Bruno Rouzeyre

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963365

	Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS Jean-Max Dutertre , Rodrigo Possamai Bastos , Olivier Potin , Marie-Lise Flottes , Bruno Rouzeyre 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2014), Sep 2014, Berlin, Germany Communication dans un congrès hal-03094235v1