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Number of documents

91

CV Hassen AZIZA


Laboratoire de recherche :

Institut Matériaux Microélectronique Nanosciences de Provence (IM2NP)
UMR CNRS 7334 - Université d'Aix-Marseille (AMU)  http://www.im2np.fr
Equipe Mémoires - Département ASCE

Composante d'enseignement :

Polytech Marseille - Aix-Marseille Université (AMU)
https://polytech.univ-amu.fr

Activités d'expertise :


Journal articles39 documents

  • Pablo Ilha Vaz, Patrick Girard, Arnaud Virazel, Hassen Aziza. Improving TID Radiation Robustness of a CMOS OxRAM-Based Neuron Circuit by Using Enclosed Layout Transistors. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2021, 29 (6), pp.1122-1131. ⟨10.1109/TVLSI.2021.3067446⟩. ⟨lirmm-03376937⟩
  • Hassen Aziza, Said Hamdioui, Moritz Fieback, Mottaqiallah Taouil, Mathieu Moreau, et al.. Multi-Level Control of Resistive RAM (RRAM) Using a Write Termination to Achieve 4 Bits/Cell in High Resistance State. Electronics, MDPI, 2021, 10 (18), pp.2222. ⟨10.3390/electronics10182222⟩. ⟨hal-03501908⟩
  • Hussein Bazzi, Hassen Aziza, Mathieu Moreau, Adnan Harb. Performances and Stability Analysis of a novel 8T1R Non-volatile SRAM (NVSRAM) versus Variability. Journal of Electronic Testing, Springer Verlag, 2021, 37 (4), pp.515-532. ⟨10.1007/s10836-021-05965-x⟩. ⟨hal-03501909⟩
  • Hassen Aziza, Said Hamdioui, Moritz Fieback, Mottaqiallah Taouil, Mathieu Moreau, et al.. Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation. Microelectronics Reliability, Elsevier, 2021, 126, pp.1877-1880. ⟨10.23919/DATE51398.2021.9473967⟩. ⟨hal-03504284⟩
  • R. Gay, V. Della Marca, Hassen Aziza, M. Mantelli, F. Trenteseaux, et al.. A Novel Trench-Based Triple Gate Transistor With Enhanced Driving Capability. IEEE Electron Device Letters, Institute of Electrical and Electronics Engineers, 2021, 42 (6), pp.832-834. ⟨10.1109/LED.2021.3076609⟩. ⟨hal-03504285⟩
  • Hussein Bazzi, Adnan Harb, Hassen Aziza, Mathieu Moreau, Abdallah Kassem. RRAM-based non-volatile SRAM cell architectures for ultra-low-power applications. Analog Integrated Circuits and Signal Processing, Springer Verlag, 2021, 106 (2), pp.351-361. ⟨10.1007/s10470-020-01587-z⟩. ⟨hal-03504286⟩
  • R. Gay, V. Della Marca, Hassen Aziza, P. Laine, A. Regnier, et al.. Gate stress reliability of a novel trench-based Triple Gate Transistor. Microelectronics Reliability, Elsevier, 2021, 126, pp.114233. ⟨10.1016/j.microrel.2021.114233⟩. ⟨hal-03500202⟩
  • P. Devoge, Hassen Aziza, P. Lorenzini, F. Julien, A. Marzaki, et al.. Hot-carrier evaluation of a zero-cost transistor developed via process optimization in an embedded non-volatile memory CMOS technology. Microelectronics Reliability, Elsevier, 2021, 126, pp.114265. ⟨10.1016/j.microrel.2021.114265⟩. ⟨hal-03500203⟩
