Nombre de documents

103

CV de Alexandre Boyer


Article dans une revue50 documents

  • Alexandre Boyer, Bertrand Vrignon, Manuel Cavarroc. Modeling Magnetic Near-Field Injection at Silicon Die Level. IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2015, 58 (1), pp. 257-269. <10.1109/TEMC.2015.2486041>. <hal-01225324>
  • Bertrand Souweine, Alexandre Lautrette, Didier Gruson, Emmanuel Canet, Kada Klouche, et al.. Ethanol Lock and Risk of Hemodialysis Catheter Infection in Critically Ill Patients. A Randomized Controlled Trial. American Journal of Respiratory and Critical Care Medicine, American Thoracic Society, 2015, 191 (9), pp.1024 - 1032. <10.1164/rccm.201408-1431OC>. <hal-01394021>
  • He Huang, Alexandre Boyer, Sonia Ben Dhia. Electronic counterfeit detection based on the measurement of electromagnetic fingerprint. Microelectronics Reliability, Elsevier, 2015, 55 (9-10), pp.2050-2054. <10.1016/j.microrel.2015.07.008>. <hal-01225338>
  • He Huang, Alexandre Boyer, Sonia Ben Dhia. Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC–DC converter. Microelectronics Reliability, Elsevier, 2015, 55 (9-10), pp. 2061-2066. <10.1016/j.microrel.2015.06.058>. <hal-01225333>
  • André Durier, A. Bensoussan, Moustafa Zerarka, C Ghfiri, Alexandre Boyer, et al.. A methodologic project to characterize and model COTS component reliability.. Microelectronics Reliability, Elsevier, 2015, 55 (9-10), pp. 2097-2102. <hal-01257925>
  • Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Nestor Berbel, Raul Fernandez-Garcia. Experimental Investigations into the Effects of Electrical Stress on Electromagnetic Emission from Integrated Circuits. IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2014, 56 (1), pp. 44-50. <10.1109/TEMC.2013.2272195>. <hal-00937775>
  • Jianfei Wu, Alexandre Boyer, Jiancheng Li, Bertrand Vrignon, Etienne Sicard, et al.. Modeling and Simulation of LDO Voltage Regulator Susceptibility to Conducted EMI. IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2014, 56 (3), pp.726-735. <10.1109/TEMC.2013.2294951>. <hal-01159232>
  • Alexandre Boyer, Sonia Ben Dhia. Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits. Journal of Low Power Electronics, American Scientific Publishers, 2014, 10 (1), pp.165-172. <hal-00938358>
  • A.-G. Venier, C. Leroyer, C. Slekovec, D. Talon, X. Bertrand, et al.. Risk factors for Pseudomonas aeruginosa acquisition in intensive care units: a prospective multicentre study.. J Hosp Infect, 2014, epub ahead of print. <10.1016/j.jhin.2014.06.018>. <hal-01061604>
  • José Medrano, Alejando Álvaro-Meca, Alexandre Boyer, Maria Jiménez-Sousa, Salvador Resino. Mortality of patients infected with HIV in the intensive care unit (2005 through 2010): significant role of chronic hepatitis C and severe sepsis. Critical Care, BioMed Central, 2014, 348, pp.1546. <10.1186/s13054-014-0475-3>. <inserm-01097959>
  • Damien Roux, Jean Reignier, Guillaume Thiery, Alexandre Boyer, Jan Hayon, et al.. Acquiring procedural skills in ICUs: a prospective multicenter study*.. Critical Care Medicine, Lippincott, Williams & Wilkins, 2014, 42 (4), pp.886-95. <10.1097/CCM.0000000000000049>. <hal-01053800>
  • Jianfei Wu, Alexandre Boyer, Jiancheng Li, Sonia Ben Dhia, Rongjun Shen. Characterization of Changes in LDO Susceptibility after Electrical Stress. IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2013, 55 (5), pp.883-890. <10.1109/TEMC.2013.2242471>. <hal-00937780>
