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Publications

	Sub-10 nm-scale capacitors and tunnel junctions measurements by SMM coupled to RF interferometry F. Wang , Thomas Dargent , D. Ducatteau , Gilles Dambrine , Kamel Haddadi 45th European Microwave Conference EuMC 2015, Sep 2015, Paris, France. ⟨10.1109/EuMC.2015.7345849⟩ Communication dans un congrès hal-01962399v1
	Interferometric scanning microwave microscope for nanotechnology application N. Clement , Thomas Dargent , H. Tanbakuchi , K. Nishiguchi , R. Sivakumarasamy American Physical Society March Meeting, APS March Meeting 2013, 2013, Baltimore, MD, United States Communication dans un congrès hal-00811777v1