  • Hussein Bazzi, Adnan Harb, Hassen Aziza, Mathieu Moreau. Non-volatile SRAM memory cells based on ReRAM technology. SN Applied Sciences, Springer Verlag, 2020, 2 (9), ⟨10.1007/s42452-020-03267-z⟩. ⟨hal-03504289⟩
  • Hassen Aziza, M. Moreau, M. Fieback, M. Taouil, S. Hamdioui. An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs). IEEE Access, IEEE, 2020, 8, pp.137263-137274. ⟨10.1109/ACCESS.2020.3011647⟩. ⟨hal-03504829⟩
  • Hassen Aziza, Jeremy Postel-Pellerin, Hussein Bazzi, Pierre Canet, Mathieu Moreau, et al.. True Random Number Generator Integration in a Resistive RAM Memory Array Using Input Current Limitation. IEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2020, 19, pp.214-222. ⟨10.1109/TNANO.2020.2976735⟩. ⟨hal-03504843⟩
  • Hassen Aziza, Basma Hajri, Mohammad Mansour, Ali Chehab. RRAM Device Models: A Comparative Analysis With Experimental Validation. IEEE Access, IEEE, 2019, 7, pp.168963-168980. ⟨10.1109/ACCESS.2019.2954753⟩. ⟨hal-03504845⟩
  • Hassen Aziza, Christian Dufaza, Annie Perez, Said Hamdioui. Configurable Operational Amplifier Architectures Based on Oxide Resistive RAMs. Journal of Circuits, Systems, and Computers, World Scientific Publishing, 2019, Journal of Circuits, Systems and Computers, pp.1950216. ⟨10.1142/S0218126619502165⟩. ⟨hal-02306935⟩
  • Basma Hajri, Mohammad Mansour, Ali Chehab, Hassen Aziza. CAMEM: A Computationally-Efficient and Accurate Memristive Model With Experimental Verification. IEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2019, 18, pp.1040-1049. ⟨10.1109/TNANO.2019.2945985⟩. ⟨hal-02343750⟩
  • Gilles Micolau, Karine Coulié, Wenceslas Rahajandraibe, Jean-Michel Portal, Hassen Aziza. SITARe: a fast simulation tool for the analysis of disruptive effects on electronics. E3S Web of Conferences, EDP Sciences, 2019, 88, pp.06002. ⟨10.1051/e3sconf/20198806002⟩. ⟨hal-02617925⟩
  • Hassen Aziza, A. Pérez, Jean-Michel Portal. Resistive RAMs as analog trimming elements. Solid-State Electronics, Elsevier, 2018, 142, pp.52 - 55. ⟨10.1016/j.sse.2018.02.005⟩. ⟨hal-01791226⟩
  • W. Steve Ngueya, Jean-Michel Portal, Hassen Aziza, Julien Mellier, Stephane Ricard. An Ultra-Low Power and High Performance Single Ended Sense Amplifier for Low Voltage Flash Memories. Journal of Low Power Electronics, American Scientific Publishers, 2018, 14 (1), pp.157 - 169. ⟨10.1166/jolpe.2018.1543⟩. ⟨hal-01791223⟩
  • Hassen Aziza, Pierre Canet, Jérémy Postel-Pellerin. Impact of Line Resistance Combined with Device Variability on Resistive RAM Memories. Advances in Science, Technology and Engineering Systems Journal, Advances in Science Technology and Engineering Systems Journal (ASTESJ), 2018, 3 (1), pp.11-17. ⟨10.25046/aj030102⟩. ⟨hal-02335339⟩
  • Hassen Aziza, B. Hajri, M. Mansour, A. Chehab, A. Perez. A lightweight write-assist scheme for reduced RRAM variability and power. Microelectronics Reliability, Elsevier, 2018, 88-90, pp.6-10. ⟨10.1016/j.microrel.2018.07.065⟩. ⟨hal-02314650⟩
