Arnaud Virazel
15%
Libre accès
74
Documents
Affiliations actuelles
- 1100642
Identifiants chercheurs
arnaud-virazel- IdRef : 068454724
- ISNI : 0000000139422532
-
0000-0001-7398-7107
Présentation
Enseignant-chercheur au **LIRMM** dans l’équipe de recherche **TEST**: Test and dEpendability of microelectronic integrated SysTems.
<https://www.lirmm.fr/recherche/equipes/test>
**Cours** :
<http://www.lirmm.fr/~virazel/COURS/index.php?dir=L1%20-%20HLEE202/Cours/>
**Researchgate** :
[https://www.researchgate.net/profile/Arnaud\_Virazel](https://www.researchgate.net/profile/Arnaud_Virazel)
Publications
- 14
- 7
- 6
- 6
- 6
- 6
- 5
- 5
- 5
- 5
- 4
- 4
- 4
- 4
- 4
- 4
- 4
- 3
- 3
- 3
- 3
- 3
- 3
- 3
- 3
- 3
- 3
- 3
- 3
- 3
- 3
- 3
- 3
- 3
- 3
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 74
- 74
- 74
- 73
- 21
- 20
- 17
- 17
- 9
- 9
- 6
- 6
- 5
- 5
- 5
- 5
- 5
- 5
- 5
- 4
- 4
- 4
- 3
- 3
- 3
- 3
- 3
- 2
- 2
- 2
- 2
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 56
- 17
- 1
- 4
- 3
- 1
- 1
- 16
- 27
- 24
- 6
- 3
- 1
- 1
- 1
|
|
A Delay Probability Metric for Input Pattern Ranking Under Process Variation and Supply NoiseISVLSI: International Symposium on Very Large Scale Integration, Jul 2014, Tampa, FL, United States. pp.226-231, ⟨10.1109/ISVLSI.2014.42⟩
Communication dans un congrès
lirmm-01248592v1
|
Test and diagnosis of power switchesDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.213-218, ⟨10.1109/DDECS.2014.6868792⟩
Communication dans un congrès
lirmm-01248590v1
|
|
A Comprehensive Evaluation of Functional Programs for Power-Aware TestNATW: North Atlantic Test Workshop, May 2014, Johnson City, NY, United States. pp.69-72, ⟨10.1109/NATW.2014.23⟩
Communication dans un congrès
lirmm-01248597v1
|
|
|
|
TSV aware timing analysis and diagnosis in paths with multiple TSVsVTS: VLSI Test Symposium, Apr 2014, Napa, CA, United States. ⟨10.1109/VTS.2014.6818772⟩
Communication dans un congrès
lirmm-01248594v1
|
Timing-aware ATPG for critical paths with multiple TSVsDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.116-121, ⟨10.1109/DDECS.2014.6868774⟩
Communication dans un congrès
lirmm-01248600v1
|
|
Protecting combinational logic in pipelined microprocessor cores against transient and permanent faultsDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.223-225, ⟨10.1109/DDECS.2014.6868794⟩
Communication dans un congrès
lirmm-01248598v1
|
|
Real-Time Testing of 90nm COTS SRAMs at Concordia Station in AntarcticaNSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès
lirmm-01237709v1
|
|
iBoX — Jitter based Power Supply Noise sensorETS: European Test Symposium, May 2014, Paderborn, United States. ⟨10.1109/ETS.2014.6847830⟩
Communication dans un congrès
lirmm-01248601v1
|
|
Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion IrradiationNSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès
lirmm-01237660v1
|
|
Power supply noise-aware workload assignments for homogeneous 3D MPSoCs with thermal considerationASP-DAC: Asia and South Pacific Design Automation Conference, Jan 2014, Singapore, Singapore. pp.544-549, ⟨10.1109/ASPDAC.2014.6742948⟩
Communication dans un congrès
lirmm-01248596v1
|
|
Path delay test in the presence of multi-aggressor crosstalk, power supply noise and ground bounceDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.207-212, ⟨10.1109/DDECS.2014.6868791⟩
Communication dans un congrès
lirmm-01248599v1
|
|
On the Reuse of Read and Write Assist Circuits to Improve Test Efficiency in Low-Power SRAMsITC: International Test conference, Sep 2013, Anaheim, CA, United States. pp.1-10, ⟨10.1109/TEST.2013.6651927⟩
Communication dans un congrès
lirmm-00818977v1
|
|
