EMC performance analysis of a Processor/Memory System using PCB and Package-On-Package
Etienne Sicard
,
Alexandre Boyer
,
Priscillia Fernandez-Lopez
,
An Zhou
,
Nicolas Marier
,
et al.
10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015) , Nov 2015, Edimburgh, United Kingdom. 6p
Communication dans un congrès
hal-01225364v1
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Susceptibility Analysis of an Operational Amplifier Using On-Chip Measurement
He Huang
,
Alexandre Boyer
,
Sonia Ben Dhia
,
Bertrand Vrignon
EMC Europe 2014 , Sep 2014, Goteborg, Sweden. pp.1-5
Communication dans un congrès
hal-01068127v1
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Construction of an Integrated Circuit Emission Model of a FPGA
Chaimae Ghfiri
,
André Durier
,
Alexandre Boyer
,
Sonia Ben Dhia
,
Christian Marot
2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC2016) , May 2016, Shenzhen, China. pp.402-405,
⟨10.1109/APEMC.2016.7522751⟩
Communication dans un congrès
hal-01663667v2
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New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs
Nabil El-Belghiti
,
Patrick Tounsi
,
Alexandre Boyer
,
Arnaud Viard
Communication dans un congrès
hal-01997428v1
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Optimized algorithm to reduce the near-field measurement time on FPGA device
Sebastien Serpaud
,
Alexandre Boyer
,
Sonia Ben Dhia
12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2019) , Oct 2019, Haining, China
Communication dans un congrès
hal-02319472v1
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New Measurement Method to Investigated Service Life of Protection Networks exposed to ESD
François Ruffat
,
Fabrice Caignet
,
Alexandre Boyer
,
Fabien Escudié
,
Guillaume Mejecaze
,
et al.
33rd European Symposium on Reliability of Electron Devices Failure Physics and Analysis (ESREF2022) , Sep 2022, Berlin, Germany.
⟨10.1016/j.microrel.2022.114661⟩
Communication dans un congrès
hal-03788168v1
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Detecting PCB Assembly defects using infrared thermal signatures
Nabil El Belghiti Alaoui
,
Patrick Tounsi
,
Alexandre Boyer
,
Arnaud Viard
Communication dans un congrès
hal-02319460v1
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Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits
Alexandre Boyer
,
Sonia Ben Dhia
Journal of Low Power Electronics , 2014, 10 (1), pp.165-172
Article dans une revue
hal-00938358v1
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La céramique d'habitat du Bronze final IIIb à La Tène B en Alsace et en Lorraine : essai de typo-chronologie, Dijon : Société Archéologique de l'Est, 2011.
Anne-Marie Adam
,
Sylvie Deffressigne
,
M.P. Koenig
,
Marina Lasserre
,
Alexandre Boyer
,
et al.
Société Archéologique de l'Est, pp.339, 2011
Ouvrages
halshs-00610972v1
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Fatal case of enterovirus 71 infection and rituximab therapy, france, 2012.
Somar Kassab
,
Tahar Saghi
,
Alexandre Boyer
,
Marie-Edith Lafon
,
Didier Gruson
,
et al.
Emerging Infectious Diseases , 2013, 19, pp.1345-7
Article dans une revue
hal-01101199v1
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Anemometer based on Seebeck effect
M. Al Khalfioui
,
A. Michez
,
Alain Giani
,
Alexandre Boyer
,
A. Foucaran
Article dans une revue
istex
hal-00327503v1
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Growth parameters effect on thermoelectric characteristics of Bi2Se3 thin films grown by MOCVD system using Ditertiarybutylselenide as a precursor
A. Al Bayaz
,
Alain Giani
,
M. Al Khalfioui
,
A. Foucaran
,
F. Pascal-Delannoy
,
et al.