  • K. Coulié, W. Rahajandraibe, Hassen Aziza, G. Micolau, R. Vauche. Detection limit of a VCO based detection chain dedicated to particles recognition and tracking. EPJ Web of Conferences, EDP Sciences, 2018, 170, pp.09002. ⟨10.1051/epjconf/201817009002⟩. ⟨hal-01704378⟩
  • W. Steve Ngueya, Jean-Michel Portal, Hassen Aziza, Julien Mellier, Stephane Ricard. A Power Efficient Regulated Charge Pump Based on Charge Sharing for Contactless Devices: An Alternative to Four-Phase Charge Pumps . Journal of Low Power Electronics, American Scientific Publishers, 2017, 13 (4), pp.595-604. ⟨hal-01791261⟩
  • Jean-Michel Portal, Marc Bocquet, Santhosh Onkaraiah, Mathieu Moreau, Hassen Aziza, et al.. Design and Simulation of a 128 kb Embedded Nonvolatile Memory Based on a Hybrid RRAM (HfO$_2$ )/28 nm FDSOI CMOS Technology. IEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2017, 16, pp.677 - 686. ⟨10.1109/TNANO.2017.2703985⟩. ⟨hal-01745418⟩
  • P. Canet, J. Postel-Pellerin, Hassen Aziza. Impact of resistive paths on NVM array reliability: Application to Flash & ReRAM memories. Microelectronics Reliability, Elsevier, 2016, 64 (SI), pp.36-41. ⟨10.1016/j.microrel.2016.07.096⟩. ⟨hal-01434941⟩
  • Hassen Aziza, Jean-Michel Portal. Resistive RAM variability monitoring using a ring oscillator based test chip. Microelectronics Reliability, Elsevier, 2016, 64 (SI), pp.59-62. ⟨10.1016/j.microrel.2016.07.097⟩. ⟨hal-01434980⟩
  • K. Coulie-Castellani, W. Rahajandraibe, G. Micolau, Hassen Aziza, Jean-Michel Portal. Optimization of a Particles Detection Chain Based on a VCO Structure. Journal of Electronic Testing, Springer Verlag, 2016, 32 (1), pp.21-30. ⟨10.1007/s10836-016-5563-7⟩. ⟨hal-01434958⟩
  • Hassen Aziza, Marc Bocquet, Mathieu Moreau, Jean-Michel Portal. A Built-In Self-Test Structure (BIST) for Resistive RAMs Characterization: Application to Bipolar OxRRAM. Solid-State Electronics, Elsevier, 2015, 103, pp.73 - 78. ⟨10.1016/j.sse.2014.09.005⟩. ⟨hal-01737300⟩
  • Weisheng Zhao, Mathieu Moreau, Erya Deng, Yue Zhang, Jean-Michel Portal, et al.. Synchronous Non-Volatile Logic Gate Design Based on Resistive Switching Memories. IEEE Transactions on Circuits and Systems I: Regular Papers, IEEE, 2014, 61 (2), pp.443 - 454. ⟨10.1109/TCSI.2013.2278332⟩. ⟨hal-01743999⟩
  • Marc Bocquet, Hassen Aziza, Weisheng Zhao, Yue Zhang, Santhosh Onkaraiah, et al.. Compact Modeling Solutions for Oxide-Based Resistive Switching Memories (OxRAM). Journal of Low Power Electronics and Applications, MDPI, 2014, 4 (1), pp.1-14. ⟨10.3390/jlpea4010001⟩. ⟨hal-01737320⟩
  • Marc Bocquet, Damien Deleruyelle, Hassen Aziza, Christophe Muller, Jean-Michel Portal, et al.. Robust Compact Model for Bipolar Oxide-Based Resistive Switching Memories. IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2014, 61 (3), pp.674 - 681. ⟨10.1109/TED.2013.2296793⟩. ⟨hal-01737291⟩