  • A. Ishmukhametova, Jm Chen, R. Bernard, B. De Massy, F. Baudat, et al.. Dissecting the Structure and Mechanism of a Complex Duplication-Triplication Rearrangement in the DMD Gene. Hum Mutat, 2013, 34 (8), pp.1080-1084. <hal-00852768>
  • Sonia Ben Dhia, Alexandre Boyer. Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project. Microelectronics Reliability, Elsevier, 2013, 53, pp.1266-1272. <10.1016/j.microrel.2013.08.016>. <hal-00938353>
  • Somar Kassab, Tahar Saghi, Alexandre Boyer, Marie-Edith Lafon, Didier Gruson, et al.. Fatal case of enterovirus 71 infection and rituximab therapy, france, 2012.. Emerging Infectious Diseases, Centers for Disease Control and Prevention, 2013, 19, pp.1345-7. <hal-01101199>
  • Jian-Fei Wu, Etienne Sicard, Alexandre Boyer, Sonia Ben Dhia, Jiancheng Li, et al.. Enhancing accuracy of low-dropout regulator susceptibility extraction with on-chip sensors. Electronics Letters, IET, 2012, 48 (11), pp.649-650. <10.1049/el.2012.0407>. <hal-00709287>
  • Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikael Deobarro, Dinh Than Vinh. On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations. IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 2012, 61 (3), pp.696. <10.1109/TIM.2011.2172116>. <hal-00668627>
  • Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikael Deobarro. IC immunity modeling process validation using on-chip measurements. Journal of Electronic Testing, Springer Verlag, 2012, 28 (3), pp.339-348. <10.1007/s10836-012-5294-3>. <hal-00936080>
  • Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Christophe Lemoine, Bertrand Vrignon. Prediction of Long-Term Immunity of a Phase-Locked Loop. Journal of Electronic Testing, Springer Verlag, 2012, 28 (6), pp.791-802. <10.1007/s10836-012-5335-y>. <hal-00936086>
  • Raul Fernandez-Garcia, Ignacio Gil, Alexandre Boyer, Sonia Ben Dhia, Bertrand Vrignon. A New Approach to Modeling the Impact of EMI on MOSFET DC Behavior. IEICE Transactions on Electronics, Institute of Electronics, Information and Communication Engineers, 2011, E94-C (12), pp.1906. <10.1587>. <hal-00669506>
  • A.-M. Adam, S. Deffressigne, M.-P. Koenig, M. Lasserre (dir.), Alexandre Boyer, et al.. La céramique d'habitat du Bronze final IIIb à La Tène B en Alsace et en Lorraine. Essai de typo-chronologie. Société Archéologique de l'Est, 2011, 341 p., 71 fig., 2 dépliants, tabl. <halshs-00784497>
  • Binhong Li, Nestor Berbel, Alexandre Boyer, Sonia Ben Dhia, Raul Fernandez-Garcia. Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences. Microelectronics Reliability, Elsevier, 2011, 51, pp.1557-1560. <10.1016/j.microrel.2011.06.010>. <hal-00936069>
  • Nestor Berbel, Raul Fernandez-Garcia, Ignacio Gil, Binhong Li, Alexandre Boyer, et al.. Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout. Microelectronics Reliability, Elsevier, 2011, 51 (9), pp.1564. <10.1016>. <hal-00669511>
  • Sonia Ben Dhia, Alexandre Boyer, Binhong Li, Amadou Ndoye Cisse. Characterisation of electromagnetic compatibility drifts of nanoscale integrated circuit after accelerated life tests. Electronics Letters, IET, 2010, 46 (4), p. 278-280. <10.1049/el.2010.2885>. <hal-00669745>