SRAM Soft Error Rate Evaluation Under Atmospheric Neutron Radiation and PVT variationsIOLTS: International On-Line Testing Symposium, Jul 2013, Chania, Crete, Greece. pp.145-150, ⟨10.1109/IOLTS.2013.6604066⟩
Communication dans un congrès
lirmm-00818955v1
|
|
Adaptive Source Bias for Improved Resistive-Open Defect Coverage during SRAM TestingATS: Asian Test Symposium, Nov 2013, Jiaosi Township, Taiwan. pp.109-114, ⟨10.1109/ATS.2013.30⟩
Communication dans un congrès
lirmm-01248609v1
|
|
|
|
Test Solution for Data Retention Faults in Low-Power SRAMsDATE 2013 - 16th Design, Automation and Test in Europe Conference, Mar 2013, Grenoble, France. pp.442-447, ⟨10.7873/DATE.2013.099⟩
Communication dans un congrès
lirmm-00805140v1
|
On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cellDFT: Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2013, New York, United States. pp.143-148, ⟨10.1109/DFT.2013.6653597⟩
Communication dans un congrès
lirmm-01238413v1
|
|
A novel method to mitigate TSV electromigration for 3D ICsISVLSI: IEEE Computer Society Annual Symposium on VLSI, Aug 2013, Natal, Brazil. pp.121-126, ⟨10.1109/ISVLSI.2013.6654633⟩
Communication dans un congrès
lirmm-01248617v1
|
|
Improving Defect Localization Accuracy by means of Effect-Cause Intra-Cell Diagnosis at Transistor LevelSDD: Silicon Debug and Diagnosis, Sep 2013, Anaheim, CA, United States
Communication dans un congrès
lirmm-00806872v1
|
|
Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failuresDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Mar 2013, Abu Dhabi, United Arab Emirates. pp.39-44, ⟨10.1109/DTIS.2013.6527775⟩
Communication dans un congrès
lirmm-01248603v1
|
|
SEU Monitoring in Mixed-Field Radiation Environments of Particle AcceleratorsRADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937419⟩
Communication dans un congrès
lirmm-00839085v1
|
|
Worst-Case Power Supply Noise and Temperature Distribution Analysis for 3D PDNs with Multiple Clock DomainsNEWCAS: New Circuits and Systems, Jun 2013, Paris, France. ⟨10.1109/NEWCAS.2013.6573628⟩
Communication dans un congrès
lirmm-00839042v1
|
|
Mitigate TSV Electromigration for 3D ICs - From the Architecture PerspectiveInternational Symposium on VLSI, Natale, Brazil. pp.6
Communication dans un congrès
lirmm-00839052v1
|
|
Evaluating An SEU Monitor For Mixed-Field Radiation EnvironmentsiWoRID: International Workshop on Radiation Imaging Detectors, SOLEIL Synchrotron, Jun 2013, Paris, France
Communication dans un congrès
lirmm-01238433v1
|
|
Computing Detection Probability of Delay Defects in Signal Line TSVsETS: European Test Symposium, May 2013, Avignon, France. ⟨10.1109/ETS.2013.6569349⟩
Communication dans un congrès
lirmm-00839044v1
|
|
A Built-in Scheme for Testing and Repairing Voltage Regulators of Low-Power SRAMsVTS: VLSI Test Symposium, Apr 2013, Berkeley, CA, United States. pp.1-6, ⟨10.1109/VTS.2013.6548894⟩
Communication dans un congrès
lirmm-00805366v1
|
|
|
|
Multiple-Cell-Upsets on a commercial 90nm SRAM in Dynamic ModeRADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937429⟩
Communication dans un congrès
lirmm-00839062v1
|
Effect-Cause Intra-Cell Diagnosis at Transistor LevelISQED 2013 - 14th International Symposium on Quality Electronic Design, Mar 2013, Santa Clara, CA, United States. pp.460-467, ⟨10.1109/ISQED.2013.6523652⟩
Communication dans un congrès
lirmm-00817224v1
|
|
Fast and Accurate Electro-Thermal Analysis of Three-Dimensional Power Delivery NetworksEuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2013, Wroclaw, Poland. pp.1-4, ⟨10.1109/EuroSimE.2013.6529956⟩
Communication dans un congrès
lirmm-00839043v1
|
|
Temperature Impact on the Neutron SER of a Commercial 90nm SRAMNSREC: Nuclear and Space Radiation Effects Conference, Jul 2013, San Francisco, Ca, United States. pp.1-4
Communication dans un congrès
lirmm-00805291v1
