Christophe Krzeminski

Curriculum Vitae

79%

Libre accès

Documents

Affiliations actuelles

1067373

Identifiants chercheurs

christophe-krzeminski
IdRef : 060156406

Contact

Présentation

français
anglais

Domaines de recherche

Sciences de l'ingénieur [physics]

Compétences

Modeling Nanoelectronics Materials molecular Processing

Publications

	Electrical molecular switch addressed by chemical stimuli Hassib Audi , Yannick Viero , N Alwhaibi , Zhongrui Chen , Maksym Iazykov Nanoscale, 2020, 12 (18), pp.10127-10139. ⟨10.1039/D0NR02461A⟩ Article dans une revue hal-02555592v1
	Supramolecular self-assembly on the B-Si(111)-(√3x√3) R30° surface: From single molecules to multicomponent networks Younes Makoudi , Judicaël Jeannoutot , Frank Palmino , Frédéric Cherioux , Guillaume Copie Surface Science Reports, 2017, 72, pp.316 - 349. ⟨10.1016/j.surfrep.2017.06.001⟩ Article dans une revue hal-02131397v1
	A New Photomechanical Molecular Switch Based on a Linear π-Conjugated System Stéphane Lenfant , Yannick Viero , Christophe Krzeminski , Dominique Vuillaume , Dora Demeter Journal of Physical Chemistry C, 2017, 121 (22), pp.12416-12425. ⟨10.1021/acs.jpcc.7b01240⟩ Article dans une revue hal-02564470v1
	Surface-Induced Optimal Packing of Two-Dimensional Molecular Networks Guillaume Copie , Fabrizio Cleri , Younes Makoudi , Christophe Krzeminski , Maxime Berthe Physical Review Letters, 2015, 114 (6), pp.066101. ⟨10.1103/PhysRevLett.114.066101⟩ Article dans une revue hal-01118764v1
	Atomic Scale Modelling of Two-Dimensional Molecular Self-Assembly on a Passivated Si Surface Guillaume Copie , Younes Makoudi , Christophe Krzeminski , Frederic Cherioux , Frank Palmino Journal of Physical Chemistry C, 2014, 118 (24), pp.12817-12825. ⟨10.1021/jp501955v⟩ Article dans une revue hal-01015467v1
	Nanoscale carrier multiplication mapping in a Si diode Corentin Durand , Pierre Capiod , Maxime Berthe , Jean-Philippe Nys , Christophe Krzeminski Nano Letters, 2014, 14 (10), pp 5636-5640. ⟨10.1021/nl5022255⟩ Article dans une revue hal-01070662v1
	Modelling of Silicon Oxynitridation by Nitrous Oxide using the Reaction Rate Approach Christophe Krzeminski Journal of Applied Physics, 2013, 114, pp.224501. ⟨10.1063/1.4839675⟩ Article dans une revue hal-00923920v1
	Modelling and engineering of stress based controlled oxidation effects for silicon nanostructures patterning Xiang-Lei Han , Guilhem Larrieu , Christophe Krzeminski Nanotechnology, 2013, 24 (49), pp.495301 Article dans une revue hal-00905392v1
	Modelling of silicon oxynitridation by nitrous oxide using the reaction rate approach Christophe Krzeminski Journal of Applied Physics, 2013, 114, 224501, 9 p. ⟨10.1063/1.4839675⟩ Article dans une revue hal-00917560v1
	Understanding of the Retarded Oxidation Effects in Silicon Nanostructures Christophe Krzeminski , Xiang-Lei Han , Guilhem Larrieu Applied Physics Letters, 2012, 100 (26), pp.263111. ⟨10.1063/1.4729410⟩ Article dans une revue hal-00643617v2
	Anisotropic Vapor HF etching of silicon dioxide for Si microstructure release Vikram Passi , Ulf Sodervall , Bengt Nilsson , Goran Petersson , Mats Hagberg Microelectronic Engineering, 2012, 95, pp.83-89. ⟨10.1016/j.mee.2012.01.005⟩ Article dans une revue hal-00643499v1
	Stress mapping in strain-engineered silicon p-type MOSFET device: A comparison between process simulation and experiments Christophe Krzeminski Journal of vaccum Science and Technology B, 2012, 30 (2), pp.022203-1. ⟨10.1116/1.3683079⟩ Article dans une revue hal-00624131v1
	Effects of strain on the carrier mobility in silicon nanowires Y.M. Niquet , C. Delerue , Christophe Krzeminski Nano Letters, 2012, 12, pp.3545-3550. ⟨10.1021/nl3010995⟩ Article dans une revue hal-00787472v1