  • Binhong Li, Alexandre Boyer, Sonia Ben Dhia, Christophe Lemoine. Ageing effect on electromagnetic susceptibility of a phase locked loop. Microelectronics Reliability, Elsevier, 2010, 50 (9), p.1304-1308. <10.1016/j.microrel.2010.07.100>. <hal-00669515>
  • Alexandre Boyer, Amadou Ndoye Cisse, Sonia Ben Dhia, Laurent Guillot, Bertrand Vrignon. Characterization of the Evolution of IC Emissions after Accelerated Aging. IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2009, 51 (4), pp.892. <10.1109>. <hal-00669519>
  • Ali Alaeldine, Nicolas Lacrampe, Alexandre Boyer, Richard Perdriau, Fabrice Caignet, et al.. Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits. Microelectronics Journal, Elsevier, 2008, 39 (12), pp.1728-1735. <10.1016/j.mejo.2008.02.022>. <hal-00537773>
  • Alexandre Boyer, Sonia Ben Dhia, Etienne Sicard. Characterization of the Electromagnetic Susceptibility of Integrated Circuits using a Near Field Scan. Electronics Letters, IET, 2007, 43 (1), pp.15. <10.1049>. <hal-00669747>
  • Frédéric Vargas, Alexandre Boyer, Hoang Nam Bui, Louis Salmi, Didier Gruson, et al.. A postural change test improves the prediction of a radiological maxillary sinusitis by ultrasonography in mechanically ventilated patients.. Intensive Care Medicine, Springer Verlag, 2007, 33 (8), pp.1474-8. <10.1007/s00134-007-0726-8>. <inserm-00168571>
  • A. Giani, F. Mailly, M. Al Khalfioui, A. Foucaran, Alexandre Boyer. Micromachined thermal inclinometer based on flash evaporated Bi0.5Sb1.5Te3(p)/ Bi2Se0.3Te2.7(n) thermocouples. Materials Science and Engineering B: Solid-State Materials for Advanced Technology, Elsevier, 2004, 107 (1), pp.94-98. <hal-00329982>
  • R. Ondo Ndong, A. Giani, F. Pascal-Delannoy, A. Foucaran, Alexandre Boyer. Electrical properties of zinc oxide sputtered thin films. Microelectronics Journal, Elsevier, 2003, 34 (11), pp.1087-1092. <hal-00328118>
  • F. Mailly, A. Giani, A. Martinez, R. Bonnot, Pierre Temple-Boyer, et al.. Micromachined thermal accelerometer. Sensors and Actuators, Elsevier, 2003, 103 (3), pp.359-363. <hal-00327192>
  • R. Ondo Ndong, F. Pascal-Delannoy, Alexandre Boyer, A. Giani, A. Foucaran. Structural properties of zinc oxide thin films prepared by r.f. magnetron sputtering. Materials Science and Engineering B: Solid-State Materials for Advanced Technology, Elsevier, 2003, 97 (1), pp.68-73. <hal-00327986>
  • G. Ferblantier, B. Sorli, F. Pascal-Delannoy, Alexandre Boyer. Feasability of a new sensor for water activity determination. Sensor Review, Emerald, 2003, 23 (4), pp.316 - 322. <hal-00327205>
  • M. Al Khalfioui, A. Michez, A. Giani, Alexandre Boyer, A. Foucaran. Anemometer based on Seebeck effect. Sensors and Actuators A: Physical , Elsevier, 2003, 107 (1), pp.36-41. <hal-00327503>
  • R. Ondo Ndong, G. Ferblantier, M. Al Khalfioui, Alexandre Boyer, A. Foucaran. Properties of RF magnetron sputtered zinc oxide thin films. Journal of Crystal Growth, Elsevier, 2003, 255 (1-2), pp.130-135. <hal-00328057>
  • A. Al Bayaz, A. Giani, M. Al Khalfioui, A. Foucaran, F. Pascal-Delannoy, et al.. Growth parameters effect on thermoelectric characteristics of Bi2Se3 thin films grown by MOCVD system using Ditertiarybutylselenide as a precursor. Journal of Crystal Growth, Elsevier, 2003, 258, pp.135-140. <hal-00327154>
