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Number of documents

56

Ivan Blum


Journal articles50 documents

  • Olivier Torresin, Julien Mauchain, Mario Borz, Ivan Blum, Angela Vella, et al.. Capacitive effect in ultrafast laser-induced emission from low conductance diamond nanotips. New Journal of Physics, Institute of Physics: Open Access Journals, 2020, 22 (8), pp.083055. ⟨10.1088/1367-2630/aba5bf⟩. ⟨hal-02935610⟩
  • Ivan Blum, Mario Borz, Olivier Torresin, Julien Mauchain, Benoît Chalopin, et al.. Effect of electrical conduction on the electron emission properties of diamond needles. New Journal of Physics, Institute of Physics: Open Access Journals, 2020, 22 (8), pp.083044. ⟨10.1088/1367-2630/aba392⟩. ⟨hal-02935647⟩
  • Zirong Peng, David Zanuttini, Benoit Gervais, Emmanuelle Jacquet, Ivan Blum, et al.. Unraveling the metastability of C n 2+ ( n = 2–4) Clusters. Journal of Physical Chemistry Letters, American Chemical Society, 2019, 10 (3), pp.581-588. ⟨10.1021/acs.jpclett.8b03449⟩. ⟨hal-02107343⟩
  • L. Venturi, L. Rigutti, J. Houard, I. Blum, S. Malykhin, et al.. Strain sensitivity and symmetry of 2.65 eV color center in diamond nanoscale needles. Applied Physics Letters, American Institute of Physics, 2019, 114 (14), pp.143104. ⟨10.1063/1.5092329⟩. ⟨hal-02109311⟩
  • Olivier Torresin, Mario Borz, Julien Mauchain, Ivan Blum, Victor Kleshch, et al.. Conduction mechanisms and voltage drop during field electron emission from diamond needles. Ultramicroscopy, Elsevier, 2019, 202, pp.51-56. ⟨10.1016/j.ultramic.2019.03.006⟩. ⟨hal-02109685⟩
  • L. Arnoldi, M. Borz, I. Blum, V. Kleshch, A. Obraztsov, et al.. Effect of laser illumination on the electrical conductivity of single-crystal diamond needles. Journal of Applied Physics, American Institute of Physics, 2019, 126 (4), pp.045710. ⟨10.1063/1.5092459⟩. ⟨hal-02294960⟩
  • E. Di Russo, N. Cherkashin, M. Korytov, A. Nikolaev, A. Sakharov, et al.. Compositional accuracy in atom probe tomography analyses performed on III-N light emitting diodes. Journal of Applied Physics, American Institute of Physics, 2019, 126 (12), pp.124307. ⟨10.1063/1.5113799⟩. ⟨hal-02298940⟩
  • M. Borz, M. Mammez, I. Blum, J. Houard, G. da Costa, et al.. Photoassisted and multiphoton emission from single-crystal diamond needles. Nanoscale, Royal Society of Chemistry, 2019, 11 (14), pp.6852-6858. ⟨10.1039/C9NR01001G⟩. ⟨hal-02108219⟩
  • M Mammez, M. Borz, I. Blum, S. Moldovan, L. Arnoldi, et al.. Field emission microscopy pattern of a single-crystal diamond needle under ultrafast laser illumination. New Journal of Physics, Institute of Physics: Open Access Journals, 2019, 21 (11), pp.113060. ⟨10.1088/1367-2630/ab5857⟩. ⟨hal-02393669⟩
  • Lindor Diallo, Abdeslem Fnidiki, Luc Lechevallier, Amjaad Zarefy, Jean Juraszek, et al.. 6H-SiC-Fe Nanostructures Studied by Atom Probe Tomography. IEEE Magnetics Letters, IEEE, 2018, 9, pp.1-3. ⟨10.1109/lmag.2018.2829109⟩. ⟨hal-02061774⟩
  • E. Di Russo, F. Moyon, N. Gogneau, L. Largeau, E. Giraud, et al.. Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography. Journal of Physical Chemistry C, American Chemical Society, 2018, 122 (29), pp.16704--16714. ⟨10.1021/acs.jpcc.8b03223⟩. ⟨hal-01928844⟩
  • L. Arnoldi, M. Spies, J. Houard, I. Blum, M. Ismagilov, et al.. Erratum: “Thermal diffusivity of diamond nanowires studied by laser assisted atom probe tomography” [Appl. Phys. Lett. 112 , 143104 (2018)]. Applied Physics Letters, American Institute of Physics, 2018, 112 (18), pp.189901. ⟨10.1063/1.5035134⟩. ⟨hal-02109689⟩
