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VERILOR: A Verilog-A Model of Lorentzian Spectra for Simulating Trap-related Noise in CMOS Circuits

 Angeliki Tataridou , Gerard Ghibaudo , Christoforos Theodorou
ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC), Sep 2021, Grenoble, France. pp.247-250, ⟨10.1109/ESSDERC53440.2021.9631802⟩
Communication dans un congrès hal-03876875v1

Intermittency-induced criticality in the random telegraph noise of nanoscale UTBB FD-SOI MOSFETs

 Y. Contoyiannis , S.M. Potirakis , S.G. Stavrinides , M.P. Hanias , D. Tassis , et al.
Microelectronic Engineering, 2019, 216, pp.111027. ⟨10.1016/j.mee.2019.111027⟩
Article dans une revue hal-02415972v1
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Performance and Low-Frequency Noise of 22-nm FDSOI Down to 4.2 K for Cryogenic Applications

 Bruna Cardoso Paz , Mikaël Cassé , Christoforos Theodorou , Gérard Ghibaudo , Thorsten Kammler , et al.
IEEE Transactions on Electron Devices, 2020, 67 (11), pp.4563-4567. ⟨10.1109/TED.2020.3021999⟩
Article dans une revue hal-02969741v1
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On the diffusion current in a MOSFET operated down to deep cryogenic temperatures

 G. Ghibaudo , M. Aouad , M. Casse , T. Poiroux , Christoforos Theodorou
Solid-State Electronics, 2021, 176, pp.107949. ⟨10.1016/j.sse.2020.107949⟩
Article dans une revue hal-03260956v1

Impact of low-frequency noise variability on statistical parameter extraction in ultra-scaled CMOS devices

 E. Ioannidis , G. Theodorou , S. Haendler , C.A. Dimitriadis , G. Ghibaudo
Electronics Letters, 2014, 50 (19), pp.1393-1395. ⟨10.1049/el.2014.1837⟩
Article dans une revue hal-01947621v1

Drain current local variability from linear to saturation region in 28nm bulk NMOSFETs

 T. Karatsori , C. Theodorou , S. Haendler , C. Dimitriadis , G. Ghibaudo
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2016, Vienna, Austria. pp.92-95, ⟨10.1109/ULIS.2016.7440060⟩
Communication dans un congrès hal-02002291v1

Statistical characterization and modeling of drain current local and global variability in 14 nm bulk FinFETs

 T. Karatsori , C. Theodorou , R. Lavieville , T. Chiarella , J. Mitard , et al.
2017 International Conference of Microelectronic Test Structures (ICMTS), Mar 2017, Grenoble, France. pp.41-45, ⟨10.1109/ICMTS.2017.7954263⟩
Communication dans un congrès hal-02002304v1

Hot carrier degradation mechanisms of short-channel FDSOI n-MOSFETs

 T. Karatsori , C. Theodorou , S. Haendler , N. Planes , G. Ghibaudo , et al.
2015 73rd Annual Device Research Conference (DRC), Jun 2015, Columbus, United States. pp.163-164, ⟨10.1109/DRC.2015.7175607⟩
Communication dans un congrès hal-02001979v1

Origin of the low-frequency noise in n-channel FinFETs

 C. G. Theodorou , T. Hoffman , T. Chiarella , G. Ghibaudo , C.A. Dimitriadis
Solid-State Electronics, 2013, 82, pp.21-24. ⟨10.1016/j.sse.2013.01.009⟩
Article dans une revue istex hal-01002150v1

Flicker noise in n-channel nanoscale tri-gate fin-shaped field-effect transistors

 C. Theodorou , N. Fasarakis , T. Hoffman , T. Chiarella , G. Ghibaudo , et al.
Applied Physics Letters, 2012, 101 (24), pp.243512. ⟨10.1063/1.4772590⟩
Article dans une revue hal-02002339v1