  • A. Al Bayaz, A. Giani, A. Foucaran, F. Pascal-Delannoy, Alexandre Boyer. Electrical and thermoelectrical properties of Bi2Se3 grown by metal organic chemical vapour deposition technique. Thin Solid Films, Elsevier, 2003, 441 (1-2), pp.1-5. <hal-00327161>
  • B. Sorli, F. Pascal-Delannoy, A. Giani, A. Foucaran, Alexandre Boyer. Fast humidity sensor for high range 80-95% RH. Sensors and Actuators, Elsevier, 2002, A 100, pp.24-31. <hal-00324044>
  • A. Giani, A. Al Bayaz, A. Boulouz, F. Pascal-Delannoy, A. Foucaran, et al.. Thermoelectric microsensor for pressure and gas concentration measurement. Materials Science and Engineering, Elsevier, 2002, B95, pp.268-274. <hal-00323831>
  • A. Al Bayaz, A. Giani, F. Foucaran, F. Pascal-Delannoy, Alexandre Boyer. Elaboration and characterisation of Bi2Se3 thin films grown by MOCVD.. Journal of Crystal, 2002, 243, pp.444-449. <hal-00324039>
  • A. Al Bayaz, A. Giani, M.C Artaud-Gillet, A. Foucaran, F. Pascal-Delannoy, et al.. Growth parameters effect on the electric and thermoelectric characteristics of Bi2Se3 thin films using ditertiarybutylselenide as precursor by MOCVD system.. Journal of Crystal Growth, Elsevier, 2002, 241, pp.463-470. <hal-00324041>
  • B. Sorli, F. Pascal-Delannoy, A. Foucaran, A. Giani, Alexandre Boyer. Thermal sensor using the differential thermal analysis for the detection of relative humidity. Sensor Review, Emerald, 2001, 21 (2), pp.133-139. <hal-00323753>
  • Frédérick Mailly, Alain Giani, R. Bonnot, F. Delannoy, Alain Foucaran, et al.. Anemometer with hot platinum thin film. Sensors and Actuators A: Physical , Elsevier, 2001, 94 (1-2), pp.32-38. <10.1016/S0924-4247(01)00668-9>. <hal-00323760>
  • A. Boulouz, S. Chakraborty, A. Giani, F. Pascal-Delannoy, Alexandre Boyer, et al.. Transport properties of V-VI semiconducting thermoelectric BiSbTe alloy thin films and their application to micro-module Peltier. Journal of Applied Physics, American Institute of Physics, 2001, 89 (9), pp.5009-5014. <10.1063/1.1360701>. <hal-00322071>
  • F. Tcheliebou, Alexandre Boyer, E. Charles. Physical properties of MgO partially stabilized ZrO2 films deposited by coevaporation. Journal de Physique IV Colloque, 1993, 03 (C7), pp.C7-1449-C7-1453. <10.1051/jp4:19937225>. <jpa-00251861>
  • F. Tcheliebou, Alexandre Boyer, J. Cheron. Propriétés des couches de ZrO2 et de HfO2 obtenues par évaporation thermique réactive. Journal de Physique IV Colloque, 1993, 03 (C7), pp.C7-1003-C7-1006. <10.1051/jp4:19937156>. <jpa-00251779>
  • N. Mei, Régine Jeanningros, Alexandre Boyer. Rôle des glucorécepteurs vagaux de l'intestin dans la régulation de l'insulinémie. Reproduction Nutrition Développement, 1980, 20 (5B), pp.1621-1624. <hal-00897760>
  • J.M. Peransin, J.F. Bresse, J. Michel, Alexandre Boyer, E. Groubert. Effect of contact alloying behaviour on the electrical characteristic of GaxIn1-xSb diodes with gold coating. Revue de Physique Appliquee, 1978, 13 (12), pp.645-649. <10.1051/rphysap:019780013012064500>. <jpa-00244519>
  • J. Phalippou, Alexandre Boyer, E. Groubert, J. Zarzycki. Étude du frottement intérieur des borates et phosphoaluminates vitreux par la méthode d'écho d'impulsion (pulse-echo). Revue de Physique Appliquee, 1975, 10 (6), pp.437-442. <10.1051/rphysap:01975001006043700>. <jpa-00243943>

Communication dans un congrès46 documents