  • L. Arnoldi, M. Spies, J. Houard, I. Blum, A. Etienne, et al.. Thermal diffusivity of diamond nanowires studied by laser assisted atom probe tomography. Applied Physics Letters, American Institute of Physics, 2018, 112 (14), pp.143104. ⟨10.1063/1.5019672⟩. ⟨hal-02061754⟩
  • A. Vella, D. Shinde, J. Houard, E. Silaeva, L. Arnoldi, et al.. Optothermal response of a single silicon nanotip. Physical Review B: Condensed Matter and Materials Physics, American Physical Society, 2018, 97 (7), pp.075409. ⟨10.1103/physrevb.97.075409⟩. ⟨hal-02061771⟩
  • E. Di Russo, I. Blum, J. Houard, M. Gilbert, G. da Costa, et al.. Compositional accuracy of atom probe tomography measurements in GaN: Impact of experimental parameters and multiple evaporation events. Ultramicroscopy, Elsevier, 2018, 187, pp.126--134. ⟨10.1016/j.ultramic.2018.02.001⟩. ⟨hal-01928843⟩
  • D. Zanuttini, I. Blum, E. Di Russo, L. Rigutti, F. Vurpillot, et al.. Dissociation of GaN 2+ and AlN 2+ in APT: Analysis of experimental measurements. Journal of Chemical Physics, American Institute of Physics, 2018, 149 (13), pp.134311. ⟨10.1063/1.5037010⟩. ⟨hal-02061762⟩
  • L. Mancini, F. Moyon, J. Houard, I. Blum, W. Lefebvre, et al.. Multi-excitonic emission from Stranski-Krastanov GaN/AlN quantum dots inside a nanoscale tip. Applied Physics Letters, American Institute of Physics, 2017, 111 (24), ⟨10.1063/1.5004417⟩. ⟨hal-01766091⟩
  • Enrico Di Russo, Ivan Blum, Jonathan Houard, Gérald da Costa, Didier Blavette, et al.. Field-Dependent Measurement of GaAs Composition by Atom Probe Tomography. Microscopy and Microanalysis, Cambridge University Press (CUP), 2017, 23 (06), pp.1067 - 1075. ⟨10.1017/s1431927617012582⟩. ⟨hal-01766042⟩
  • Lu Zhao, Antoine Normand, Jonathan Houard, Ivan Blum, Fabien Delaroche, et al.. Optimizing Atom Probe Analysis with Synchronous Laser Pulsing and Voltage Pulsing. Microscopy and Microanalysis, Cambridge University Press (CUP), 2017, 23 (2), pp.221-226. ⟨10.1017/S1431927616012666⟩. ⟨hal-02611781⟩
  • David Zanuttini, Ivan Blum, Lorenzo Rigutti, François Vurpillot, Julie Douady, et al.. Simulation of field-induced molecular dissociation in atom-probe tomography: Identification of a neutral emission channel. Physical Review A, American Physical Society, 2017, 95 (6), ⟨10.1103/PhysRevA.95.061401⟩. ⟨hal-02107497⟩
  • M.L. Diallo, L. Diallo, A. Fnidiki, L. Lechevallier, F. Cuvilly, et al.. Fe implantation effect in the 6H-SiC semiconductor investigated by Mössbauer spectrometry. Journal of Applied Physics, American Institute of Physics, 2017, 122, pp.083905. ⟨10.1063/1.4992102⟩. ⟨cea-01591469⟩
  • Lorenzo Mancini, Florian Moyon, David Hernàndez-Maldonado, Ivan Blum, Jonathan Houard, et al.. Carrier Localization in GaN/AlN Quantum Dots As Revealed by Three-Dimensional Multimicroscopy. Nano Letters, American Chemical Society, 2017, 17 (7), pp.4261 - 4269. ⟨10.1021/acs.nanolett.7b01189⟩. ⟨hal-01765951⟩
  • D. Zanuttini, I. Blum, L. Rigutti, F. Vurpillot, J. Douady, et al.. Electronic structure and stability of the SiO 2+ dications produced in tomographic atom probe experiments. Journal of Chemical Physics, American Institute of Physics, 2017, 147 (16), pp.164301. ⟨10.1063/1.5001113⟩. ⟨hal-02107463⟩
  • Lu Zhao, Antoine Normand, Jonathan Houard, Ivan Blum, Fabien Delaroche, et al.. Optimizing Atom Probe Analysis with Synchronous Laser Pulsing and Voltage Pulsing. Microscopy and Microanalysis, Cambridge University Press (CUP), 2017, 23 (2), pp.221-226. ⟨10.1017/S1431927616012666⟩. ⟨hal-02107518⟩
  • E. Di Russo, L. Mancini, F. Moyon, S. Moldovan, J. Houard, et al.. Three-dimensional atomic-scale investigation of ZnO-Mg x Zn 1−x O m-plane heterostructures. Applied Physics Letters, American Institute of Physics, 2017, 111 (3), pp.032108. ⟨10.1063/1.4994659⟩. ⟨hal-01766135⟩
