Arnaud Virazel
25%
Libre accès
4
Documents
Affiliations actuelles
- 1100642
Identifiants chercheurs
arnaud-virazel- IdRef : 068454724
- ISNI : 0000000139422532
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0000-0001-7398-7107
Présentation
Enseignant-chercheur au **LIRMM** dans l’équipe de recherche **TEST**: Test and dEpendability of microelectronic integrated SysTems.
<https://www.lirmm.fr/recherche/equipes/test>
**Cours** :
<http://www.lirmm.fr/~virazel/COURS/index.php?dir=L1%20-%20HLEE202/Cours/>
**Researchgate** :
[https://www.researchgate.net/profile/Arnaud\_Virazel](https://www.researchgate.net/profile/Arnaud_Virazel)
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Scan-chain intra-cell defects gradingDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2015, Naples, Italy. ⟨10.1109/DTIS.2015.7127349⟩
Communication dans un congrès
lirmm-01272696v1
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Exploring the impact of functional test programs re-used for power-aware testingDATE 2015 - 18th Design, Automation and Test in Europe Conference and Exhibition, Mar 2015, Grenoble, France. pp.1277-1280, ⟨10.7873/DATE.2015.1031⟩
Communication dans un congrès
lirmm-01272937v1
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An effective ATPG flow for Gate Delay FaultsDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2015, Naples, Italy. ⟨10.1109/DTIS.2015.7127350⟩
Communication dans un congrès
lirmm-01272719v1
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A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay TestingETS 2011 - 16th IEEE European Test Symposium, May 2011, Trondheim, Norway. pp.153-158, ⟨10.1109/ETS.2011.21⟩
Communication dans un congrès
lirmm-00647822v1
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