  • Chaimae Ghfiri, Alexandre Boyer, Andre Durier, Sonia Ben Dhia. Methodology of modeling of the internal activity of a FPGA for conducted emission prediction purpose. Congrès de l'école doctorale GEET, Mar 2017, Toulouse, France. 6p., 2017. <hal-01500303>
  • Alexandre Boyer. Improving spatial resolution of immunity maps by post-processing. 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC2016), May 2016, Shenzhen, China. pp.56 - 59, 2016, Electromagnetic Compatibility (APEMC), 2016 Asia-Pacific International Symposium on. <10.1109/APEMC.2016.7522794>. <hal-01403868>
  • Chaimae Ghfiri, André Durier, Alexandre Boyer, Sonia Ben Dhia, Christian Marot. Construction of an Integrated Circuit Emission Model of a FPGA. 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC2016), May 2016, Shenzhen, China. 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), pp.402-405, 2016, <10.1109/APEMC.2016.7522751>. <hal-01403872>
  • Andre Durier, Alexandre Boyer, Geneviève Duchamp. A methodologic project to characterize and model COTS components EMC behavior after ageing. 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC2016), May 2016, Shenzhen, China. pp.376 - 379, 2016, Electromagnetic Compatibility (APEMC), 2016 Asia-Pacific International Symposium on. <10.1109/APEMC.2016.7522742>. <hal-01403877>
  • C Ghfiri, Alexandre Boyer, André Durier, Sonia Ben Dhia, C Marot. CONSTRUCTION D'UN MODELE ICEM POUR PREDIRE L'EMISSION ELECTROMAGNETIQUE D'UN FPGA. 18e Colloque International et Exposition sur la Compatibilité Electromagnétique (CEM2016), Jul 2016, Rennes, France. 5p., 2016. <hal-01403883>
  • Alexandre Boyer. AMELIORATION DE LA RESOLUTION SPATIALE DE SCAN CHAMP PROCHE EN INJECTION. 18e Colloque International et Exposition sur la Compatibilité Electromagnétique CEM2016, Jul 2016, Rennes, France. <hal-01403886>
  • Alexandre Boyer, B Vrignon, Manuel Cavarroc, J Shepherd. Near-Field Injection At Die Level. Asia-Pacific International EMC Symposium 2015, May 2015, Taipei, Taiwan. <hal-01159220>
  • Alexandre Boyer, Manuel Cavarroc. Enhancement of the Spatial Resolution of Near-Field Immunity Maps. 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. Proceedings of EMC Compo 2015, 6p., 2015. <hal-01225356>
  • Veljko Tomasevic, Alexandre Boyer, Sonia Ben Dhia. Development of an On-Chip Sensor for Substrate Coupling Study in Smart Power Mixed ICs. Asia-Pacific International EMC Symposium 2015, May 2015, Taipei, Taiwan. 4p. <hal-01159221>
  • He Huang, Alexandre Boyer, Sonia Ben Dhia, Bertrand Vrignon. Prediction of Aging Impact on Electromagnetic Susceptibility of an Operational Amplifier. Asia-Pacific International EMC Symposium 2015, May 2015, Taipei, Taiwan. 4p. <hal-01159222>
  • Alexandre Boyer, Sonia Ben Dhia. Long-term Electromagnetic Robustness of Integrated Circuits, Challenge and Trends. Minapad Forum 2015, Apr 2015, Grenoble, France. 6p., 2015. <hal-01159227>
  • Veljko Tomasevic, Alexandre Boyer, Sonia Ben Dhia, Alexander Steinmar, Weiss B., et al.. Coupling study in smart power mixed ICs with a dedicated on-chip sensor. EMC Europe 2015, Aug 2015, Dresden, Germany. Proceedings of EMC Europe 2015, 2015, <10.1109/ISEMC.2015.7256236>. <hal-01225345>
