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	Where Does the FIB Sputtered Matter Accumulate in the SEM Chamber ? Emmanuel Cadel , Fabien Cuvilly , Charly Vaudolon , Auriane Etienne European Microscopy Congress, Aug 2016, Lyon, France. pp.565-566, ⟨10.1002/9783527808465.EMC2016.6351⟩ Communication dans un congrès hal-01954246v1