BR
Bruno Rouzeyre
8
Documents
Identifiants chercheurs
- bruno-rouzeyre
- IdRef : 07124705X
Présentation
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Multi-Level Ionizing-Induced Transient Fault SimulatorInformation Security Journal: A Global Perspective, 2014, 22 (5-6), pp.251-264. ⟨10.1080/19393555.2014.891280⟩
Article dans une revue
lirmm-01075393v1
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A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational LogicJournal of Electronic Testing: : Theory and Applications, 2013, 29, pp.331-340. ⟨10.1007/s10836-013-5359-y⟩
Article dans une revue
lirmm-00838389v1
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Simulating Laser Effects on ICs, from Physical Level to Gate Level: a comprehensive approachTRUDEVICE Workshop, May 2014, Paderborn, Germany
Communication dans un congrès
lirmm-01119614v1
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Layout-Aware Laser Fault Injection Simulation and Modeling: from physical level to gate levelDTIS: Design and Technology of Integrated Systems in Nanoscale Era, May 2014, Santorin, Greece. ⟨10.1109/DTIS.2014.6850665⟩
Communication dans un congrès
lirmm-01119592v1
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Customized Cell Detector for Laser-Induced-Fault DetectionIOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain. pp.37-42, ⟨10.1109/IOLTS.2014.6873669⟩
Communication dans un congrès
lirmm-01119576v1
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Laser-Induced Fault Effects in Security-Dedicated CircuitsVLSI-SoC: Very Large Scale Integration and System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.220-240, ⟨10.1007/978-3-319-25279-7_12⟩
Communication dans un congrès
hal-01383737v1
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Laser-Induced Fault SimulationEUROMICRO DSD/SEAA, Sep 2013, Santander, Spain. pp.609-614, ⟨10.1109/DSD.2013.72⟩
Communication dans un congrès
lirmm-01430807v1
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tLIFTING : A Multi-level Delay-annotated Fault Simulator for Digital CircuitsDCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France. , 2012
Poster de conférence
lirmm-00799892v1
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