BR
Bruno Rouzeyre
7
Documents
Identifiants chercheurs
- bruno-rouzeyre
- IdRef : 07124705X
Présentation
Publications
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Improving the Test of NoC-Based SoCs with Help of Compression SchemesISVLSI: IEEE Symposium on Very Large Scale Integration, Apr 2008, Montpellier, France. pp.139-144, ⟨10.1109/ISVLSI.2008.86⟩
Communication dans un congrès
lirmm-00271574v1
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Test Data Compression and TAM DesignVLSI-SoC 2007 - IFIP International Conference on Very Large Scale Integration, Oct 2007, Atlanta, GA, United States. pp.178-183, ⟨10.1109/VLSISOC.2007.4402494⟩
Communication dans un congrès
lirmm-00186171v1
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Compression de Données de Test : Réduction du Nombre de Broches et Gain en Temps de TestJNRDM: Journées Nationales du Réseau Doctoral de Microélectronique, May 2006, Rennes, France
Communication dans un congrès
lirmm-00102830v1
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Fitting ATE Channels with Scan Chains: A Comparison Between a Test Data Compression Technique and Serial Loading of Scan ChainsDELTA'06: Third IEEE International Workshop on Electronics DesignTest & Applications, Kuala Lumpur (Malaysia), pp.295-300
Communication dans un congrès
lirmm-00102704v1
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TAM Design and Test Data Compression for SoC Test Cost ReductionETS: European Test Symposium, May 2007, Freiburg, Germany. 12th IEEE European Test Symposium, pp.241-246, 2007
Poster de conférence
lirmm-00159044v1
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Improving NoC-based Testing Through Compression SchemesPoster de conférence lirmm-00170833v1 |
Compression-Based SoC Test InfrastructuresVLSI-SoC: Advanced Topics on Systems on a Chip, 291, Springer, pp.53-68, 2009, IFIP Advances in Information and Communication Technology, 978-0-387-89557-4
Chapitre d'ouvrage
lirmm-00375078v1
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