|
|
|
|
Performance Characterization of TAS-MRAM Architectures in Presence of Capacitive DefectsVALID: Advances in System Testing and Validation Lifecycle, Oct 2013, Venice, Italy. pp.39-44
Communication dans un congrès
lirmm-01433308v1
|
Characterization of an SRAM Based Particle Detector For Mixed-Field Radiation EnvironmentsIWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2013, Bari, Italy. pp.75-80, ⟨10.1109/IWASI.2013.6576070⟩
Communication dans un congrès
lirmm-00839046v1
|
|
Analyzing resistive-open defects in SRAM core-cell under the effect of process variabilityETS: European Test Symposium, May 2013, Avignon, France. ⟨10.1109/ETS.2013.6569373⟩
Communication dans un congrès
lirmm-01921630v1
|
|
Power Supply Noise Sensor Based on Timing Uncertainty MeasurementsATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp.161-166, ⟨10.1109/ATS.2012.46⟩
Communication dans un congrès
lirmm-00806890v1
|
|
Low-power SRAMs Power Mode Control Logic: Failure Analysis and Test SolutionsITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. pp.1-10, ⟨10.1109/TEST.2012.6401578⟩
Communication dans un congrès
lirmm-00805143v1
|
|
SRAM testing under Neutron Radiation for the evaluation of different algorithms stress15ème Journées Nationales du Réseau Doctoral en Microélectronique, Jun 2012, Marseille, France
Communication dans un congrès
lirmm-00807054v1
|
|
|
|
Electro-Thermal Analysis of 3D Power Delivery NetworksDAC: Design Automation Conference, 2012, San Francisco, United States
Communication dans un congrès
lirmm-00806836v1
|
Impact of Resistive-Open Defects on the Heat Current of TAS-MRAM ArchitecturesDATE 2012 - 15th Design, Automation and Test in Europe Conference and Exhibition, Mar 2012, Dresden, Germany. pp.532-537, ⟨10.1109/DATE.2012.6176526⟩
Communication dans un congrès
lirmm-00689024v1
|
|
Defect Localization Through an Effect-Cause based Intra-Cell DiagnosisColloque GDR SoC-SiP, 2012, Paris, France
Communication dans un congrès
lirmm-00806841v1
|
|
Fault Localization Improvement through an Intra-Cell Diagnosis ApproachISTFA 2012 - 38th International Symposium for Testing and Failure Analysis, Nov 2012, Phoenix, AZ, United States. pp.509-519
Communication dans un congrès
lirmm-00806863v1
|
|
Dynamic Mode Test of a Commercial 4Mb Toggle MRAM under Neutron RadiationRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4
Communication dans un congrès
lirmm-00805165v1
|
|
Radiation Induced Effects on Electronic Systems and ICsSETS: South European Test Seminar, Mar 2012, Sauze d'Oulx, Italy
Communication dans un congrès
lirmm-00807055v1
|
|
Adaptive Voltage Scaling via Effective On-Chip Timing Uncertainty MeasurementsColloque GDR SoC-SiP, 2012, Paris, France
Communication dans un congrès
lirmm-00806859v1
|
|
Evaluation of Test Algorithms Stress Effect on SRAMs under Neutron RadiationIOLTS: International On-Line Testing Symposium, Jun 2012, Sitges, Spain. pp.212-222, ⟨10.1109/IOLTS.2012.6313853⟩
Communication dans un congrès
lirmm-00805373v1
|
|
A Pseudo-Dynamic Comparator for Error Detection in Fault Tolerant ArchitecturesVTS: VLSI Test Symposium, Apr 2012, Hawaii, United States. pp.50-55, ⟨10.1109/VTS.2012.6231079⟩
Communication dans un congrès
lirmm-00806778v1
|
|
|
|
Impact of Resistive-Bridge Defects in TAS-MRAM ArchitecturesATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp.125-130, ⟨10.1109/ATS.2012.37⟩
Communication dans un congrès
lirmm-00806809v1
|
Complete Framework for the Estimation of the SRAM Core-Cell Resilience to RadiationRADECS: Radiation and its Effects on Components and Systems, Sep 2012, Biarritz, France
Communication dans un congrès
hal-01935785v1
|
|
Impacts of Resistive-Open Defects in the Word-Line Selection of TAS-MRAMsColloque GDR SoC-SiP, 2012, Paris, France