	Optical absorption of silicon nanowires Tao Xu , Yannick Lambert , Christophe Krzeminski , B. Grandidier , Didier Stiévenard Journal of Applied Physics, 2012, 112, pp.033506. ⟨10.1063/1.4739708⟩ Article dans une revue hal-00732649v1
	Regrowth of oxide-embedded amorphous silicon studied with molecular dynamics E. Lampin , Christophe Krzeminski Journal of Applied Physics, 2011, 109, pp.123509-1-5. ⟨10.1063/1.3596815⟩ Article dans une revue hal-00603127v1
	Solid phase epitaxy amorphous silicon re-growth: some insight from empirical molecular dynamics simulation Christophe Krzeminski , Evelyne Lampin The European Physical Journal B: Condensed Matter and Complex Systems, 2011, 81, pp.283-290. ⟨10.1140/epjb/e2011-10958-7⟩ Article dans une revue hal-00600162v1
	Energy-band engineering for improved charge retention in fully self-aligned double floating-gate single-electron memories Xiaohui Tang , Christophe Krzeminski , Aurelien Lecavelier Des Etangs-Levallois , Zhenkun Chen , Emmanuel Dubois Nano Letters, 2011, 11, pp.4520-4526. ⟨10.1021/nl202434k⟩ Article dans une revue hal-00640212v1
	Efficient photogeneration of charge carriers in silicon nanowires with a radial doping gradient D.H.K. Murthy , T. Xu , W. H. Chen , J. Houtepen A. , T.J. Savenije Nanotechnology, 2011, 22 (31), pp.315710. ⟨10.1088/0957-4484/22/31/315710⟩ Article dans une revue hal-00603527v1
	Graphene buffer layer on Si-terminated SiC studied with an empirical interatomic potential Evelyne Lampin , Catherine Priester , Christophe Krzeminski , Laurence Magaud Journal of Applied Physics, 2010, 107 (10), pp.103514. ⟨10.1063/1.3357297⟩ Article dans une revue hal-00549078v1
	A single layer hydrogen silsesquioxane (HSQ) based lift-off process for germanium and platinum Vikram Passi , Aurélie Lecestre , Christophe Krzeminski , Guilhem Larrieu , Emmanuel Dubois Microelectronic Engineering, 2009, 87 (10), pp.1872-1878. ⟨10.1016/j.mee.2009.11.022⟩ Article dans une revue hal-00625915v1
	Process Optimization and Downscaling of a Single Electron Single Dot Memory Christophe Krzeminski , Xiaohui Tang , Nicolas Reckinger , Vincent Bayot , Emmanuel Dubois IEEE Transactions on Nanotechnology, 2009, 8 (9), pp.737-748. ⟨10.1109/TNANO.2009.2021653⟩ Article dans une revue hal-00601623v1
	Molecular dynamics simulations of the solid phase epitaxy of Si : growth mechanism and orientation effects E. Lampin , Christophe Krzeminski Journal of Applied Physics, 2009, 106, pp.063519-1-8. ⟨10.1063/1.3211972⟩ Article dans une revue hal-00471990v1
	Molecular dynamics simulation of the recrystallization of amorphous Si layers: Comprehensive study of the dependence of the recrystallization velocity on the interatomic potential Christophe Krzeminski , Quentin Brulin , Valérie Cuny , Emmanuel Lecat , Évelyne Martin Journal of Applied Physics, 2007, 101 (12), pp.123506. ⟨10.1063/1.2743089⟩ Article dans une revue hal-00605238v1
	Silicon dry oxidation kinetics at low temperature in the nanometric range: Modeling and experiment Christophe Krzeminski , Guilhem Larrieu , Julien Penaud , Evelyne Lampin , Emmanuel Dubois Journal of Applied Physics, 2007, 101 (064908), pp.064908-1-8. ⟨10.1063/1.2711764⟩ Article dans une revue hal-00600436v1
	Fabrication and room-temperature single-charging behavior of self-aligned single-dot memory devices Tang Xiaohui , Nicolas Reckinger , Vincent Bayot , Christophe Krzeminski , Emmanuel Dubois IEEE Transactions on Nanotechnology, 2006, 5 (6), p. 649. ⟨10.1109/TNANO.2006.883481⟩ Article dans une revue hal-00623277v1
	Diffusion of boron in silicon : compatibility of empirical molecular dynamics with continuum simulations Valérie Cuny , Quentin Brulin , Evelyne Lampin , Emmanuel Lecat , Christophe Krzeminski EPL - Europhysics Letters, 2006, 76 (5), pp.842-848. ⟨10.1209/epl/i2006-10334-y⟩ Article dans une revue hal-00127828v1