Impact of front-back gate coupling on low frequency noise in 28 nm FDSOI MOSFETs

 Christoforos Theodorou , Eleftherios Ioannidis , Sebastien Haendler , Nicolas Planes , Franck Arnaud , et al.
ESSDERC 2012 - 42nd European Solid State Device Research Conference, Sep 2012, Bordeaux, France. pp.334-337, ⟨10.1109/ESSDERC.2012.6343401⟩
Communication dans un congrès hal-02001870v1

Front-back gate coupling effect on 1/f noise in ultra-thin Si film FDSOI MOSFETs

 C. Theodorou , E. Ioannidis , S. Haendler , N. Planes , F. Arnaud , et al.
2012 International Semiconductor Conference Dresden-Grenoble (ISCDG) - formerly known as the Semiconductor Conference Dresden (SCD), Sep 2012, Grenoble, France. pp.223-226, ⟨10.1109/ISCDG.2012.6360011⟩
Communication dans un congrès hal-02001882v1

Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators

 I. Messaris , T.A. Karatsori , N. Fasarakis , C.G. Theodorou , S. Nikolaidis , et al.
Microelectronics Reliability, 2016, 56, pp.10-16. ⟨10.1016/j.microrel.2015.11.002⟩
Article dans une revue hal-01947672v1

Influence of AC signal oscillator level on effective mobility measurement by split C–V technique in MOSFETs

 T.A. Karatsori , G. Ghibaudo , C.A. Dimitriadis , G. Theodorou
Electronics Letters, 2016, 52 (17), pp.1492-1493. ⟨10.1049/el.2016.1715⟩
Article dans une revue hal-01947685v1
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Low temperature high voltage analog devices in a 3D sequential integration

 Camila Cavalcante , X. Garros , P. Batude , A. Tataridou , J. Lacord , et al.
2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA), Aug 2020, Hsinchu, Taiwan. pp.155-156, ⟨10.1109/VLSI-TSA48913.2020.9203691⟩
Communication dans un congrès hal-02969743v1

Low-frequency Noise Characterization of Si Nanonet Field Effect Transistors

 Thibauld Cazimajou , Christoforos Theodorou , Thuy Thi Thu Nguyen , Maxime Legallais , Mireille Mouis , et al.
25th International Conference on Noise and Fluctuations (ICNF), Jun 2019, Neuchâtel, Switzerland. Actes pp. 180-183
Communication dans un congrès hal-02400620v1

Charge Pumping in Ultrathin SOI Tunnel FETs: Impact of Back-Gate Voltage

 Carlos Diaz Llorente , Christoforos Theodorou , Jean-Pierre Colinge , Sorin Cristoloveanu , Sébastien Martinie , et al.
ECS Transactions, 2019, 89 (3), pp.111-120. ⟨10.1149/08903.0111ecst⟩
Article dans une revue hal-02415983v1
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Impact of Hot Carrier Aging on the Performance of Triple-Gate Junctionless MOSFETs

 Theodoros Oproglidis , Theano Karatsori , Christoforos Theodorou , Andreas Tsormpatzoglou , Sylvain Barraud , et al.
IEEE Transactions on Electron Devices, 2020, 67 (2), pp.424-429. ⟨10.1109/TED.2019.2958457⟩
Article dans une revue hal-02461975v1
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A 4-Terminal Method for Oxide and Semiconductor Trap Characterization in FDSOI MOSFETs

 Hung Chi Han , Christoforos Theodorou , Gérard Ghibaudo
25th International Conference on Noise and Fluctuations ICNF 2019, EPFL, Jun 2019, Neuchatel, Switzerland
Communication dans un congrès hal-02963338v1

Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs

 R. Lavieville , T. Karatsori , C. Theodorou , S. Barraud , C. Dimitriadis , et al.
2016 ESSDERC - 46th European Solid-State Device Research Conference, Sep 2016, Lausanne, Switzerland. pp.142-145, ⟨10.1109/ESSDERC.2016.7599607⟩
Communication dans un congrès hal-02002267v1

Statistical low-frequency noise characterization in sub-15 nm Si/SiGe nanowire Trigate pMOSFETs