Communication dans un congrès
lirmm-00806842v1
|
|
Through-Silicon-Via Resistive-Open Defect AnalysisETS: European Test Symposium, May 2012, Annecy, France. ⟨10.1109/ETS.2012.6233037⟩
Communication dans un congrès
lirmm-00806848v1
|
|
Why and How Controlling Power Consumption During Test: A SurveyATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp. 221-226, ⟨10.1109/ATS.2012.30⟩
Communication dans un congrès
lirmm-00818984v1
|
|
Resistive-Open Defect Analysis for Through-Silicon-ViasDCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France
Communication dans un congrès
lirmm-00806803v1
|
|
Defect Analysis in Power Mode Control Logic of Low-Power SRAMsETS: European Test Symposium, May 2012, Annecy, France. ⟨10.1109/ETS.2012.6233033⟩
Communication dans un congrès
lirmm-00805374v1
|
|
Dynamic Mode Testing of SRAMS under Neutron RadiationSixième colloque du GDR SOC-SIP du CNRS, Jun 2012, Paris, France
Communication dans un congrès
lirmm-00807053v1
|
|
A Novel Framework for Evaluating the SRAM Core-Cell Sensitivity to NeutronsRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4
Communication dans un congrès
lirmm-00805163v1
|
|
Resistive-Open Defects Affecting Bit-Line Selection in TAS-MRAM ArchitecturesJNRDM: Journées Nationales du Réseau Doctoral en Microélectronique, 2012, Paris, France
Communication dans un congrès
lirmm-00806827v1
|
|
Failure Analysis and Test Solutions for Low-Power SRAMsATS: Asian Test Symposium, Nov 2011, New Delhi, India. pp.459-460, ⟨10.1109/ATS.2011.97⟩
Communication dans un congrès
lirmm-00805123v1
|
|
Power-Aware Test Pattern Generation for At-Speed LOS TestingATS: Asian Test Symposium, Nov 2011, New Delhi, India. pp.506-510
Communication dans un congrès
lirmm-00651917v1
|
|
Power Supply Noise and Ground Bounce Aware Pattern Generation for Delay TestingNEWCAS: International New Circuits and Systems Conference, Jun 2011, Bordeaux, France. pp.73-76, ⟨10.1109/NEWCAS.2011.5981222⟩
Communication dans un congrès
lirmm-00647815v1
|
|
A Study of Path Delay Variations in the Presence of Uncorrelated Power and Ground Supply NoiseDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2011, Cottbus, Germany. pp.189-194, ⟨10.1109/DDECS.2011.5783078⟩
Communication dans un congrès
lirmm-00592000v1
|
|
Simultaneous Power and Thermal Integrity Analysis for 3D Integrated SystemsLPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability, Trondheim, Norway
Communication dans un congrès
lirmm-00651802v1
|
|
Analysis of Resistive-Open Defects in TAS-MRAM ArrayITC: International Test Conference, Sep 2011, Anaheim, CA, United States
Communication dans un congrès
lirmm-00679524v1
|
Performance Evaluation of Capacitive defects on TAS-MRAMsColloque GDR SoC-SiP, 2013, Lyon, France. 2013
Poster de conférence
lirmm-00839093v1
|
|
Investigating Multiple-Cell-Upsets on a 90mn SRAMColloque GDR SoC-SiP, 2013, Lyon, France. 2013
Poster de conférence
lirmm-00839108v1
|
|
Fault-Effect Propagation Based Intra-cell Scan Chain DiagnosisColloque GDR SoC-SiP, Jun 2013, Lyon, France. 2013
Poster de conférence
lirmm-00839113v1
|
|
Coupling-Based Resistive-Open Defects in TAS-MRAM ArchitecturesETS: European Test Symposium, May 2012, Annecy, France. Test Symposium (ETS), 2012 17th IEEE European, 2012, ⟨10.1109/ETS.2012.6233034⟩
Poster de conférence
lirmm-00806793v1
|
|
Resistive Open Defect Analysis for Through-Silicon-ViasETS: European Test Symposium, May 2012, Annecy, France. 17th IEEE European Test Symposium, pp.183, 2012
Poster de conférence
lirmm-00806795v1
|
Electromigration Alleviation Techniques for 3D Integrated CircuitsChao Wang. High Performance Computing for Big Data: Methodologies and Applications, CRC Press, pp.37-58, 2017, 9781498783996
Chapitre d'ouvrage
lirmm-01800220v1
|