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	Statistical Analysis of Current-based Features for Dip Voltage Fault Detection and Isolation Amel Adouni , Dhia Chariag , Claude Delpha , Demba Diallo , Lassaad Sbita 43rd Annual Conference of the IEEE Industrial Electronics Society (IECON 2017), Oct 2017, Beijing, China. ⟨10.1109/iecon.2017.8216748⟩ Communication dans un congrès hal-01578478v1
	Voltage Dip fault Detection and Identification based on Principal Component Analysis : application to Wind Energy Conversion System Amel Adouni , Claude Delpha , Demba Diallo , Lassaad Sbita 24th International Symposium on Industrial Electronics - ISIE 2015, Jun 2015, Rio de Janeiro, Brazil. ⟨10.1109/ISIE.2015.7281584⟩ Communication dans un congrès hal-01169223v1

Claude Delpha