Nombre de documents

11

CV de Belgacem Bettayeb


Thèse1 document

  • Belgacem Bettayeb. Conception et évaluation des plans de surveillance basés sur le risque. Limitation des incertitudes qualité avec des ressources limitées de maîtrise. Autre. Université Grenoble Alpes, 2012. Français. <NNT : 2012GRENI019>. <tel-00859830>

Article dans une revue5 documents

  • Mohammed Dahane, M’hammed Sahnoun, Belgacem Bettayeb, David Baudry, Hamza Boudhar. Impact of spare parts remanufacturing on the operation and maintenance performance of offshore wind turbines: a multi-agent approach. Journal of Intelligent Manufacturing, Springer, 2015, <10.1007/s10845-015-1154-1>. <hal-01235078>
  • M'Hammed Sahnoun, Belgacem Bettayeb, Samuel Bassetto, Michel Tollenaere. Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing. Journal of Intelligent Manufacturing, Springer Verlag (Germany), 2014. <hal-01063102>
  • Belgacem Bettayeb, Samuel Bassetto, Philippe Vialletelle, Michel Tollenaere. Quality and exposure control in semiconductor manufacturing. Part I: Modelling. International Journal of Production Research, Taylor & Francis, 2012, 50 (23), pp.6835-6851. <10.1080/00207543.2011.630042>. <hal-00677042>
  • Belgacem Bettayeb, Samuel Bassetto, Philippe Vialletelle, Michel Tollenaere. Quality and exposure control in semiconductor manufacturing. Part II:Evaluation. International Journal of Production Research, Taylor & Francis, 2012, 50 (23), pp.6852 - 6869. <10.1080/00207543.2011.630043>. <hal-00677039>
  • Belgacem Bettayeb, Imed Kacem, Kondo Adjallah. An improved branch-and-bound algorithm to minimize the weighted flowtime on identical parallel machines with family setup times. Journal of Systems Science and Systems Engineering, Springer Verlag (Germany), 2008, 17 (4), pp.446-459. <10.1007/s11518-008-5065-y>. <hal-00706234>

Communication dans un congrès5 documents

  • M'Hammed Sahnoun, Belgacem Bettayeb, Samuel Bassetto, Michel Tollenaere. Smart sampling for risk reduction and delay optimisation. 2012 IEEE International Systems Conference, Mar 2012, vancouver, Canada. pp.1-6, 2012. <hal-00685926>
  • Belgacem Bettayeb, Michel Tollenaere, Samuel Bassetto. Plan de surveillance basé sur l'exposition aux risques et les aptitudes des ressources. 4èmes Journées Doctorales / Journées Nationales MACS (JD-JN-MACS'11), Jun 2011, Marseille, France. 6 p., 2012. <hal-00677080>
  • Belgacem Bettayeb, Michel Tollenaere, Samuel Bassetto. Plan de surveillance basé sur l'exposition aux risques et les capabilités des ressources. Congrès International de Génie Industriel, Oct 2011, Saint-Sauveur, Canada. 2012. <hal-00677060>
  • M'Hammed Sahnoun, Belgacem Bettayeb, Michel Tollenaere, Philippe Vialletelle, Aymen Mili. Impact of Sampling on W@R and Metrology Time delay. Intel European Research & Innovation Conference, Oct 2011, dublin, Ireland. pp.273-275, 2011. <hal-00685922>
  • Belgacem Bettayeb, Samuel Bassetto, Michel Tollenaere. Optimized design of control plans based on risk exposure and resources capabilities. Semiconductor Portal, Inc. International Symposium on Semiconductor Manufacturing, Oct 2010, Tokyo, Japan. pp.267-270, 2010. <hal-00579882>