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An interferometric scanning microwave microscope and calibration method for sub-fF microwave measurementsReview of Scientific Instruments, 2013, 84 (12), pp.123705. ⟨10.1063/1.4848995⟩
Article dans une revue
hal-00922585v1
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Materials selection procedure for RF-MEMSMicroelectronic Engineering, 2010, 87, pp.1792-1795. ⟨10.1016/j.mee.2009.10.016⟩
Article dans une revue
hal-00549627v1
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Optimization of SiNX:H films deposited by PECVD for reliability of electronic, microsystems and optical applicationsMicroelectronics Reliability, 2010, 50, pp.1103-1106. ⟨10.1016/j.microrel.2010.04.011⟩
Article dans une revue
hal-00549491v1
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