	Fabrication and room-temperature single-charging behavior of self-aligned single-dot memory devices Xing Tang , N. Reckinger , V. Bayot , Christophe Krzeminski , Emmanuel Dubois IEEE Transactions on Nanotechnology, 2006, 5, pp.649-656 Article dans une revue hal-00138655v1
	Adsorption behavior of conjugated (C)3-oligomers on Si(100) and HOPG surfaces G. Mahieu , B. Grandidier , D. Stievenard , Christophe Krzeminski , C. Delerue Langmuir, 2003, 19, pp.3350-3356 Article dans une revue hal-00146588v1
	Adsorption behavior of conjugated {C}3-oligomers on Si(100) and HOPG surfaces Gauthier Mahieu , B. Grandidier , Didier Stiévenard , Christophe Krzeminski , Christophe Delerue Langmuir, 2003, 19 (8), pp.3350-3356. ⟨10.1021/la026907n⟩ Article dans une revue hal-00688536v1
	Molecular rectifying diodes from self-assembly on silicon Stéphane Lenfant , Christophe Krzeminski , Christophe Delerue , Guy Allan , Dominique Vuillaume Nano Letters, 2003, 3, pp.741-746 Article dans une revue hal-00146156v1
	Effect of alkyl substituents on the adsorption of thienylenevinylene oligomers on the Si (100) surface B. Grandidier , Jean-Philippe Nys , Didier Stiévenard , Christophe Krzeminski , Christophe Delerue Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces, 2001, 473 (1-2), pp.1-7. ⟨10.1016/S0039-6028(00)00946-8⟩ Article dans une revue hal-00688535v1
	Theory of electrical rectification in a molecular monolayer Christophe Krzeminski , Christophe Delerue , Guy Allan , Dominique Vuillaume , Robert M Metzger Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2001, 64, pp.085405/1-6. ⟨10.1103/PhysRevB.64.085405⟩ Article dans une revue hal-00152558v1
	Effect of alkyl substituents on the adsorption of thienylenevinylene oligomers on the Si(100) surface B. Grandidier , J.P. Nys , D. Stievenard , Christophe Krzeminski , C. Delerue Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces, 2001, 473, 1-2, pp.1-7. ⟨10.1016/S0039-6028(00)00946-8⟩ Article dans une revue hal-00018576v1
	Theory of electrical rectification in a molecular monolayer Christophe Krzeminski , Christophe Delerue , Guy Allan , Dominique Vuillaume , R. Metzger Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2001, 64 (8), pp.085405. ⟨10.1103/PhysRevB.64.085405⟩ Article dans une revue hal-00604397v1
	Effect of alkyl substituents on the adsorption of thienylenevinylene oligomers on the Si(100) surface B. Grandidier , J.P. Nys , D. Stievenard , Christophe Krzeminski , C. Delerue Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces, 2001, 473, pp.1-7 Article dans une revue hal-00152539v1
	Tight binding description of the electronic response of a molecular device to an applied voltage Christophe Krzeminski , Christophe Delerue , Guy Allan Journal of Physical Chemistry B, 2001, 105 (27), pp.6321. ⟨10.1021/jp011263y⟩ Article dans une revue hal-00604398v1
	Theory of electrical rectification in a molecular monolayer Christophe Krzeminski , Christophe Delerue , Guy Allan , Dominique Vuillaume , Robert M Metzger Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2001, 64, 8, pp.085405. ⟨10.1103/PhysRevB.64.085405⟩ Article dans une revue hal-00018578v1
	Tight-binding description of the electronic response of a molecular device to an applied voltage Christophe Krzeminski , Christophe Delerue , Guy Allan Journal of Physical Chemistry B, 2001, 105 (27), pp.6321-6323. ⟨10.1021/jp011263y⟩ Article dans une revue hal-00152557v1
	Theoretical characterization of the electronic properties of extended thienylenevinylene oligomers Christophe Krzeminski , Christophe Delerue , Guy Allan , Vincent Haguet , Didier Stiévenard Journal of Chemical Physics, 1999, 111 (14), pp.6643-6649. ⟨10.1063/1.480012⟩ Article dans une revue hal-00633591v1