  • Ivan Blum, Lorenzo Rigutti, François Vurpillot, Angela Vella, Aurore Gaillard, et al.. Dissociation Dynamics of Molecular Ions in High Dc Electric Field. Journal of Physical Chemistry A, American Chemical Society, 2016, 120 (20), pp.3654-3662. ⟨10.1021/acs.jpca.6b01791⟩. ⟨hal-01954242⟩
  • L. Mancini, D. Hernández-Maldonado, W. Lefebvre, J. Houard, I. Blum, et al.. Multi-Microscopy Study of the Influence of Stacking Faults and Three-Dimensional In Distribution on the Optical Properties of m-Plane InGaN Quantum Wells Grown on Microwire Sidewalls. Applied Physics Letters, American Institute of Physics, 2016, 108 (4), pp.042102. ⟨10.1063/1.4940748⟩. ⟨hal-01954240⟩
  • L. Zhao, Antoine Normand, Jonathan Houard, Ivan Blum, Fabien Delaroche, et al.. Nanoscale photoconductive switching effect applied to atom probe tomography. American Journal of Physics, American Association of Physics Teachers, 2016, 116, pp.2. ⟨10.1209/0295-5075/116/27002⟩. ⟨hal-01719197⟩
  • Ivan Blum, David Zanuttini, Lorenzo Rigutti, François Vurpillot, Julie Douady, et al.. Dissociation of Molecular Ions During the DC Field Evaporation ZnO in Atom Probe Tomography. Microscopy and Microanalysis, Cambridge University Press (CUP), 2016, 22 (S3), pp.662-663. ⟨10.1017/S1431927616004165⟩. ⟨hal-02107558⟩
  • Mina Bionta, Sébastien J. Weber, I Blum, Julien Mauchain, Béatrice Chatel, et al.. Wavelength and shape dependent strong-field photoemission from silver nanotips. New Journal of Physics, Institute of Physics: Open Access Journals, 2016, 18 (10), pp.103010. ⟨10.1088/1367-2630/18/10/103010⟩. ⟨hal-01401516⟩
  • L. Rigutti, L. Mancini, E. Di Russo, I. Blum, F. Moyon, et al.. Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem. Microscopy and Microanalysis, Cambridge University Press (CUP), 2016, 22 (S3), pp.650-651. ⟨10.1017/S1431927616004104⟩. ⟨hal-01954232⟩
  • L. Arnoldi, E. P. Silaeva, F. Vurpillot, B. Deconihout, E. Cadel, et al.. Role of the resistivity of insulating field emitters on the energy of field-ionised and field-evaporated atoms. Ultramicroscopy, Elsevier, 2015, 159, pp.139--146. ⟨10.1016/j.ultramic.2014.11.018⟩. ⟨hal-01929137⟩
  • L. Diallo M., L. Lechevallier, A. Fnidiki, R. Larde, A. Debelle, et al.. Fe-implanted 6H-SiC: Direct evidence of Fe3Si nanoparticles observed by atom probe tomography and Fe-57 Mossbauer spectroscopy. Journal of Applied Physics, American Institute of Physics, 2015, 117 (issue 18), pp.183907. ⟨10.1063/1.4921056⟩. ⟨in2p3-01168657⟩
  • G. Tellouche-Derafa, K. Hoummada, A. Derafa, I. Blum, A. Portavoce, et al.. Kinetics of growth and consumption of Ni rich phases. Microelectronic Engineering, Elsevier, 2014, 120, pp.146-149. ⟨10.1016/j.mee.2013.12.015⟩. ⟨hal-02385327⟩
  • Dominique Mangelinck, K. Hoummada, F. Panciera, M. El Kousseifi, I. Blum, et al.. Progress in the understanding of Ni silicide formation for advanced MOS structures. physica status solidi (a), Wiley, 2014, 211 (1), pp.152-165. ⟨10.1002/pssa.201300167⟩. ⟨hal-01951259⟩
  • Lorenzo Rigutti, Ivan Blum, Deodatta Shinde, David Hernandez-Maldonado, Williams Lefebvre, et al.. Correlation of Microphotoluminescence Spectroscopy, Scanning Transmission Electron Microscopy, and Atom Probe Tomography on a Single Nano-object Containing an InGaN/GaN Multiquantum Well System. Nano Letters, American Chemical Society, 2014, 14 (1), pp.107-114. ⟨10.1021/nl4034768⟩. ⟨hal-01986734⟩
  • Lorenzo Mancini, Nooshin Amirifar, Deodatta Shinde, Ivan Blum, Matthieu Gilbert, et al.. Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field. Journal of Physical Chemistry C, American Chemical Society, 2014, 118 (41), pp.24136-24151. ⟨10.1021/jp5071264⟩. ⟨hal-01163403⟩
