Auriane ETIENNE
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GENESIS: A platform for the study and nano analysis of irradiation effects in materials for nuclear applicationThe 16th European Microscopy Congress, Aug 2016, Lyon, France
Communication dans un congrès
hal-02130665v1
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Where Does the FIB Sputtered Matter Accumulate in the SEM Chamber ?European Microscopy Congress, Aug 2016, Lyon, France. pp.565-566, ⟨10.1002/9783527808465.EMC2016.6351⟩
Communication dans un congrès
hal-01954246v1
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