Recherche - Archive ouverte HAL Accéder directement au contenu

Filtrer vos résultats

97 résultats
Page :
triés par
Image document

VERILOR: A Verilog-A Model of Lorentzian Spectra for Simulating Trap-related Noise in CMOS Circuits

 Angeliki Tataridou , Gerard Ghibaudo , Christoforos Theodorou
ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC), Sep 2021, Grenoble, France. pp.247-250, ⟨10.1109/ESSDERC53440.2021.9631802⟩
Communication dans un congrès hal-03876875v1

Intermittency-induced criticality in the random telegraph noise of nanoscale UTBB FD-SOI MOSFETs

 Y. Contoyiannis , S.M. Potirakis , S.G. Stavrinides , M.P. Hanias , D. Tassis , et al.
Microelectronic Engineering, 2019, 216, pp.111027. ⟨10.1016/j.mee.2019.111027⟩
Article dans une revue hal-02415972v1
Image document

Performance and Low-Frequency Noise of 22-nm FDSOI Down to 4.2 K for Cryogenic Applications

 Bruna Cardoso Paz , Mikaël Cassé , Christoforos Theodorou , Gérard Ghibaudo , Thorsten Kammler , et al.
IEEE Transactions on Electron Devices, 2020, 67 (11), pp.4563-4567. ⟨10.1109/TED.2020.3021999⟩
Article dans une revue hal-02969741v1
Image document

On the diffusion current in a MOSFET operated down to deep cryogenic temperatures

 G. Ghibaudo , M. Aouad , M. Casse , T. Poiroux , Christoforos Theodorou
Solid-State Electronics, 2021, 176, pp.107949. ⟨10.1016/j.sse.2020.107949⟩
Article dans une revue hal-03260956v1

Impact of low-frequency noise variability on statistical parameter extraction in ultra-scaled CMOS devices

 E. Ioannidis , G. Theodorou , S. Haendler , C.A. Dimitriadis , G. Ghibaudo
Electronics Letters, 2014, 50 (19), pp.1393-1395. ⟨10.1049/el.2014.1837⟩
Article dans une revue hal-01947621v1

Drain current local variability from linear to saturation region in 28nm bulk NMOSFETs

 T. Karatsori , C. Theodorou , S. Haendler , C. Dimitriadis , G. Ghibaudo
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2016, Vienna, Austria. pp.92-95, ⟨10.1109/ULIS.2016.7440060⟩
Communication dans un congrès hal-02002291v1

Statistical characterization and modeling of drain current local and global variability in 14 nm bulk FinFETs

 T. Karatsori , C. Theodorou , R. Lavieville , T. Chiarella , J. Mitard , et al.
2017 International Conference of Microelectronic Test Structures (ICMTS), Mar 2017, Grenoble, France. pp.41-45, ⟨10.1109/ICMTS.2017.7954263⟩
Communication dans un congrès hal-02002304v1

Hot carrier degradation mechanisms of short-channel FDSOI n-MOSFETs

 T. Karatsori , C. Theodorou , S. Haendler , N. Planes , G. Ghibaudo , et al.
2015 73rd Annual Device Research Conference (DRC), Jun 2015, Columbus, United States. pp.163-164, ⟨10.1109/DRC.2015.7175607⟩
Communication dans un congrès hal-02001979v1

Origin of the low-frequency noise in n-channel FinFETs

 C. G. Theodorou , T. Hoffman , T. Chiarella , G. Ghibaudo , C.A. Dimitriadis
Solid-State Electronics, 2013, 82, pp.21-24. ⟨10.1016/j.sse.2013.01.009⟩
Article dans une revue istex hal-01002150v1

Flicker noise in n-channel nanoscale tri-gate fin-shaped field-effect transistors

 C. Theodorou , N. Fasarakis , T. Hoffman , T. Chiarella , G. Ghibaudo , et al.
Applied Physics Letters, 2012, 101 (24), pp.243512. ⟨10.1063/1.4772590⟩
Article dans une revue hal-02002339v1
Image document

Accounting for Current Degradation Effects in the Compact Noise Modeling of Nano-scale MOSFETs