  • He Huang, Alexandre Boyer, Sonia Ben Dhia. Electronic counterfeit detection based on the measurement of electromagnetic fingerprint Electronic counterfeit detection based on the measurement of electromagnetic fingerprint. 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2015), Oct 2015, Toulouse, France. <hal-01225354>
  • Veljko Tomasevic, Alexandre Boyer, Sonia Ben Dhia. Bandgap Failure Study Due To Parasitic Bipolar Substrate Coupling In Smart Power Mixed ICs. 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. Proceedings of EMC Compo 2015, 5p. <hal-01225358>
  • Etienne Sicard, Alexandre Boyer, Priscillia Fernandez-Lopez, An Zhou, Nicolas Marier, et al.. EMC performance analysis of a Processor/Memory System using PCB and Package-On-Package. 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. Proceedings of EMC Compo 2015, 6p., 2015. <hal-01225364>
  • Etienne Sicard, Alexandre Boyer. EMC modeling of Integrated Circuits using IC-EMC. 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. Proceedings of EMC Compo 2015, 2p. <hal-01225370>
  • Alexandre Boyer, He Huang, Sonia Ben Dhia. ANALYSIS AND MODELING OF PASSIVE DEVICE DEGRADATION FOR THE LONG-TERM ELECTROMAGNETIC EMISSION PREDICTION OF A DC-DC CONVERTER. 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. <hal-01225377>
  • He Huang, Alexandre Boyer, Sonia Ben Dhia. Passive device degradation models for a electromagnetic emission robustness study of a buck DC-DC converter. EMC Europe 2015, Aug 2015, Dresden, Germany. 6p., 2015. <hal-01225350>
  • He Huang, Alexandre Boyer, Sonia Ben Dhia. Analysis and Modelling of Passive device degradation for a long-term electromagnetic emission study of a DC-DC converter. 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2015), Oct 2015, Toulouse, France. <hal-01225352>
  • Abhishek Ramanujan, Etienne Sicard, Alexandre Boyer, Jean-Luc Levant, Christian Marot, et al.. Developing a Universal Exchange Format for Integrated Circuit Emission Model – Conducted Emissions. 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. Proceedings of EMC Compo 2015, 6p., 2015. <hal-01225367>
  • Laurent Chusseau, Rachid Omarouayache, Jeremy Raoult, Sylvie Jarrix, Philippe Maurine, et al.. Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI). VLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2014, Playa del Carmen, Mexico. 22nd International Conference on Very Large Scale Integration, pp.1-6, 2014, <10.1109/VLSI-SoC.2014.7004189>. <lirmm-01434592>
  • Sonia Ben Dhia, Alexandre Boyer. Design of on-chip sensors to monitor electromagnetic activity in ICs: Towards on-line diagnosis and self-healing. Test Workshop - LATW, 2014 15th Latin American, Mar 2014, Fortaleza, Brazil. pp.1-6, 2014. <hal-01017384>
  • Alexandre Boyer, Bertrand Vrignon, John Shepherd, Manuel Cavarroc. Evaluation of the Near-Field Injection Method at Integrated Circuit Level. EMC Europe 2014, Sep 2014, Goteborg, Sweden. pp.1-6, 2014. <hal-01068126>
  • Clément Crémoux, Alexandre Boyer, Karim Ben Dhia. Reliability of active RFID tag immersed in water for anti-kidnapping applications. 2014 IEEE-APS Topical Conference on Antennas and Propagation in Wireless Communications (APWC), Aug 2014, Aruba, Aruba. pp.40-43, 2014. <hal-01068122>
  • He Huang, Alexandre Boyer, Sonia Ben Dhia, Bertrand Vrignon. Susceptibility Analysis of an Operational Amplifier Using On-Chip Measurement. EMC Europe 2014, Sep 2014, Goteborg, Sweden. pp.1-5, 2014. <hal-01068127>
