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Number of documents

3

Dr. Antoine GUITTON, Tenured Associate Professor of Materials Physics


Y. D. Zhang   

Journal articles1 document

  • Etienne Brodu, Emmanuel Bouzy, Jean-Jacques Fundenberger, Julien Guyon, Antoine Guitton, et al.. On-axis TKD for orientation mapping of nanocrystalline materials in SEM. Materials Characterization, Elsevier, 2017, 130, pp.92-96. ⟨10.1016/j.matchar.2017.05.036⟩. ⟨hal-02392258⟩

Poster communications2 documents

  • Chunyang Zhang, Jean-Claude Ménard, J Guyon, Jean-Jacques Fundenberger, Yudong Zhang, et al.. Characterization of crystalline defects studied by STEM-in-SEM. MRS Fall Meeting & Exhibit, 2018, Boston, United States. ⟨hal-03165869⟩
  • Antoine Guitton, Etienne Brodu, J Guyon, Yudong Zhang, Emmanuel Bouzy. Grain size determination in nanocrystalline materials using the TKD technique. EMC2016, 2016, Lyon, France. ⟨hal-03165887⟩