionisation in InP HBT's Designed for Rapid Digital Applications:Implementation in a DC Model

 Cristell Maneux , Jean-Christophe Martin , Nathalie Labat , Andre Touboul , Muriel Riet , et al.
ESSDERC, 2001, Germany. pp.1
Communication dans un congrès hal-00183474v1

Evolution of base current in C-In doped GaInP/GaAs HBT under current induced stress

 Cristell Maneux , Nathalie Labat , Pascal Fouillat , Andre Touboul , Yves Danto
European Solid State Device Research Conference (Ed. Frontières), ESSDERC, 1998, France. pp.1
Communication dans un congrès hal-00183480v1

Quality evaluation of S-HEMTs and PM-HEMTs by drain current transients and L.F. channel noise analysis

 Nathalie Saysset , Cristell Maneux , Nathalie Labat , Andre Touboul , Yves Danto
ESREF'95, 1995, France. pp.1
Communication dans un congrès hal-00183486v1

Quality evaluation of AlGaAs/GaAs and AlGaAs/InGaAs/GaAs HEMTs by LF excess noise analysis

 Nathalie Saysset , Cristell Maneux , Nathalie Labat , Andre Touboul , Yves Danto
ESREF'94, 1994, United Kingdom. pp.1
Communication dans un congrès hal-00183489v1

Scalable Bipolar Transistor Modelling with HICUM

 Sébastien Fregonese , Dominique Berger , Thomas Zimmer , Cristell Maneux , Pierre-Yvan Sulima , et al.
IEEE Mixed Design of Integrated Circuits and Systems, 2004, Poland. pp.1
Communication dans un congrès hal-00181984v1
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