 Christoforos Theodorou , Romain Lavieville , Theano Karatsori , Sylvain Barraud , Charalabos Dimitriadis , et al.
2017 International Conference of Microelectronic Test Structures (ICMTS), Mar 2017, Grenoble, France. pp.141-145, ⟨10.1109/ICMTS.2017.7954284⟩
Communication dans un congrès hal-02002297v1

1/f Noise Characterization of Piezoresistive Nano-Gauges for MEMS Sensors

 Antoine Nowodzinski , Dihia Sidi Ahmed , Christoforos Theodorou , Alexandra Kournela , Helene Duchemin , et al.
2018 IEEE SENSORS, Oct 2018, New Delhi, India. pp.1382, ⟨10.1109/ICSENS.2018.8589872⟩
Communication dans un congrès hal-02002311v1

Dynamic variability in 14nm FD-SOI MOSFETs and transient simulation methodology

 Christoforos Theodorou , Eleftherios Ioannidis , Sebastien Haendler , Charalabos Dimitriadis , Gérard Ghibaudo
Solid-State Electronics, 2015, 111, pp.100-103. ⟨10.1016/j.sse.2015.06.001⟩
Article dans une revue hal-01947651v1

Analytical Compact Model for Lightly Doped Nanoscale Ultrathin-Body and Box SOI MOSFETs With Back-Gate Control

 Theano Karatsori , Andreas Tsormpatzoglou , Christoforos Theodorou , Eleftherios Ioannidis , Sebastien Haendler , et al.
IEEE Transactions on Electron Devices, 2015, 62 (10), pp.3117-3124. ⟨10.1109/TED.2015.2464076⟩
Article dans une revue hal-01947657v1

Upgrade of Drain Current Compact Model for Nanoscale Triple-Gate Junctionless Transistors to Continuous and Symmetric

 T. Oproglidis , A. Tsormpatzoglou , C. Theodorou , T. Karatsori , G. Ghibaudo , et al.
IEEE Transactions on Electron Devices, 2019, 66 (10), pp.4486-4489. ⟨10.1109/TED.2019.2937159⟩
Article dans une revue hal-02321988v1
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Extracting edge conduction around threshold in mesa-isolated SOI MOSFETs

 A. Boutayeb , Christoforos Theodorou , D. Golanski , P. Batude , L. Brunet , et al.
Solid-State Electronics, 2023, 209, pp.108736. ⟨10.1016/j.sse.2023.108736⟩
Article dans une revue hal-04305958v1
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A GENERAL USE CIRCUIT FOR AUDIO SIGNAL DISTORTION EXPLOTING ANY NON-LINEAR ELECTRON DEVICE

 Christoforos Theodorou , Michail Ziogas
International Conference on Digital Audio Effects (DAFx), Sep 2023, Copenhagen, Denmark
Communication dans un congrès hal-04305177v1
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A Method for Series-Resistance-Immune Extraction of Low-Frequency Noise Parameters in Nanoscale MOSFETs

 Angeliki Tataridou , Gerard Ghibaudo , Christoforos Theodorou
IEEE Transactions on Electron Devices, 2020, 67 (11), pp.4568-4572. ⟨10.1109/TED.2020.3026612⟩
Article dans une revue hal-03260917v1
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Continuous and symmetric trans-capacitance compact model for triple-gate junctionless MOSFETs

 T.A. Oproglidis , A. Tsormpatzoglou , D.H. Tassis , Christoforos Theodorou , G. Ghibaudo , et al.
Solid-State Electronics, 2021, 175, pp.107945. ⟨10.1016/j.sse.2020.107945⟩
Article dans une revue hal-03261208v1

Analytical low-frequency noise model in the linear region of lightly doped nanoscale double-gate metal-oxide-semiconductor field-effect transistors

 E.G. Ioannidis , G. Theodorou C. , A. Tsormpatzoglou , D.H. Tassis , K. Papathanasiou , et al.
Journ. Appl. Phys., 2010, 108, pp.064512. ⟨10.1063/1.3483279S⟩
Article dans une revue hal-00596310v1
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