  • Jean-Michel Portal, Marc Bocquet, Mathieu Moreau, Hassen Aziza, Damien Deleruyelle, et al.. An Overview of Non-Volatile Flip-Flops Based on Emerging Memory Technologies. Journal of Electronic Science and Technology, 2014, 12 (2), pp.173 - 181. ⟨10.3969/j.issn.1674-862X.2014.02.007⟩. ⟨hal-01745646⟩
  • W. Zhao, M. Portal, W. Kang, Mathieu Moreau, Y. Zhang, et al.. Design and analysis of crossbar architecture based on complementary resistive switching non-volatile memory cells. Journal of Parallel and Distributed Computing, Elsevier, 2014, 74 (6), pp.2484 - 2496. ⟨10.1016/j.jpdc.2013.08.004⟩. ⟨hal-01744000⟩
  • Wenceslas Rahajandraibe, Fayrouz Haddad, Hassen Aziza, Karine Coulié-Castellani, Jean-Michel Portal. Low Power Radio Frequency Transceiver with Built-In-Tuning of the Local Oscillator for Open Loop Modulation. Journal of Low Power Electronics, American Scientific Publishers, 2014, 10 (1), pp.173-181. ⟨10.1166/jolpe.2014.1308⟩. ⟨hal-03456254⟩
  • Wenceslas Rahajandraibe, Fayrouz. Haddad, Hassen Aziza, Karine Coulié-Castellani, Jean-Michel Portal. Low Power Radio Frequency Transceiver with Built-In-Tuning of the Local Oscillator for Open Loop Modulation. Journal of Low Power Electronics, American Scientific Publishers, 2014, 10 (1), pp.173-181. ⟨hal-02025270⟩
  • Wenceslas Rahajandraibe, Fayrouz. Haddad, Hassen Aziza, K. Coulié, Jean-Michel Portal. Low Power RF Transceiver with Built-In-Tuning of the Local Oscillator for Open Loop Modulation. Journal of Low Power Electronics, American Scientific Publishers, 2014. ⟨hal-01870147⟩
  • Hassen Aziza, Marc Bocquet, Jean-Michel Portal, Mathieu Moreau, Christophe Muller. A novel test structure for OxRRAM process variability evaluation. Microelectronics Reliability, Elsevier, 2013, 53 (9-11), pp.1208 - 1212. ⟨10.1016/j.microrel.2013.07.012⟩. ⟨hal-01745650⟩
  • K. Castellani-Coulié, Hassen Aziza, Wenceslas Rahajandraibe, Gilles Micolau, Jean-Michel Portal. Development of a CMOS Oscillator Concept for Particle Detection and Tracking Nuclear Science. . IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2013. ⟨hal-01315364⟩
  • G. Micolau, K. Castellani-Coulié, Hassen Aziza, Jean-Michel Portal. Contribution to SER Prediction: A New Metric Based on RC Transient Simulations. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2012, 59 (4), pp.797-802. ⟨hal-02025262⟩
  • K. Castellani-Coulié, Hassen Aziza, G. Micolau, Jean-Michel Portal. Optimization of SEU Simulations for SRAM Cells Reliability under Radiation. Journal of Electronic Testing, Springer Verlag, 2012, 28 (3), pp.331-338. ⟨hal-02025257⟩
  • Karine Castellani-Coulie, Gnima Toure, Jean-Michel Portal, Olivier Ginez, Hassen Aziza, et al.. Circuit Effect on Collection Mechanisms Involved in Single Event Phenomena: Application to the Response of a NMOS Transistor in a 90 nm SRAM Cell. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2011, 58 (3), pp.870-876. ⟨10.1109/tns.2011.2129575⟩. ⟨hal-02025249⟩