  • Khalid Hoummada, Gamra Tellouche, Ivan Blum, Alain Portavoce, Marion Descoins, et al.. Direct observation of Ni decorated dislocation loops within As+-implanted silicon and arsenic clustering in Ni silicide contact. Microelectronic Engineering, Elsevier, 2013, 107, pp.184-189. ⟨10.1016/j.mee.2012.12.008⟩. ⟨hal-02385371⟩
  • Magali Putero, Benjamin Duployer, Ivan Blum, Toufik Ouled-Khachroum, Marie-Vanessa Coulet, et al.. Combined in situ x-ray scattering and electrical measurements for characterizing phase transformations in nanometric functional films. Thin Solid Films, Elsevier, 2013, 541, pp.21-27. ⟨10.1016/j.tsf.2012.11.131⟩. ⟨hal-01951266⟩
  • Ivan Blum, Alain Portavoce, Lee Chow, Khalid Hoummada, Dominique Mangelinck. Diffusion and Redistribution of Boron in Nickel Silicides. Defect and Diffusion Forum, Trans Tech Publications, 2012, 323-325, pp.415-420. ⟨10.4028/www.scientific.net/DDF.323-325.415⟩. ⟨hal-02393983⟩
  • A. Portavoce, I. Blum, D. Mangelinck, K. Hoummada, L. Chow, et al.. Boron clustering in implanted NiSi. Scripta Materialia, Elsevier, 2011, 64 (9), pp.828-831. ⟨10.1016/j.scriptamat.2011.01.015⟩. ⟨hal-02385405⟩
  • Ivan Blum, Alain Portavoce, Khalid Hoummada, Gamra Tellouche, Lee Chow, et al.. Dopant diffusivity and solubility in nickel silicides. physica status solidi (c), Wiley, 2011, 8 (3), pp.670-673. ⟨10.1002/pssc.201000283⟩. ⟨hal-02385407⟩
  • Alain Portavoce, Ivan Blum, Lee Chow, Jean Bernardini, Dominique Mangelinck. Numerical Simulation Support for Diffusion Coefficient Measurements in Polycrystalline Thin Films. Defect and Diffusion Forum, Trans Tech Publications, 2011, 309-310, pp.63-72. ⟨10.4028/www.scientific.net/DDF.309-310.63⟩. ⟨hal-02394011⟩
  • C. Perrin, K. Hoummada, I. Blum, A. Portavoce, M. Descoins, et al.. Redistribution of Alloy Elements during Nickel Silicide Formation: Benefit of Atom Probe Tomography. Defect and Diffusion Forum, Trans Tech Publications, 2011, 309-310, pp.161-166. ⟨10.4028/www.scientific.net/DDF.309-310.161⟩. ⟨hal-02394008⟩
  • I. Blum, A. Portavoce, L. Chow, D. Mangelinck, K. Hoummada, et al.. B diffusion in implanted Ni2Si and NiSi layers. Applied Physics Letters, American Institute of Physics, 2010, 96 (5), pp.054102. ⟨10.1063/1.3303988⟩. ⟨hal-02386108⟩
  • K. Hoummada, I. Blum, D. Mangelinck, A. Portavoce. Composition measurement of the Ni-silicide transient phase by atom probe tomography. Applied Physics Letters, American Institute of Physics, 2010, 96 (26), pp.261904. ⟨10.1063/1.3457995⟩. ⟨hal-02386090⟩
  • I. Blum, A. Portavoce, D. Mangelinck, R. Daineche, K. Hoummada, et al.. Measurement of As diffusivity in Ni2Si thin films. Microelectronic Engineering, Elsevier, 2010, 87 (3), pp.263-266. ⟨10.1016/j.mee.2009.05.020⟩. ⟨hal-02386115⟩
  • Ivan Blum, Alain Portavoce, Dominique Mangelinck, Jean Bernardini, Khalid Hoummada, et al.. Simultaneous Measurements of Lattice and Grain Boundary Diffusion Coefficients via 2-Dimensional Simulations. Defect and Diffusion Forum, Trans Tech Publications, 2010, 297-301, pp.978-983. ⟨10.4028/www.scientific.net/DDF.297-301.978⟩. ⟨hal-02394022⟩
  • I. Blum, A. Portavoce, D. Mangelinck, R. Daineche, K. Hoummada, et al.. Lattice and grain-boundary diffusion of As in Ni2Si. Journal of Applied Physics, American Institute of Physics, 2008, 104 (11), pp.114312. ⟨10.1063/1.3035836⟩. ⟨hal-02386151⟩
  • Ivan Blum, A. Portavoce, Dominique Mangelinck, Rachid Daineche, K. Hoummada, et al.. Lattice and grain-boundary diffusion of As in Ni2Si. Journal of Applied Physics, American Institute of Physics, 2008, 104 (11), pp.114312. ⟨10.1063/1.3035836⟩. ⟨hal-02127829⟩

