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Arnaud Virazel

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arnaud-virazel
IdRef : 068454724
ISNI : 0000000139422532
0000-0001-7398-7107

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	On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell Elena Ioana Vatajelu , Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard DFT: Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2013, New York, United States. pp.143-148, ⟨10.1109/DFT.2013.6653597⟩ Communication dans un congrès lirmm-01238413v1
	SRAM Soft Error Rate Evaluation Under Atmospheric Neutron Radiation and PVT variations Georgios Tsiligiannis , Elena Ioana Vatajelu , Luigi Dilillo , Alberto Bosio , Patrick Girard IOLTS: International On-Line Testing Symposium, Jul 2013, Chania, Crete, Greece. pp.145-150, ⟨10.1109/IOLTS.2013.6604066⟩ Communication dans un congrès lirmm-00818955v1
	Adaptive Source Bias for Improved Resistive-Open Defect Coverage during SRAM Testing Elena Ioana Vatajelu , Alberto Bosio , Patrick Girard , Aida Todri-Sanial , Arnaud Virazel ATS: Asian Test Symposium, Nov 2013, Jiaosi Township, Taiwan. pp.109-114, ⟨10.1109/ATS.2013.30⟩ Communication dans un congrès lirmm-01248609v1
	Analyzing resistive-open defects in SRAM core-cell under the effect of process variability Elena Ioana Vatajelu , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial ETS: European Test Symposium, May 2013, Avignon, France. ⟨10.1109/ETS.2013.6569373⟩ Communication dans un congrès lirmm-01921630v1
	Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures Elena Ioana Vatajelu , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Mar 2013, Abu Dhabi, United Arab Emirates. pp.39-44, ⟨10.1109/DTIS.2013.6527775⟩ Communication dans un congrès lirmm-01248603v1