Conference papers48 documents

  • Hassen Aziza, K. Coulie, W. Rahajandraibe. Design Considerations Towards Zero-Variability Resistive RAMs in HRS State. 2021 IEEE 22nd Latin American Test Symposium (LATS), Oct 2021, Punta del Este, France. pp.1-5, ⟨10.1109/LATS53581.2021.9651758⟩. ⟨hal-03511410⟩
  • K. Coulié, Hassen Aziza, W Rahajandraibe. Investigation of Single Event Effects in a Resistive RAM memory array by SPICE level simulation. 2021 IEEE 22nd Latin American Test Symposium (LATS), Oct 2021, Punta del Este, Uruguay. ⟨10.1109/LATS53581.2021.9651871⟩. ⟨hal-03512542⟩
  • Paul Devoge, Hassen Aziza, Philippe Lorenzini, Franck Julien, Abderrezak Marzaki, et al.. Circuit-level evaluation of a new zero-cost transistor in a embedded non-volatile memory CMOS technology. 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), Jun 2021, Montpellier, France. pp.1-5, ⟨10.1109/DTIS53253.2021.9505137⟩. ⟨hal-03502361⟩
  • Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, et al.. Intermittent Undefined State Fault in RRAMs. 2021 IEEE European Test Symposium (ETS), May 2021, Bruges, France. pp.1-6, ⟨10.1109/ETS50041.2021.9465401⟩. ⟨hal-03502363⟩
  • Romeric Gay, Vincenzo Della Marca, Hassen Aziza, Arnaud Regnier, Stephan Niel, et al.. Benchmarking and optimization of trench-based multi-gate transistors in a 40 nm non-volatile memory technology. 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), Jun 2021, Montpellier, France. pp.1-4, ⟨10.1109/DTIS53253.2021.9505093⟩. ⟨hal-03502360⟩
  • Zoran Stamenkovic, Hassen Aziza, Ernesto Sanchez, Alberto Bosio. Tutorial: Silicon Systems for Wireless LAN. 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Apr 2021, Vienna, Austria. pp.157-158, ⟨10.1109/DDECS52668.2021.9417056⟩. ⟨hal-03266853⟩
  • Basma Hajri, Mohammad Mansour, Ali Chehab, Hassen Aziza. A Lightweight Reconfigurable RRAM-based PUF for Highly Secure Applications. 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Oct 2020, Frascati, Italy. ⟨10.1109/DFT50435.2020.9250829⟩. ⟨hal-03504287⟩
  • Hussein Bazzi, Hassen Aziza, Mathieu Moreau, Adnan Harb. Design of a Novel Hybrid CMOS Non-Volatile SRAM Memory in 130nm RRAM Technology. Design, Technology, and Test of Integrated Circuits and Systems, Apr 2020, virtual, Morocco. ⟨10.1109/DTIS48698.2020.9081153⟩. ⟨hal-03504830⟩
  • Hussein Bazzi, Jeremy Postel-Pellerin, Hassen Aziza, Mathieu Moreau, Adnan Harb. Resistive RAM SET and RESET Switching Voltage Evaluation as an Entropy Source for Random Number Generation. 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Oct 2020, Frascati, Italy. pp.1-4, ⟨10.1109/DFT50435.2020.9250726⟩. ⟨hal-03504288⟩
  • Pablo Ilha Vaz, Patrick Girard, Arnaud Virazel, Hassen Aziza. A CMOS OxRAM-Based Neuron Circuit Hardened with Enclosed Layout Transistors for Aerospace Applications. IOLTS 2020 - 26th IEEE International Symposium on On-Line Testing and Robust System Design, Jul 2020, Napoli, Italy. pp.1-6, ⟨10.1109/IOLTS50870.2020.9159709⟩. ⟨lirmm-03035780⟩
  • Hassen Aziza, H. Bazzi, J. Postel-Pellerin, P. Canet, M. Moreau, et al.. An Augmented OxRAM Synapse for Spiking Neural Network (SNN) Circuits. 2019 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS), Apr 2019, Mykonos, France. ⟨10.1109/DTIS.2019.8735057⟩. ⟨hal-02306907⟩
  • Hassen Aziza, Mathieu Moreau, Jean-Michel Portal, Arnaud Virazel, Patrick Girard. A Capacitor-Less CMOS Neuron Circuit for Neuromemristive Networks. NEWCAS 2019 - 17th IEEE International Conference on Electronics Circuits and Systems, Jun 2019, Munich, Germany. ⟨10.1109/NEWCAS44328.2019.8961278⟩. ⟨lirmm-02395325⟩
