Documentation
Français (FR)

Anglais (EN)

BR

Bruno Rouzeyre

18

Documents

Identifiants chercheurs

bruno-rouzeyre
IdRef : 07124705X

Présentation

Publications

rpbastos

	Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults Raphael Viera , Jean-Max Dutertre , Marie-Lise Flottes , Olivier Potin , Giorgio Di Natale Microelectronics Reliability, 2018, 88-90, pp.128-134. ⟨10.1016/j.microrel.2018.07.111⟩ Article dans une revue hal-01893676v1
	Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS Jean-Max Dutertre , Rodrigo Possamai Bastos , Olivier Potin , Marie-Lise Flottes , Bruno Rouzeyre Microelectronics Reliability, 2014, 54 (9-10), pp.2289-2294. ⟨10.1016/j.microrel.2014.07.151⟩ Article dans une revue emse-01094805v1
	Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection Jean-Max Dutertre , Rodrigo Possamai Bastos , Olivier Potin , Marie-Lise Flottes , Bruno Rouzeyre Microelectronics Reliability, 2013, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 53 (9), pp.1320-1324. ⟨10.1016/j.microrel.2013.07.069⟩ Article dans une revue emse-01100723v1
	A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic Rodrigo Possamai Bastos , Giorgio Di Natale , Marie-Lise Flottes , Feng Lu , Bruno Rouzeyre Journal of Electronic Testing: : Theory and Applications, 2013, 29, pp.331-340. ⟨10.1007/s10836-013-5359-y⟩ Article dans une revue lirmm-00838389v1
	Novel Transient-Fault Detection Circuit Featuring Enhanced Bulk Built-in Current Sensor with Low-Power Sleep Mode Rodrigo Possamai Bastos , Frank Sill Torres , Giorgio Di Natale , Marie-Lise Flottes , Bruno Rouzeyre Microelectronics Reliability, 2012, 52 (9-10), pp.1781-1786. ⟨10.1016/j.microrel.2012.06.149⟩ Article dans une revue lirmm-00715117v1

	Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults Raphael Viera , Jean-Max Dutertre , Marie-Lise Flottes , Olivier Potin , Giorgio Di Natale ESREF 2018 - European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 2018, Aalborg, Denmark Communication dans un congrès hal-04457522v1
	Validation Of Single BBICS Architecture In Detecting Multiple Faults Raphael Andreoni Camponogara-Viera , Rodrigo Possamai Bastos , Jean-Max Dutertre , Olivier Potin , Marie-Lise Flottes ATS: Asian Test Symposium, Nov 2015, Mumbai, India Communication dans un congrès lirmm-01234067v1
	Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection Attempts Jean-Max Dutertre , Rodrigo Possamai Bastos , Olivier Potin , Marie-Lise Flottes , Giorgio Di Natale Joint MEDIAN–TRUDEVICE Open Forum, Sep 2014, Amsterdam, Netherlands Communication dans un congrès emse-01099040v1
	Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS Jean-Max Dutertre , Rodrigo Possamai Bastos , Olivier Potin , Marie-Lise Flottes , Bruno Rouzeyre 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2014), Sep 2014, Berlin, Germany Communication dans un congrès hal-03094235v1
	A Bulk Built-in Sensor for Detection of Fault Attacks Rodrigo Possamai Bastos , Frank Sill Torres , Jean Max Dutertre , Marie-Lise Flottes , Giorgio Di Natale HOST: Hardware-Oriented Security and Trust, Jun 2013, Austin, TX, United States. pp.51-54, ⟨10.1109/HST.2013.6581565⟩ Communication dans un congrès lirmm-01430800v1
	A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults Rodrigo Possamai Bastos , Frank Sill Torres , Jean-Max Dutertre , Marie-Lise Flottes , Giorgio Di Natale PATMOS: Power and Timing Modeling, Optimization and Simulation, Sep 2013, Karlsruhe, Germany. pp.157-163, ⟨10.1109/PATMOS.2013.6662169⟩ Communication dans un congrès lirmm-00968621v1
	Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection Jean-Max Dutertre , Rodrigo Possamai Bastos , Olivier Potin , Marie-Lise Flottes , Bruno Rouzeyre ESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2013, Arcachon, France. pp.B3c-2 #68 Communication dans un congrès hal-00872705v1
	Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode Rodrigo Possamai Bastos , Frank Sill Torres , Giorgio Di Natale , Marie-Lise Flottes , Bruno Rouzeyre ESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Oct 2012, Cagliari, Italy Communication dans un congrès hal-00867864v1
	Calibrating Bulk Built-in Current Sensors for Detecting Transient Faults Rodrigo Possamai Bastos , Giorgio Di Natale , Marie-Lise Flottes , Bruno Rouzeyre Colloque GDR SoC-SiP, 2012, Lyon, France Communication dans un congrès lirmm-00715126v1
	Timing Issues of Transient Faults in Concurrent Error Detection Schemes Rodrigo Possamai Bastos , Giorgio Di Natale , Marie-Lise Flottes , Bruno Rouzeyre GdR SoC-SiP'2011: Colloque national du Groupement de Recherche System-On-Chip et System-In-Package, Jun 2011, Lyon, France. http://www2.lirmm.fr/~w3mic/SOCSIP/ Communication dans un congrès lirmm-00701798v1
	How to Sample Results of Concurrent Error Detection Schemes in Transient Fault Scenarios? Rodrigo Possamai Bastos , Giorgio Di Natale , Marie-Lise Flottes , Bruno Rouzeyre RADECS: Radiation and Its Effects on Components and Systems, Sep 2011, Sevilla, Spain. pp.635-642, ⟨10.1109/RADECS.2011.6131361⟩ Communication dans un congrès lirmm-00701776v1
	Timing Issues for an Efficient Use of Concurrent Error Detection Codes Rodrigo Possamai Bastos , Giorgio Di Natale , Marie-Lise Flottes , Bruno Rouzeyre LATW: Latin American Test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6, ⟨10.1109/LATW.2011.5985933⟩ Communication dans un congrès lirmm-00627427v1
	A New Bulk Built-in Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies Rodrigo Possamai Bastos , Giorgio Di Natale , Marie-Lise Flottes , Bruno Rouzeyre DFT'2011: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2011, Vancouver, Canada. pp.302-308, ⟨10.1109/DFT.2011.15⟩ Communication dans un congrès lirmm-00701789v1