Christophe Krzeminski

Présentation

Domaines de recherche

Compétences

Publications

Electrical molecular switch addressed by chemical stimuli

Supramolecular self-assembly on the B-Si(111)-(√3x√3) R30° surface: From single molecules to multicomponent networks

A New Photomechanical Molecular Switch Based on a Linear π-Conjugated System

Surface-Induced Optimal Packing of Two-Dimensional Molecular Networks

Atomic Scale Modelling of Two-Dimensional Molecular Self-Assembly on a Passivated Si Surface

Nanoscale carrier multiplication mapping in a Si diode

Modelling of Silicon Oxynitridation by Nitrous Oxide using the Reaction Rate Approach

Modelling and engineering of stress based controlled oxidation effects for silicon nanostructures patterning

Modelling of silicon oxynitridation by nitrous oxide using the reaction rate approach

Understanding of the Retarded Oxidation Effects in Silicon Nanostructures

Anisotropic Vapor HF etching of silicon dioxide for Si microstructure release

Stress mapping in strain-engineered silicon p-type MOSFET device: A comparison between process simulation and experiments

Effects of strain on the carrier mobility in silicon nanowires

Optical absorption of silicon nanowires

Regrowth of oxide-embedded amorphous silicon studied with molecular dynamics

Solid phase epitaxy amorphous silicon re-growth: some insight from empirical molecular dynamics simulation

Energy-band engineering for improved charge retention in fully self-aligned double floating-gate single-electron memories

Efficient photogeneration of charge carriers in silicon nanowires with a radial doping gradient

Graphene buffer layer on Si-terminated SiC studied with an empirical interatomic potential

A single layer hydrogen silsesquioxane (HSQ) based lift-off process for germanium and platinum

Process Optimization and Downscaling of a Single Electron Single Dot Memory

Molecular dynamics simulations of the solid phase epitaxy of Si : growth mechanism and orientation effects

Molecular dynamics simulation of the recrystallization of amorphous Si layers: Comprehensive study of the dependence of the recrystallization velocity on the interatomic potential

Silicon dry oxidation kinetics at low temperature in the nanometric range: Modeling and experiment

Fabrication and room-temperature single-charging behavior of self-aligned single-dot memory devices

Diffusion of boron in silicon : compatibility of empirical molecular dynamics with continuum simulations

Fabrication and room-temperature single-charging behavior of self-aligned single-dot memory devices

Adsorption behavior of conjugated (C)3-oligomers on Si(100) and HOPG surfaces

Adsorption behavior of conjugated {C}3-oligomers on Si(100) and HOPG surfaces

Molecular rectifying diodes from self-assembly on silicon

Effect of alkyl substituents on the adsorption of thienylenevinylene oligomers on the Si (100) surface

Theory of electrical rectification in a molecular monolayer

Effect of alkyl substituents on the adsorption of thienylenevinylene oligomers on the Si(100) surface

Theory of electrical rectification in a molecular monolayer

Effect of alkyl substituents on the adsorption of thienylenevinylene oligomers on the Si(100) surface

Tight binding description of the electronic response of a molecular device to an applied voltage

Theory of electrical rectification in a molecular monolayer

Tight-binding description of the electronic response of a molecular device to an applied voltage

Theoretical characterization of the electronic properties of extended thienylenevinylene oligomers