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	Scan-Chain Intra-Cell Aware Testing Aymen Touati , Alberto Bosio , Patrick Girard , Arnaud Virazel , Matteo Sonza Reorda IEEE Transactions on Emerging Topics in Computing, 2018, 6 (2), pp.278-287. ⟨10.1109/TETC.2016.2624311⟩ Article dans une revue lirmm-01430859v1
	Microprocessor Testing: Functional Meets Structural Test Aymen Touati , Alberto Bosio , Patrick Girard , Arnaud Virazel , Paolo Bernardi Journal of Circuits, Systems, and Computers, 2017, 26 (08), ⟨10.1142/S0218126617400072⟩ Article dans une revue lirmm-01718578v1

	Scan-chain intra-cell defects grading Aymen Touati , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2015, Naples, Italy. ⟨10.1109/DTIS.2015.7127349⟩ Communication dans un congrès lirmm-01272696v1
	An effective ATPG flow for Gate Delay Faults Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel , Paolo Bernardi DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2015, Naples, Italy. ⟨10.1109/DTIS.2015.7127350⟩ Communication dans un congrès lirmm-01272719v1
	Exploring the impact of functional test programs re-used for power-aware testing Aymen Touati , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel DATE 2015 - 18th Design, Automation and Test in Europe Conference and Exhibition, Mar 2015, Grenoble, France. pp.1277-1280, ⟨10.7873/DATE.2015.1031⟩ Communication dans un congrès lirmm-01272937v1
	A Comprehensive Evaluation of Functional Programs for Power-Aware Test Aymen Touati , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial NATW: North Atlantic Test Workshop, May 2014, Johnson City, NY, United States. pp.69-72, ⟨10.1109/NATW.2014.23⟩ Communication dans un congrès lirmm-01248597v1

Arnaud Virazel