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Bruno Rouzeyre
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Laser-Induced Fault Effects in Security-Dedicated CircuitsVLSI-SoC: Very Large Scale Integration and System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.220-240, ⟨10.1007/978-3-319-25279-7_12⟩
Communication dans un congrès
hal-01383737v1
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