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Arnaud Virazel

88%

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16

Documents

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1100642

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arnaud-virazel
IdRef : 068454724
ISNI : 0000000139422532
0000-0001-7398-7107

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Publications

marcellotraiola

	A Survey of Testing Techniques for Approximate Integrated Circuits Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi , Alberto Bosio Proceedings of the IEEE, 2020, 108 (12), pp.2178-2194. ⟨10.1109/JPROC.2020.2999613⟩ Article dans une revue lirmm-02395609v1
	A Test Pattern Generation Technique for Approximate Circuits Based on an ILP-Formulated Pattern Selection Procedure Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi , Alberto Bosio IEEE Transactions on Nanotechnology, 2019, 18, pp.849-857. ⟨10.1109/TNANO.2019.2923040⟩ Article dans une revue lirmm-02395306v1

	Reducing Overprovision of Triple Modular Reduncancy Owing to Approximate Computing Bastien Deveautour , Marcello Traiola , Arnaud Virazel , Patrick Girard IOLTS 2021 - 27th IEEE International Symposium on On-Line Testing and Robust System Design, Jun 2021, Torino, Italy. pp.1-7, ⟨10.1109/IOLTS52814.2021.9486699⟩ Communication dans un congrès lirmm-03380025v1
	Emerging Computing Devices: Challenges and Opportunities for Test and Reliability Alberto Bosio , Ian O'Connor , Marcello Traiola , Jorge Echavarria , Jürgen Teich ETS 2021 - 26th IEEE European Test Symposium, May 2021, Bruges, Belgium. pp.1-10, ⟨10.1109/ETS50041.2021.9465409⟩ Communication dans un congrès lirmm-03379074v1
	A Novel Test Flow for Approximate Digital Circuits Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi , Alberto Bosio DATE 2020 - EDAA/IEEE/ACM Design Automation & Test in Europe Conference, PhD Forum, Mar 2020, Grenoble, France Communication dans un congrès lirmm-03993654v1
	Design, Verification, Test and In-Field Implications of Approximate Computing Systems Alberto Bosio , Stefano Di Carlo , Patrick Girard , Ernesto Sanchez , Alessandro Savino ETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia. pp.1-10, ⟨10.1109/ETS48528.2020.9131557⟩ Communication dans un congrès lirmm-03035724v1
	Maximizing Yield for Approximate Integrated Circuits Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi , Alberto Bosio DATE 2020 - 23rd Design, Automation and Test in Europe Conference and Exhibition, Mar 2020, Grenoble, France. pp.810-815, ⟨10.23919/DATE48585.2020.9116341⟩ Communication dans un congrès lirmm-03036002v1
	QAMR: an Approximation-Based FullyReliable TMR Alternative for Area Overhead Reduction Bastien Deveautour , Marcello Traiola , Arnaud Virazel , Patrick Girard ETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia. pp.1-6, ⟨10.1109/ETS48528.2020.9131574⟩ Communication dans un congrès lirmm-03035640v1
	Investigation of Mean-Error Metrics for Testing Approximate Integrated Circuits Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbarcschi , Alberto Bosio DFT 2018 - 31st IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2018, Chicago, United States. pp.1-6, ⟨10.1109/DFT.2018.8602939⟩ Communication dans un congrès lirmm-02099895v1
	On the Comparison of Different ATPG approaches for Approximate Integrated Circuits Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi , Alberto Bosio DDECS 2018 - 1st International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2018, Budapest, Hungary. pp.85-90, ⟨10.1109/DDECS.2018.00022⟩ Communication dans un congrès lirmm-03032856v1
	Testing Approximate Digital Circuits: Challenges and Opportunities Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi , Alberto Bosio LATS 2018 - 19th IEEE Latin American Test Symposium, Mar 2018, Sao Paulo, Brazil. pp.1-6, ⟨10.1109/LATW.2018.8349681⟩ Communication dans un congrès lirmm-03033024v1
	Can we Approximate the Test of Integrated Circuits? Imran Wali , Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi WAPCO: Workshop On Approximate Computing, Jan 2017, Stockholm, Sweden Communication dans un congrès lirmm-02004418v1
	Towards approximation during test of Integrated Circuits Imran Wali , Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi DDECS 2017 - 20th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2017, Dresden, Germany. pp.28-33, ⟨10.1109/DDECS.2017.7934574⟩ Communication dans un congrès lirmm-01718580v1
	Towards digital circuit approximation by exploiting fault simulation Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi , Alberto Bosio EWDTS: East-West Design & Test Symposium, Sep 2017, Novi Sad, Serbia. ⟨10.1109/EWDTS.2017.8110108⟩ Communication dans un congrès lirmm-01718583v1

	Design, Verification, Test, and In-Field Implications of Approximate Digital Integrated Circuits Alberto Bosio , Stefano Di Carlo , Patrick Girard , Annachiara Ruospo , Ernesto Sanchez Approximate Computing Techniques, Springer International Publishing, pp.349-385, 2022, ⟨10.1007/978-3-030-94705-7_12⟩ Chapitre d'ouvrage hal-03888027v1
	Test and Reliability of Approximate Hardware Marcello Traiola , Bastien Deveautour , Alberto Bosio , Patrick Girard , Arnaud Virazel Approximate Computing, Springer International Publishing, pp.233-266, 2022, ⟨10.1007/978-3-030-98347-5_10⟩ Chapitre d'ouvrage hal-03888016v1