BR
Bruno Rouzeyre
12
Documents
Identifiants chercheurs
- bruno-rouzeyre
- IdRef : 07124705X
Présentation
Publications
- 2
- 2
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 12
- 12
- 7
- 4
- 4
- 4
- 4
- 4
- 4
- 4
- 3
- 3
- 3
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 8
- 4
- 1
- 1
- 1
- 2
- 1
- 1
- 4
- 2
- 1
- 2
Sensitivity to Laser Fault Injection: CMOS FD-SOI vs. CMOS bulkIEEE Transactions on Device and Materials Reliability, 2019, 19 (1), pp.6-15. ⟨10.1109/TDMR.2018.2886463⟩
Article dans une revue
hal-01971932v1
|
|
Securing Scan Control in Crypto ChipsJournal of Electronic Testing: : Theory and Applications, 2007, 23 (5), pp.457-464. ⟨10.1007/s10836-007-5000-z⟩
Article dans une revue
lirmm-00186353v1
|
|
Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault modelFDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. pp.1-6, ⟨10.1109/FDTC.2018.00009⟩
Communication dans un congrès
emse-01856008v1
|
|
The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacksIOLTS: International On-Line Testing Symposium, Jul 2018, Platja d’Aro, Spain. pp.214-219, ⟨10.1109/IOLTS.2018.8474230⟩
Communication dans un congrès
emse-01856000v1
|
|
Laser-Induced Fault Effects in Security-Dedicated CircuitsVLSI-SoC: Very Large Scale Integration and System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.220-240, ⟨10.1007/978-3-319-25279-7_12⟩
Communication dans un congrès
hal-01383737v1
|
A Secure Scan Design MethodologyLATW'06: 7th IEEE Latin American Test Workshop, Mar 2006, Buenos Aires, Argentina. pp.81-86
Communication dans un congrès
lirmm-00102752v1
|
|
Scan Pattern WatermarkingLATW'06: 7th IEEE Latin American Test Workshop, Mar 2006, Buenos Aires, pp.63-67
Communication dans un congrès
lirmm-00102753v1
|
|
Secure Scan Techniques: a ComparisonIOLTS: International On-Line Testing Symposium, Jul 2006, Como, Italy. pp.119-124, ⟨10.1109/IOLTS.2006.55⟩
Communication dans un congrès
lirmm-00102857v1
|
|
|
A secure Scan Design MethodologyDATE: Design, Automation and Test in Europe, Mar 2006, Munich, Germany. pp.1177-1178, ⟨10.1109/DATE.2006.244019⟩
Communication dans un congrès
lirmm-00132516v1
|
Test Control for Secure Scan DesignsETS: European Test Symposium, May 2005, Tallinn, Estonia. pp.190-195
Communication dans un congrès
lirmm-00106011v1
|
|
|
Scan Design and Secure Chips : Can They Work TogetherSAME'05: Sophia-Antipolis Forum on MicroElectronics, Oct 2005, Sophia-Antipolis, France
Communication dans un congrès
lirmm-00106546v1
|
|
Scan design and secure chip [secure IC testing]IOLTS: International On-Line Testing Symposium, Jul 2004, Madeira Island, Portugal. pp.219-224, ⟨10.1109/OLT.2004.1319691⟩
Communication dans un congrès
lirmm-00108909v1
|