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Christophe Gatel
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Documents
Identifiants chercheurs
- christophe-gatel
- ResearcherId : F-6046-2014
- 0000-0001-5549-7008
- IdRef : 08954840X
- ResearcherId : http://www.researcherid.com/rid/F-6046-2014
Présentation
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In-Situ Electrical Biasing of Electrically Connected TEM Lamellae with Embedded NanodevicesISTFA 2021, Oct 2021, Phoenix, France. pp.190-195, ⟨10.31399/asm.cp.istfa2021p0190⟩
Communication dans un congrès
hal-03412037v1
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Advanced characterization of semiconductorsXV B-MRS, Sep 2016, Campinas, Brazil
Communication dans un congrès
hal-01767758v1
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Development of TEM and SEM high brightness electron guns using cold field emission from a carbon nanotipPICO-2015, Apr 2015, Jülich, Netherlands
Communication dans un congrès
hal-02123316v1
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In situ electron microscopy of hard and soft matterJoint XIII Interamerican Microscopy Congress & XVI Venezuelan Congress for Microscopy and Microanalysis 'CIASEM-2015', Oct 2015, Isla de Margarita, Venezuela
Communication dans un congrès
hal-02123302v1
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Dark-Field Electron Holography for Strain MappingAlain Claverie; Mireille Mouis. Transmission Electron Microscopy in Micro-Nanoelectronics, Wiley-Blackwell, pp.81--106, 2013, ⟨10.1002/9781118579022.ch4⟩
Chapitre d'ouvrage
hal-01736026v1
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