Conference papers3 documents

  • Olivier Torresin, Julien Mauchain, Benoît Chalopin, Mario Borz, Ivan Blum, et al.. Laser-induced photoemission from tungsten and diamond tips. International Vacuum Nanoelectronics Conference, Jul 2017, Regensburg, Germany. pp.88-89, ⟨10.1109/IVNC.2017.8051557⟩. ⟨hal-01926741⟩
  • Mario Borz, Ivan Blum, Angela Vella, Olivier Torresin, Julien Mauchain, et al.. Field emission and field ion microscopy from single crystal diamond needle. International Vacuum Nanoelectronics Conference, Jul 2017, Regensburg, Germany. pp.88-89, ⟨10.1109/IVNC.2017.8051556⟩. ⟨hal-01926804⟩
  • Williams Lefebvre, Florian Moyon, Antoine Normand, Nicolas Rolland, Ivan Blum, et al.. Correlative Investigations by HAADF-STEM and Atom Probe Tomography. European Microscopy Congress, Aug 2016, Lyon, France. pp.775-776, ⟨10.1002/9783527808465.EMC2016.8364⟩. ⟨hal-01954243⟩

Book sections2 documents

Preprints, Working Papers, ...1 document

  • L. Zhao, Antoine Normand, J. Houard, Ivan Blum, F. Delaroche, et al.. Numeric modeling of synchronous laser pulsing and voltage pulsing field evaporation. 2019. ⟨hal-02127790⟩