BR
Bruno Rouzeyre
8
Documents
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- bruno-rouzeyre
- IdRef : 07124705X
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Assessing Body Built-In Current Sensors for Detection of Multiple Transient FaultsMicroelectronics Reliability, 2018, 88-90, pp.128-134. ⟨10.1016/j.microrel.2018.07.111⟩
Article dans une revue
hal-01893676v1
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Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOSMicroelectronics Reliability, 2014, 54 (9-10), pp.2289-2294. ⟨10.1016/j.microrel.2014.07.151⟩
Article dans une revue
emse-01094805v1
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Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detectionMicroelectronics Reliability, 2013, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 53 (9), pp.1320-1324. ⟨10.1016/j.microrel.2013.07.069⟩
Article dans une revue
emse-01100723v1
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Assessing Body Built-In Current Sensors for Detection of Multiple Transient FaultsESREF 2018 - European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 2018, Aalborg, Denmark
Communication dans un congrès
hal-04457522v1
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Validation Of Single BBICS Architecture In Detecting Multiple FaultsATS: Asian Test Symposium, Nov 2015, Mumbai, India
Communication dans un congrès
lirmm-01234067v1
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Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2014), Sep 2014, Berlin, Germany
Communication dans un congrès
hal-03094235v1
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Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection AttemptsJoint MEDIAN–TRUDEVICE Open Forum, Sep 2014, Amsterdam, Netherlands
Communication dans un congrès
emse-01099040v1
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Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detectionESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2013, Arcachon, France. pp.B3c-2 #68
Communication dans un congrès
hal-00872705v1
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