Article dans une revue
istex
hal-00327154v1
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Étude du frottement intérieur des borates et phosphoaluminates vitreux par la méthode d'écho d'impulsion (pulse-echo)
J. Phalippou
,
Alexandre Boyer
,
E. Groubert
,
J. Zarzycki
Article dans une revue
istex
jpa-00243943v1
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Electro-magnetic robustness of integrated circuits: from statement to prediction
Sonia Ben Dhia
,
Alexandre Boyer
2013 9th Intl Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2013) , Dec 2013, Nara, Japan. pp.208 - 213,
⟨10.1109/EMCCompo.2013.6735202⟩
Communication dans un congrès
hal-00945302v1
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Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC–DC converter
He Huang
,
Alexandre Boyer
,
Sonia Ben Dhia
Article dans une revue
hal-01225333v1
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Methodology of modeling of the internal activity of a FPGA for conducted emission prediction purpose
Chaimae Ghfiri
,
André Durier
,
Christian Marot
,
Alexandre Boyer
,
Sonia Ben Dhia
11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017) , Jul 2017, Saint-Petersbourgh, Russia. 6p
Communication dans un congrès
hal-01574384v1
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Modeling the internal activity of an FPGA for conducted emission prediction purpose
Chaimae Ghfiri
,
André Durier
,
C. Marot
,
Alexandre Boyer
,
Sonia Ben Dhia
2018 Joint IEEE EMC & APEMC Symposium , May 2018, Singapour, Singapore. 6p
Communication dans un congrès
hal-01839745v1
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Modèle d'injection électromagnétique en champ proche sur circuit intégré
Rachid Omarouayache
,
Jérémy Raoult
,
Pierre Payet
,
Laurent Chusseau
,
Bertrand Vrignon
,
et al.
19èmes Journées Nationales Microondes - JNM 2015 , Jun 2015, Bordeaux, France
Communication dans un congrès
hal-01892688v1
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Electronic counterfeit detection based on the measurement of electromagnetic fingerprint Electronic counterfeit detection based on the measurement of electromagnetic fingerprint
He Huang
,
Alexandre Boyer
,
Sonia Ben Dhia
26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2015) , Oct 2015, Toulouse, France
Communication dans un congrès
hal-01225354v1
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Sequential adaptive sampling algorithm to reduce the near field measurement time
Sébastien Serpaud
,
Alexandre Boyer
,
Sonia Ben Dhia
International Symposium on Electromagnetic Compatibility (EMC Europe 2019) , Sep 2019, Barcelona, Spain
Communication dans un congrès
hal-02319466v1
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Low-Cost Broadband Electronic Coupler for Estimation of Radiated Emission of Integrated Circuits in TEM Cell
Alexandre Boyer
,
Sonia Ben Dhia
Article dans une revue
hal-02937460v1
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Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes
Alexandre Boyer
,
Nicolas Nolhier
,
Fabrice Caignet
,
Sonia Ben Dhia
Article dans une revue
hal-03423272v1
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APPLICATION DES METHODES DE MESURES INDIRECTES DE PARAMETRES " S " EN VUE DE LA GESTION DE L'OBSOLESCENCE DES COMPOSANTS EN IMMUNITE CONDUITE
Saliha Chetouani
,
Alexandre Boyer
,
Sébastien Serpaud
,
Sonia Ben Dhia
20e Colloque International et Exposition sur la Compatibilité Electromagnétique CEM2021 , Apr 2021, Lyon (virtuel), France
Communication dans un congrès
hal-03201537v1
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Correlation between Near-Field Scan Immunity and Radiated Susceptibility at Integrated Circuit Level
Alexandre Boyer
,
Nicolas Nolhier
,
Fabrice Caignet
,
Sonia Ben Dhia
Communication dans un congrès
hal-03773209v1
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A Comparative Study of DPI levels on BMS IC With an On-Hand Analytical Model to Predict Resonances
Badr Guendouz
,
Kamel Abouda
,
Alexandre Boyer
,
Sonia Ben Dhia
,
Hiba Mediouni
,
et al.
Communication dans un congrès
hal-03773305v1
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Performance Charaterisation of the Decoupling Capacitor Network using the Near-Field Measurement
Alexandre Boyer
,
Sébastien Serpaud
,
Sonia Ben Dhia
,
Fabio Coccetti
EMC Europe 2023 , Sep 2023, Cracovie, Poland
Communication dans un congrès
hal-04227864v1
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Modeling and Simulation of LDO Voltage Regulator Susceptibility to Conducted EMI
Jianfei Wu
,
Alexandre Boyer
,
Jiancheng Li
,
Bertrand Vrignon
,
Etienne Sicard
,
et al.
Article dans une revue
hal-01159232v1
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IC-EMC User's Manual Version 2.0
Etienne Sicard
,
Alexandre Boyer
INSA Toulouse France. INSA Toulouse France, pp.310, 2009, 978.2.87649.056.7
Ouvrages
hal-00511214v1
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Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout
Nestor Berbel
,
Raul Fernandez-Garcia
,
Ignacio Gil
,
Binhong Li
,
Alexandre Boyer
,
et al.
Microelectronics Reliability , 2011, 51 (9), pp.1564
Article dans une revue
hal-00669511v1
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Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project
Sonia Ben Dhia
,
Alexandre Boyer
Article dans une revue
hal-00938353v1
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