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Number of documents

22


Yann Le Bihan   

Journal articles10 documents

  • Yann Le Bihan, József Pávó, Claude Marchand. Partial least square regression: an analysis tool for quantitative non-destructive testing. European Physical Journal: Applied Physics, EDP Sciences, 2014, 67 (3), pp.30901. ⟨10.1051/epjap/2014130487⟩. ⟨hal-01099333⟩
  • A. Ospina, L. Santandrea, Y. Le Bihan, C. Marchand. Modeling of thin structures in eddy current testing with shell elements. European Physical Journal: Applied Physics, EDP Sciences, 2010, 52 (2), ⟨10.1051/epjap/2010082⟩. ⟨hal-00634365⟩
  • Alejandro Ospina Vargas, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Modeling of thin structures in eddy current testing with shell elements. European Physical Journal: Applied Physics, EDP Sciences, 2010, 52 (2), pp.23303-23308. ⟨10.1051/epjap/2010082⟩. ⟨hal-00555697⟩
  • Yahya Choua, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Study of the Degrees of Freedom Management of Dual Formulations for the Modelling of Thin Cracks in Eddy Current Testing. Sensor letters, American Scientific Publishers, 2009, 7 (5), pp. 475-479. ⟨hal-00447220⟩
  • Alejandro Ospina Vargas, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Electromagnetic Field Computation in Magnetic and Conductive Thin sheets. Sensor letters, American Scientific Publishers, 2009, 7 (3), pp. 480-485. ⟨hal-00447227⟩
  • Cyril Ravat, Yann Le Bihan, Pierre-Yves Joubert, Claude Marchand. Non-destructive evaluation of small defects using an eddy current microcoil sensor array. Sensor letters, American Scientific Publishers, 2009, 7 (3), pp. 400-405. ⟨hal-00447228⟩
  • Mohamed Bensetti, Yahya Choua, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Adaptive mesh refinement and probe signal calculation in eddy current NDT by complementary formulations. IEEE Transactions on Magnetics, Institute of Electrical and Electronics Engineers, 2008, 44 (6), pp.1646 - 1649. ⟨hal-00352639⟩
  • Yann Le Bihan, J. Pavo, Claude Marchand. Characterization of small cracks in eddy current testing. European Physical Journal: Applied Physics, EDP Sciences, 2008, 43 (2), pp.231-237. ⟨10.1051/epjap:2008112⟩. ⟨hal-00761612⟩
  • Cyril Ravat, Yann Le Bihan, Pierre-Yves Joubert, Claude Marchand. Comparative Study of Coil Arrangements for the EC Testing of Small Surface Breaking Defects. Studies in Applied Electromagnetics and Mechanics, 2008, 31, pp.288-293. ⟨hal-00354401⟩
  • Laurent Santandrea, Yann Le Bihan, Claude Marchand. A finite element modelling tool of a buried system for glass furnace wall characterization. European Physical Journal: Applied Physics, EDP Sciences, 2007, pp.179-183. ⟨hal-01547605⟩

Conference papers11 documents

  • Yann Le Bihan, Claude Marchand, Joszef Pavo. Quantitative Evaluation of Small Anomalies in Non-Destructive Testing using Partial Least Square Regression. Colloque Inductique 2013, Apr 2013, Tizi-Ouzou, Algeria. pp.83-84. ⟨hal-00932700⟩
  • Alejandro Ospina Vargas, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Evaluation of a Planar Coil Model Using Shell Elements. PIERS 2011, Mar 2011, Morocco. pp.1. ⟨hal-00712532⟩
  • Guillaume Krebs, Yann Le Bihan, Claude Marchand, Francisco Alves. Prise en compte des milieux fins dans le CND CF grâce à la méthode overlapping. 2ème Colloque National sur l'Inductique, May 2011, Béjaïa, Algérie. ⟨hal-00712509⟩
  • Yann Le Bihan, Claude Marchand, Joszef Pavo, Guillaume Krebs. Partial Least Square Regression for Quantitative Evaluation of Small Anomalies in Non-Destructive Testing. CEFC 2010, May 2010, Chicago, United States. 4 p. ⟨hal-00555707⟩
  • Laurent Santandréa, Yahya Choua, Alejandro Ospina Vargas, Yann Le Bihan, Claude Marchand. Analyse of different programming solutions adapted to block matrix type in electromagnetic modelling. COMPUMAG, Nov 2009, FLorianapolis, Brésil. ⟨hal-00447267⟩
  • Yann Le Bihan, Claude Marchand, Francisco Alves. Modélisation en CND : de la conception à l'inversion. CNI'09, 2009, Algérie. pp.10. ⟨hal-00555700⟩
  • Alejandro Ospina Vargas, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Planar Coil Model using Shell Elements Applied to an Eddy-Current Non-Destructive Testing. 17th Conference on the computation of electromagnetics fields, COMPUMAG 2009, Dec 2009, Florianopolis, Brésil. pp. 873-874. ⟨hal-00447249⟩
  • Yahya Choua, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Mesh Refinement in Eddy Current Testing with Separated T-R probes. COMPUMAG, Nov 2009, Florianópolis, Brazil. pp. 1048-1049. ⟨hal-00447250⟩
  • Cyril Ravat, P.-Y. Joubert, Yann Le Bihan, Claude Marchand, M. Woytazik, et al.. Performances d'une sonde matricielle à microbobines pour la détection par courants de Foucault de défauts débouchants de faibles dimensions. Journées COFREND, May 2008, Toulouse, France. ⟨hal-00354404⟩
  • Cyril Ravat, P.-Y. Joubert, Yann Le Bihan, Claude Marchand. Non destructive evaluation of small defects using an eddy current microcoil sensor array. EMSA 2008 Conference, Jul 2008, Caen, France. ⟨hal-00353081⟩
  • Yahya Choua, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Study of the DOF management of dual formulations for the modelling of thin cracks in ECT. European Magnetic Sensors and Actuators Conference EMSA 2008 Conference, Jul 2008, Caen, France. ⟨hal-00352908⟩

Poster communications1 document

  • Laurent Santandrea, Yayha Choua, Yann Le Bihan, Claude Marchand. Adaptive mesh refinement for eddy current testing finite element computations. Sixth International Conference on Computation in Electromagnetics (CEM 2006), Apr 2006, Aachen, Germany. 2006, Proceedings - Sixth International Conference on Computational Electromagnetics, CEM 2006. ⟨hal-01547509⟩