- 10
- 3
- 2
- 2
- 1
- 1
Christophe Gatel
19
Documents
Identifiants chercheurs
- christophe-gatel
- ResearcherId : F-6046-2014
- 0000-0001-5549-7008
- IdRef : 08954840X
- ResearcherId : http://www.researcherid.com/rid/F-6046-2014
Présentation
Publications
- 1
- 1
- 1
- 1
- 5
- 1
- 1
- 1
- 19
- 13
- 11
- 9
- 7
- 5
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 10
- 8
- 7
- 2
- 1
- 1
- 1
- 1
Micromagnetic Objects and dynamical imaging Interferometry Instrumentation & In situ for Electron MicroscopyMCMeet - GDRs MCM2 et MEETICC, Oct 2017, Strasbourg, France
Communication dans un congrès
hal-01725341v1
|
|
Towards ultrafast TEM based on a modified cold-field emission TEM2016 Houches WE Heraeus Workshop, May 2016, Les Houches, France
Communication dans un congrès
hal-01768918v1
|
|
Development of TEM and SEM high brightness electron guns using cold field emission from a carbon nanotipPICO-2015, Apr 2015, Jülich, Netherlands
Communication dans un congrès
hal-02123316v1
|
|
In situ electron microscopy of hard and soft matterJoint XIII Interamerican Microscopy Congress & XVI Venezuelan Congress for Microscopy and Microanalysis 'CIASEM-2015', Oct 2015, Isla de Margarita, Venezuela
Communication dans un congrès
hal-02123302v1
|
|
Recent advances in Transmission Electron Microscopy illustrated by an application to atomic scale characterization of nanoscale precipitationPTM2010 - International Conference on Solid-Solid Phase Transformations, 2010, AVIGNON, France
Communication dans un congrès
hal-00610638v1
|
Dark-Field Electron Holography for Strain MappingAlain Claverie; Mireille Mouis. Transmission Electron Microscopy in Micro-Nanoelectronics, Wiley-Blackwell, pp.81--106, 2013, ⟨10.1002/9781118579022.ch4⟩
Chapitre d'ouvrage
hal-01736026v1
|