  • Moritz Fieback, Lizhou Wu, Guilherme Medeiros, Hassen Aziza, Siddharth Rao, et al.. Device-Aware Test: A New Test Approach Towards DPPB Level. 2019 IEEE International Test Conference (ITC), Nov 2019, Washington, United States. pp.1-10, ⟨10.1109/ITC44170.2019.9000134⟩. ⟨hal-03504847⟩
  • Jérémy Postel-Pellerin, Hussein Bazzi, Hassen Aziza, Pierre Canet, Mathieu Moreau, et al.. True random number generation exploiting SET voltage variability in resistive RAM memory arrays. 2019 19th Non-Volatile Memory Technology Symposium (NVMTS), Oct 2019, Durham, France. pp.1-5, ⟨10.1109/NVMTS47818.2019.9043369⟩. ⟨hal-03504849⟩
  • Hassen Aziza. A configurable operational amplifier based on oxide resistive RAMs. 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS), Apr 2018, Taormina, France. pp.1-2, ⟨10.1109/DTIS.2018.8368572⟩. ⟨hal-02314659⟩
  • Hassen Aziza, K. Coulié, W. Rahajandraibe, R. Vauche. Using short-term fourier transform for particle detection and recognition in a CMOS oscillator-based chain. 2018 IEEE 19th Latin-American Test Symposium (LATS), Mar 2018, Sao Paulo, France. pp.1-5, ⟨10.1109/LATW.2018.8349684⟩. ⟨hal-02022331⟩
  • Hassen Aziza, P. Canet, J. Postel-Pellerin, Mathieu Moreau, Jean-Michel Portal, et al.. ReRAM ON/OFF resistance ratio degradation due to line resistance combined with device variability in 28nm FDSOI technology. 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2017, Athens, Greece. ⟨10.1109/ULIS.2017.7962594⟩. ⟨hal-01745666⟩
  • Basma Hajri, Mohammad M. Mansour, Ali Chehab, Hassen Aziza. Oxide-based RRAM Models for Circuit Designers: A Comparative Analysis. 2017 12TH IEEE INTERNATIONAL CONFERENCE ON DESIGN & TECHNOLOGY OF INTEGRATED SYSTEMS IN NANOSCALE ERA (DTIS 2017), 2017, Unknown, Unknown Region. ⟨hal-01694471⟩
  • W. Steve Ngueya, Julien Mellier, Stephane Ricard, Jean-Michel Portal, Hassen Aziza. Power efficiency optimization of charge pumps in embedded low voltage NOR flash memory. 2017 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC), Oct 2017, Linkoping, Sweden. ⟨10.1109/NORCHIP.2017.8124949⟩. ⟨hal-01788152⟩
  • W. Steve Ngueya, Julien Mellier, Stephane Ricard, Jean-Michel Portal, Hassen Aziza. High voltage recycling scheme to improve power consumption of regulated charge pumps. 2017 27th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS), Sep 2017, Thessaloniki, Greece. ⟨10.1109/PATMOS.2017.8106995⟩. ⟨hal-01788150⟩
  • Steve Ngueya W., Julien Mellier, Stephane Ricard, Jean-Michel Portal, Hassen Aziza. An Ultra-Low Power and High Speed Single Ended Sense Amplifier for Non-Volatile Memories. 2017 New Generation of CAS (NGCAS), Sep 2017, Genova, Italy. ⟨10.1109/NGCAS.2017.33⟩. ⟨hal-01788149⟩
  • Hassen Aziza, H. Ayari, S. Onkaraiah, Mathieu Moreau, Jean-Michel Portal, et al.. Multilevel Operation in Oxide Based Resistive RAM with SET voltage modulation. 2016 11TH IEEE INTERNATIONAL CONFERENCE ON DESIGN & TECHNOLOGY OF INTEGRATED SYSTEMS IN NANOSCALE ERA (DTIS), Apr 2016, Istanbul, Turkey. pp.1-5, ⟨10.1109/DTIS.2016.7483892⟩. ⟨hal-01434981⟩
  • Hassen Aziza, Jean-Michel Portal. Resistive RAM Variability Monitoring using a Ring Oscillator based Test Chip. 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2016), Sep 2016, Halle, Germany. ⟨hal-01463136⟩
  • Steve W. Ngueya, Julien Mellier, Stephane Ricard, Jean-Michel Portal, Hassen Aziza. Ultra Low Power Charge Pump with Multi-Step Charging and Charge Sharing. 2016 IEEE 8TH INTERNATIONAL MEMORY WORKSHOP (IMW), 2016, Unknown, Unknown Region. ⟨hal-01435238⟩
  • P. Canet, J. Postel-Pellerin, Hassen Aziza. Impact of Resistive Paths on NVM Array Reliability: Application to Flash & ReRAM Memories. 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2016), Sep 2016, Halle, Germany. ⟨hal-01463140⟩