 Angeliki Tataridou , Christoforos Theodorou
2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST), Jun 2022, Bremen, Germany. pp.1-4, ⟨10.1109/MOCAST54814.2022.9837755⟩
Communication dans un congrès hal-03876798v1

Probing hidden conduction mechanisms in diced silicon solar cells by low frequency noise analysis

 Chloé Wulles , Quentin Rafhay , Thibaut Desrues , Anne Kaminski , Christoforos Theodorou
Solar Energy Materials and Solar Cells, 2023, 256, pp.112344. ⟨10.1016/j.solmat.2023.112344⟩
Article dans une revue hal-04305470v1
Image document

Enhanced statistical detection of random telegraph noise in frequency and time domain

 Owen Gauthier , Sébastien Haendler , Patrick Scheer , Alexandre Vernhet , Quentin Rafhay , et al.
Solid-State Electronics, 2022, 194, pp.108320. ⟨10.1016/j.sse.2022.108320⟩
Article dans une revue hal-03762370v1
Image document

Effects of Contact Potential and Sidewall Surface Plane on the Performance of GaN Vertical Nanowire MOSFETs for Low-Voltage Operation

 Dong-Hyeok Son , Terirama Thingujam , Jeong-Gil Kim , Dae-Hyun Kim , In Man Kang , et al.
IEEE Transactions on Electron Devices, 2020, 67 (4), pp.1547-1552. ⟨10.1109/TED.2020.2975599⟩
Article dans une revue hal-02969751v1

Drain-Current Flicker Noise Modeling in nMOSFETs From a 14-nm FDSOI Technology

 Eleftherios Ioannidis , Christoforos Theodorou , Theano Karatsori , Sebastien Haendler , Charalabos Dimitriadis , et al.
IEEE Transactions on Electron Devices, 2015, 62 (5), pp.1574-1579. ⟨10.1109/TED.2015.2411678⟩
Article dans une revue hal-01947638v1

Chaotic Behavior of Random Telegraph Noise in Nanoscale UTBB FD-SOI MOSFETs

 Dimitrios Tassis , Stavros Stavrinides , Michael Hanias , Christoforos Theodorou , Gérard Ghibaudo , et al.
IEEE Electron Device Letters, 2017, 38 (4), pp.517-520. ⟨10.1109/LED.2017.2672783⟩
Article dans une revue hal-01947995v1

Development of analytical compact drain current model for28 nm FDSOI MOSFETs

 T.A. Karatsori , Andreas Tsormpatzoglou , Christoforos Theodorou , E.G. Ioannidis , Sebastien Haendler , et al.
4th International Conference on Modern Circuits and Systems Technologies (MOCAST), organized by the FP7 Marie Curie IAPP Project FTK, the Greek National projects NANOTRIM and NANOMOS and the Micro & Nano Scientific Society, May 2015, Thessaloniki, Greece
Communication dans un congrès hal-02051762v1

Impact of Inter-Tier Coupling on Static and Noise Performance in 3D Sequential Integration Technology

 Petros Sideris , Laurent Brunet , Gilles Sicard , Perrine Batude , Christoforos Theodorou
2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2019, Grenoble, France. pp.1-4, ⟨10.1109/EUROSOI-ULIS45800.2019.9041871⟩
Communication dans un congrès hal-02969755v1
Image document

Universality of trap-induced mobility fluctuations between 1/f noise and Random Telegraph Noise in nanoscale FD-SOI MOSFETs

 Owen Gauthier , Sébastien Haendler , Quentin Rafhay , Christoforos Theodorou
Applied Physics Letters, 2023, 122 (23), ⟨10.1063/5.0152734⟩
Article dans une revue hal-04305435v1
Image document

Impact of Hot Carrier Aging on the Performance of Triple-Gate Junctionless MOSFETs

 Theodoros Oproglidis , Theano Karatsori , Christoforos Theodorou , Andreas Tsormpatzoglou , Sylvain Barraud , et al.
IEEE Transactions on Electron Devices, 2020, 67 (2), pp.424-429. ⟨10.1109/TED.2019.2958457⟩
Article dans une revue hal-02461975v1
Image document

