Arnaud Virazel
90%
Libre accès
10
Documents
Affiliations actuelles
- 1100642
Identifiants chercheurs
- arnaud-virazel
- IdRef : 068454724
- ISNI : 0000000139422532
- 0000-0001-7398-7107
Présentation
Enseignant-chercheur au **LIRMM** dans l’équipe de recherche **TEST**: Test and dEpendability of microelectronic integrated SysTems.
<https://www.lirmm.fr/recherche/equipes/test>
**Cours** :
<http://www.lirmm.fr/~virazel/COURS/index.php?dir=L1%20-%20HLEE202/Cours/>
**Researchgate** :
[https://www.researchgate.net/profile/Arnaud\_Virazel](https://www.researchgate.net/profile/Arnaud_Virazel)
Publications
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A comprehensive framework for cell-aware diagnosis of customer returnsMicroelectronics Reliability, 2022, 135, pp.114595. ⟨10.1016/j.microrel.2022.114595⟩
Article dans une revue
lirmm-03768999v1
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On Using Cell-Aware Methodology for SRAM Bit Cell TestingETS 2023 - 28th IEEE European Test Symposium, May 2023, Venezia, Italy. pp.1-4, ⟨10.1109/ETS56758.2023.10174118⟩
Communication dans un congrès
hal-04164704v1
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On Using Cell-Aware Models for Representing SRAM Architecture16e Colloque National du GDR SoC², Jun 2022, Strasbourg, France
Communication dans un congrès
lirmm-03987914v1
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A Comprehensive Learning-Based Flow for Cell-Aware Model GenerationITC 2022 - IEEE International Test Conference, Sep 2022, Anaheim, United States. pp.484-488, ⟨10.1109/ITC50671.2022.00057⟩
Communication dans un congrès
lirmm-03770147v1
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Cell-Aware Diagnosis of Customer Returns Using Bayesian InferenceISQED 2021 - 22nd International Symposium on Quality Electronic Design, Apr 2021, Santa Clara (virtual), United States. pp.48-53, ⟨10.1109/ISQED51717.2021.9424337⟩
Communication dans un congrès
hal-03266815v1
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Accelerating Cell-Aware Model Generation Through Machine Learning15e Colloque National du GDR SoC², Jun 2021, Rennes, France
Communication dans un congrès
lirmm-03987805v1
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A Learning-Based Methodology for Accelerating Cell-Aware Model GenerationDATE 2021 - 24th Design, Automation and Test in Europe Conference and Exhibition, Feb 2021, Grenoble, France. pp.1580-1585, ⟨10.23919/DATE51398.2021.9474227⟩
Communication dans un congrès
lirmm-03377383v1
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Machine Learning Support for Cell-aware DiagnosisMachine Learning Support for Fault Diagnosis of System-on-Chip, pp.173-204, 2023, ISBN 978-3-031-19638-6 ISBN 978-3-031-19639-3 (eBook)
Chapitre d'ouvrage
lirmm-03989878v1
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Defect Diagnosis Techniques for Silicon Customer ReturnsFrontiers of Quality Electronic Design (QED), Springer International Publishing, pp.641-676, 2023, 978-3-031-16344-9. ⟨10.1007/978-3-031-16344-9_17⟩
Chapitre d'ouvrage
lirmm-03986615v1
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Cell-Aware Model Generation Using Machine LearningFrontiers of Quality Electronic Design (QED), Springer International Publishing, pp.227-257, 2023, 978-3-031-16344-9. ⟨10.1007/978-3-031-16344-9_6⟩
Chapitre d'ouvrage
lirmm-03986553v1
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