  • S. Ben Krit, Karin Coulie-Castellani, Wenceslas Rahajandraibe, Laurent Ottaviani, Gilles Micolau, et al.. Comparison of a readout chain dedicated to the signal conditioning of a particle detector and an innovative chain based on a VCO concept. 15. European Conference on Radiation and Its Effects on Components and Systems (Radecs), Sep 2015, Moscou, Russia. ⟨hal-01594142⟩
  • Karin Coulie-Castellani, Wenceslas Rahajandraibe, Hassen Aziza, Jean-Michel Portal, Gilles Micolau. Improvement of a detection chain based on a VCO concept for microelectronic reliability under natural radiative environment. 16. Latin-American Test Symposium (LATS)), Mar 2015, Puerto Vallarta, Mexico. ⟨hal-01595709⟩
  • W. Rahajandraibe, Fayrouz. Haddad, Hassen Aziza, K. Castellani-Coulié, Jean-Michel Portal. Low cost built-in-tuning of on-chip passive filters for low-if double quadrature rf receiver. 2015 16th Latin-American Test Symposium (LATS), Mar 2015, Puerto Vallarta, France. ⟨10.1109/LATW.2015.7102501⟩. ⟨hal-01895519⟩
  • K. Coulie-Castellani, S. Ben Krit, W. Rahajandraibe, G. Micolau, Hassen Aziza, et al.. Development of a CMOS oscillator chain for particle detection based on SOI technology. 2015 4th International Conference on Advancements in Nuclear Instrumentation Measurement Methods and their Applications (ANIMMA), Apr 2015, Lisbon, France. pp.1-5. ⟨hal-02031850⟩
  • Hassen Aziza, Haytem Ayari, Santhosh Onkaraiah, Jean-Michel Portal, Mathieu Moreau, et al.. Oxide based resistive RAM: ON/OFF resistance analysis versus circuit variability. 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Oct 2014, Amsterdam, Netherlands. ⟨10.1109/DFT.2014.6962107⟩. ⟨hal-01745718⟩
  • Karine Coulié-Castellani, Wenceslas Rahajandraibe, Gilles Micolau, Hassen Aziza, Jean Michel Portal, et al.. Improvement of a VCO concept for low energy particule detection and recognition. 15th Latin American Test Workshop (LATW), IEEE., Mar 2014, Fortaleza, Brazil. ⟨hal-02742766⟩
  • Hassen Aziza, Marc Bocquet, Mathieu Moreau, Jean-Michel Portal. A Built-In Self-Test Structure (BIST) for Resistive RAMs Characterization: Application to Bipolar OxRRAMs. International Semiconductor Device Research Symposium, Dec 2013, Bethesda, United States. ⟨hal-01745729⟩
  • Hassen Aziza, Marc Bocquet, Mathieu Moreau, Jean-Michel Portal. Single-ended sense amplifier robustness evaluation for OxRRAM technology. 2013 IEEE Design and Test Symposium (IDT), Dec 2013, Marrakesh, Morocco. ⟨10.1109/IDT.2013.6727097⟩. ⟨hal-01745737⟩
  • Y Zhang, Erya Deng, Jacques-Olivier Klein, Damien Querlioz, DafinÉ Ravelosona, et al.. Synchronous Full-Adder based on Complementary Resistive Switching Memory Cells. 11th International New Circuits and Systems Conference (NEWCAS), Jun 2013, Paris, France. ⟨10.1109/NEWCAS.2013.6573578⟩. ⟨hal-01840795⟩
  • Jean-Michel Portal, Mathieu Moreau, Marc Bocquet, Hassen Aziza, Damien Deleruyelle, et al.. Analytical study of complementary memristive synchronous logic gates. 2013 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), Jul 2013, Brooklyn, United States. ⟨10.1109/NanoArch.2013.6623047⟩. ⟨hal-01745759⟩
  • Jean-Michel Portal, M. Moreau, Marc Bocquet, Hassen Aziza, D. Deleruyelle, et al.. Analytical study of complementary memristive synchronous logic gates. 2013 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), Jul 2013, Brooklyn, France. ⟨10.1109/NanoArch.2013.6623047⟩. ⟨hal-01827052⟩
  • Fayrouz. Haddad, W. Rahajandraibe, Hassen Aziza, K. Castellani-Coulié, Jean-Michel Portal. On the investigation of built-in tuning of RF receivers using on-chip polyphase filters. 2013 IEEE 31st VLSI Test Symposium (VTS), Apr 2013, Berkeley, United States. ⟨10.1109/VTS.2013.6548932⟩. ⟨hal-01895498⟩