A 4-Terminal Method for Oxide and Semiconductor Trap Characterization in FDSOI MOSFETs

 Hung Chi Han , Christoforos Theodorou , Gérard Ghibaudo
25th International Conference on Noise and Fluctuations ICNF 2019, EPFL, Jun 2019, Neuchatel, Switzerland
Communication dans un congrès hal-02963338v1

Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs

 R. Lavieville , T. Karatsori , C. Theodorou , S. Barraud , C. Dimitriadis , et al.
2016 ESSDERC - 46th European Solid-State Device Research Conference, Sep 2016, Lausanne, Switzerland. pp.142-145, ⟨10.1109/ESSDERC.2016.7599607⟩
Communication dans un congrès hal-02002267v1

Statistical low-frequency noise characterization in sub-15 nm Si/SiGe nanowire Trigate pMOSFETs

 Christoforos Theodorou , Romain Lavieville , Theano Karatsori , Sylvain Barraud , Charalabos Dimitriadis , et al.
2017 International Conference of Microelectronic Test Structures (ICMTS), Mar 2017, Grenoble, France. pp.141-145, ⟨10.1109/ICMTS.2017.7954284⟩
Communication dans un congrès hal-02002297v1

1/f Noise Characterization of Piezoresistive Nano-Gauges for MEMS Sensors

 Antoine Nowodzinski , Dihia Sidi Ahmed , Christoforos Theodorou , Alexandra Kournela , Helene Duchemin , et al.
2018 IEEE SENSORS, Oct 2018, New Delhi, India. pp.1382, ⟨10.1109/ICSENS.2018.8589872⟩
Communication dans un congrès hal-02002311v1

Dynamic variability in 14nm FD-SOI MOSFETs and transient simulation methodology

 Christoforos Theodorou , Eleftherios Ioannidis , Sebastien Haendler , Charalabos Dimitriadis , Gérard Ghibaudo
Solid-State Electronics, 2015, 111, pp.100-103. ⟨10.1016/j.sse.2015.06.001⟩
Article dans une revue hal-01947651v1

Analytical Compact Model for Lightly Doped Nanoscale Ultrathin-Body and Box SOI MOSFETs With Back-Gate Control

 Theano Karatsori , Andreas Tsormpatzoglou , Christoforos Theodorou , Eleftherios Ioannidis , Sebastien Haendler , et al.
IEEE Transactions on Electron Devices, 2015, 62 (10), pp.3117-3124. ⟨10.1109/TED.2015.2464076⟩
Article dans une revue hal-01947657v1

Upgrade of Drain Current Compact Model for Nanoscale Triple-Gate Junctionless Transistors to Continuous and Symmetric

 T. Oproglidis , A. Tsormpatzoglou , C. Theodorou , T. Karatsori , G. Ghibaudo , et al.
IEEE Transactions on Electron Devices, 2019, 66 (10), pp.4486-4489. ⟨10.1109/TED.2019.2937159⟩
Article dans une revue hal-02321988v1
Image document

Extracting edge conduction around threshold in mesa-isolated SOI MOSFETs

 A. Boutayeb , Christoforos Theodorou , D. Golanski , P. Batude , L. Brunet , et al.
Solid-State Electronics, 2023, 209, pp.108736. ⟨10.1016/j.sse.2023.108736⟩
Article dans une revue hal-04305958v1
Image document

A GENERAL USE CIRCUIT FOR AUDIO SIGNAL DISTORTION EXPLOTING ANY NON-LINEAR ELECTRON DEVICE

 Christoforos Theodorou , Michail Ziogas
International Conference on Digital Audio Effects (DAFx), Sep 2023, Copenhagen, Denmark
Communication dans un congrès hal-04305177v1
Image document

A Method for Series-Resistance-Immune Extraction of Low-Frequency Noise Parameters in Nanoscale MOSFETs

 Angeliki Tataridou , Gerard Ghibaudo , Christoforos Theodorou
IEEE Transactions on Electron Devices, 2020, 67 (11), pp.4568-4572. ⟨10.1109/TED.2020.3026612⟩
Article dans une revue hal-03260917v1
Page :