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Claudio Lazzari

11

Documents

Identifiants chercheurs

claudio-lazzari
0000-0003-3703-0302
Google Scholar : https://scholar.google.com/citations?user=Op4-kSAAAAAJ&hl=es
IdRef : 130835722

Présentation

Publications

lorena-anghel

	A Case Study on Phase-Locked Loop Automatic Layout Generation and Transient Fault Injection Analysis C. Lazzari , Lorena Anghel , Ricardo Reis Journal of Electronic Testing: : Theory and Applications, 2007, 23 (6), pp.625-633. ⟨10.1007/s10836-007-5055-x⟩ Article dans une revue hal-00226434v1

	An Analysis and Design Technique to Reduce SET Sensitivity in Combinational Integrated Circuits C. Lazzari , T. Assis , F. Kastensmidt , G. Wirth , Lorena Anghel 16th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-Soc'08), Oct 2008, Rhodes Island, Greece. pp.114-117 Communication dans un congrès hal-01408783v1
	SET-Factor: An Analysis and Design Tool to Reduce SET Sensitivity in Integrated Circuits C. Lazzari , T. Assis , F. Kastensmidt , G. Wirth , Lorena Anghel 13th IEEE European Test Symposium (ETS'08), May 2008, Verbania, Italy Communication dans un congrès hal-01408791v1
	Efficient Timing Closure with a Transistor Level Design Flow C. Lazzari , Cr. Santos , A. Ziesemer , Lorena Anghel , Ricardo Reis IFIP International Conference on Very Large Scale Integration (VLSI-SoC'07), Oct 2007, Atlanta, GA, United States. pp.312-315 Communication dans un congrès hal-01408793v1
	Efficient Transistor Sizing for Soft Error Protection in Combinational Logic Circuits C. Lazzari , F. Lima , Lorena Anghel , Ricardo Reis 2nd International Workshop on Dependable Circuit Design (DECIDE’07), Dec 2007, Buenos Aires, Argentina Communication dans un congrès hal-01408792v1
	SET fault injection methods in analog circuits: case study A. Ammari , Lorena Anghel , Régis Leveugle , C. Lazzari , Ricardo Reis 8th Latin-American Test Workshop (LATW'07), Mar 2007, Cuzco, Peru. pp.155-160 Communication dans un congrès hal-00156749v1
	Phase-Locked Loop Automatic Layout Generation and Transient Fault Injection Analysis: A Case Study C. Lazzari , Ricardo Reis , Lorena Anghel 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006, Lake Como, Italy. pp.165-172, ⟨10.1109/IOLTS.2006.48⟩ Communication dans un congrès hal-00143423v1
	Multiple Defects Tolerant Devices for Unreliable Future Nanotechnologies C. Lazzari , Lorena Anghel , M. Nicolaidis IEEE Latin American Test Workshop (LATW'06), Mar 2006, Buenos Aires, Argentina Communication dans un congrès hal-01408796v1
	On implementing a soft error hardening technique by using an automatic layout generator: case study C. Lazzari , Lorena Anghel , Ricardo Reis 11th-IEEE-International-On-Line-Testing-Symposium., 2005, French Riviera, France. pp.29-34, ⟨10.1109/IOLTS.2005.45⟩ Communication dans un congrès hal-00015449v1
	Soft error circuit hardening techniques implementation using an automatic layout generator C. Lazzari , Lorena Anghel , Ricardo Reis Proceedings of IEEE Latin American Test Workshop (LATW'05), Mar 2005, Salvador Bahia, Brazil. pp.175-180 Communication dans un congrès hal-00460557v1

	A Transistor Placement Technique Using Genetic Algorithm And Analytical Programming C. Lazzari , Lorena Anghel , Ricardo Reis VLSI-SOC: From Systems to Silicon, (selected contributions from VLSI-SoC'05), Springer, pp.331-344, Vol.240, 2007, Series: IFIP International Federation for Information Processing, ⟨10.1007/978-0-387-73661-7_21⟩ Chapitre d'ouvrage hal-00191996v1