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Bernard Legrand

7

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gilles-dambrine

	Quantitative impedance characterization of sub-10 nm scale capacitors and tunnel junctions with an interferometric scanning microwave microscope Fei Wang , Nicolas Clément , Damien Ducatteau , David Troadec , Hassan Tanbakuchi Nanotechnology, 2014, 25 (40), pp.405703. ⟨10.1088/0957-4484/25/40/405704⟩ Article dans une revue hal-01960609v1

	[Invited] SMM characterization of Au nanodots and FcC11SH molecules Didier Theron , Fei Wang , Thomas Dargent , Damien Ducatteau , Charlene Brillard XX Annual Linz Winter Workshop, Advances in Single-Molecule Research for Biology & Nanoscience, Feb 2018, Linz, Austria Communication dans un congrès hal-01962187v1
	Sub-10 nm-scale capacitors and tunnel junctions measurements by SMM coupled to RF interferometry F. Wang , Thomas Dargent , D. Ducatteau , Gilles Dambrine , Kamel Haddadi 45th European Microwave Conference EuMC 2015, Sep 2015, Paris, France. ⟨10.1109/EuMC.2015.7345849⟩ Communication dans un congrès hal-01962399v1
	Characterization of sub-10nm-scale capacitors and tunnel junctions by SMM coupled to RF interferometry Fei Wang , Damien Ducatteau , David Troadec , Hassan Tanbakuchi , Bernard Legrand European Conference on Electrical Measurements at the Nanoscale Using AFM, Jun 2014, Cambridge, United Kingdom Communication dans un congrès hal-01962209v1
	Caractérisation quantitative des capacités sous échelle de 10 nm avec un interférométrique scanning-microwave-microscopy Fei Wang , Nicolas Clément , Damien Ducatteau , David Troadec , Bernard Legrand 17èmes Journées Nationales du Réseau Doctoral en Micro-Nanoélectronique, JNRDM 2014, 2014, Villeneuve d'Ascq, France. 3 p Communication dans un congrès hal-01018379v1
	Interferometric scanning microwave microscope for nanotechnology application N. Clement , Thomas Dargent , H. Tanbakuchi , K. Nishiguchi , R. Sivakumarasamy American Physical Society March Meeting, APS March Meeting 2013, 2013, Baltimore, MD, United States Communication dans un congrès hal-00811777v1
	Nanoscale capacitors study with an interferometric scanning microwave microscope Fei Wang , Nicolas Clément , David Troadec , Bernard Legrand , Gilles Dambrine Materials Research Society Fall Meeting, MRS Fall 2013, Symposium LL : Advances in Scanning Probe Microscopy, 2013, Boston, MA, United States Communication dans un congrès hal-00944017v1