  • W. Rahajandraibe, Fayrouz. Haddad, Hassen Aziza, K. Castellani-Coulié, Jean-Michel Portal. Built-in tuning of the local oscillator for open loop modulation of low cost, low power RF transceiver. 2013 14th Latin American Test Workshop - LATW, Apr 2013, Cordoba, Argentina. ⟨10.1109/LATW.2013.6562686⟩. ⟨hal-01895505⟩
  • K. Coulié, Marc Bocquet, Hassen Aziza, Jean-Michel Portal, Wenceslas Rahajandraibe, et al.. SPICE level analysis of Single Event Effects in an OxRRAM cell. 2013 14th Latin American Test Workshop - LATW, Apr 2013, Cordoba, France. ⟨10.1109/LATW.2013.6562684⟩. ⟨hal-01804661⟩
  • G. Micolau, K. Castellani-Coulié, Hassen Aziza, Jean-Michel Portal. SITARe: A simulation tool for analysis and diagnosis of radiation effects. 2012 13th Latin American Test Workshop - LATW, Apr 2012, Quito, France. pp.1-5. ⟨hal-02030884⟩
  • Weisheng Zhao, Y Zhang, Jacques-Olivier Klein, Damien Querlioz, Dafine Ravelosona, et al.. Crossbar architecture based on 2R complementary resistive switching memory cell. 2012 IEEE/ACM International Symposium on Nanoscale Architectures , Jul 2012, Amsterdam, Netherlands. ⟨10.1145/2765491.2765508⟩. ⟨hal-01745351⟩
  • Fayrouz. Haddad, W. Rahajandraibe, Hassen Aziza, K. Castellani-Coulié, Jean-Michel Portal. Built-in tuning of RFIC Passive Polyphase Filter by process and thermal monitoring. 2012 13th Latin American Test Workshop - LATW, Apr 2012, Quito, France. pp.1-5. ⟨hal-02030953⟩
  • Fayrouz. Haddad, Wenceslas Rahajandraibe, Hassen Aziza, Karine Castellani-Coulie, Jean-Michel Portal. Built-in Tunning of RFIC Passive Polyphase Filter by Process and Thermal Monitoring. IEEE Latin-American Test Workshop LATW, Apr 2012, Quito, Ecuador. ⟨hal-01895495⟩
  • K. Castellani-Coulié, Hassen Aziza, W. Rahajandraibe, G. Micolau, Jean-Michel Portal. Investigation of a CMOS oscillator concept for particle detection and diagnosis. 2012 13th Latin American Test Workshop - LATW, Apr 2012, Quito, France. pp.1-5. ⟨hal-02025655⟩
  • G. Micolau, K. Castellani-Coulié, Hassen Aziza, Jean-Michel Portal. Contribution to SER prediction: A new metric based on RC transient simulations. 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2011, Sevilla, France. pp.103-108. ⟨hal-02025653⟩
  • K. Castellani-Coulié, Jean-Michel Portal, G. Micolau, Hassen Aziza. Analysis of SEU parameters for the study of SRAM cells reliability under radiation. 2011 12th Latin American Test Workshop - LATW, Mar 2011, Beach of Porto de Galinhas, France. pp.1-5. ⟨hal-02025650⟩
  • Hassen Aziza, Jean-Michel Portal, K. Castellani-Coulié. Using design of experiment to diagnose analog blocks geometrical defects: Application to current reference circuits. Technology of Integrated Systems in Nanoscale Era (DTIS), Apr 2011, Athens, France. pp.1-5. ⟨hal-02025644⟩
  • G. Micolau, Hassen Aziza, K. Castellani-Coulié, Jean-Michel Portal. Impact of SEU configurations on a SRAM cell response at circuit level. 2011 12th Latin American Test Workshop - LATW, Mar 2011, Beach of Porto de Galinhas, France. pp.1-5. ⟨hal-02025647⟩

Book sections1 document

Patents1 document

  • Hassen Aziza. Resistive random memory architecture with high integration density and control method thereof. France, Patent n° : WO2021191362A1. 2021. ⟨hal-03501910⟩

Theses1 document

  • Hassen Aziza. METHODOLOGIE DE DIAGNOSTIC ET TECHNIQUES DE TEST POUR LES MEMOIRES NON VOLATILES DE TYPE EEPROM. Micro et nanotechnologies/Microélectronique. Aix-Marseille Université (AMU), 2004. Français. ⟨tel-03504841⟩

Habilitation à diriger des recherches1 document

  • Hassen Aziza. METHODOLOGIES DE TEST DEIEES AUX MEMOIRES EMBARQUEES. Micro et nanotechnologies/Microélectronique. Aix Marseille Université (AMU), 2012. ⟨tel-03139646v3⟩