  • He Huang, Alexandre Boyer, Sonia Ben Dhia. The detection of counterfeit integrated circuit by the use of electromagnetic fingerprint. EMC Europe 2014, Sep 2014, Gothenburg, Sweden. pp.1-5, 2014. <hal-01068129>
  • He Huang, Alexandre Boyer, Sonia Ben Dhia. IMPACT DU VIEILLISSEMENT THERMIQUE SUR L'EMISSION D'UN CONVERTISSEUR BUCK. 17ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2014), Jul 2014, Clermont-Ferrand, France. pp.1-5, 2014. <hal-01068132>
  • Alexandre Boyer, He Huang, Sonia Ben Dhia. Impact of thermal aging on emission of a buck DC-DC converter. 2014 International Symposium on Electromagnetic Compatibility, Tokyo (EMC'14/Tokyo), May 2014, Tokyo, Japan. pp.77-80, 2014. <hal-01006115>
  • Veljko Tomasevic, Alexandre Boyer, Sonia Ben Dhia. DEVELOPPEMENT D'UN CAPTEUR SUR PUCE AFIN D'ETUDIER LE COUPLAGE PARASITE DANS LES CIRCUITS INTEGRES DE TYPE " SMART POWER ". 17ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2014), Jul 2014, Clermont-Ferrand, France. pp.1-5, 2014. <hal-01068133v2>
  • Yasser Moursy, Sahar Afara, Pietro Buccella, Camillo Stefanucci, Ramy Iskander, et al.. AUTOMICS: A novel approach for substrate modeling for Automotive applications. 18th IEEE European Test Symposium, May 2013, Avignon, France. 2013. <hal-01078755>
  • Alexandre Boyer, Sonia Ben Dhia. Effect of Electrical Stresses on Digital Integrated Circuits Power Integrity. 2013 17th IEEE Workshop on Signal and Power Integrity (SPI), May 2013, Paris, France. pp.1-4, 2013. <hal-01006121>
  • Jian-Fei Wu, Jiancheng Li, Rongjun Shen, Alexandre Boyer, Sonia Ben Dhia. Effect of Electrical Stresses on the Susceptibility of a Voltage regulator. EMC Symposium in Europe 2013 (EMC Europe 2013), Sep 2013, Bruges, Belgium. pp.113, 2013. <hal-01006119>
  • Alexandre Boyer, Sonia Ben Dhia. Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission. 2013 9th Intl Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2013), Dec 2013, Nara, Japan. pp.190-195, 2013, <10.1109/EMCCompo.2013.6735199>. <hal-00945301>
  • Sonia Ben Dhia, Alexandre Boyer. Electro-magnetic robustness of integrated circuits: from statement to prediction. 2013 9th Intl Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2013), Dec 2013, Nara, Japan. pp.208 - 213, 2013, <10.1109/EMCCompo.2013.6735202>. <hal-00945302>
  • D. Lofficial, Alexandre Boyer, A. Fecant, D. Uzio, E. Puzenat. Photocatalytic properties of In203 and In2S3 for hydrogen production and CO2 reduction. SPASEC-17:Semiconductor Photocatalysis and Solar, Nov 2012, Jacsonville, Floride, United States. <hal-00752564>
  • Nestor Berbel, Raul Fernandez-Garcia, Ignacio Gil, Binhong Li, Sonia Ben Dhia, et al.. An alternative approach to model the Internal Activity of integrated circuits. 8th Workshop on Electromagnetic Compatibility of Integrated Circuits, Nov 2011, Dubrovnik, Croatia. pp.88, 2011. <hal-00669719>
  • Alexandre Boyer, Sonia Ben Dhia, Christophe Lemoine, Bertrand Vrignon. An On-Chip Sensor for Time Domain Characterization of Electromagnetic Interferences. 8th Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo), Nov 2011, Dubrovnik, Croatia. pp.251, 2011. <hal-00669533>
  • Alexandre Boyer, Sonia Ben Dhia, Christophe Lemoine, Bertrand Vrignon. Construction and Evaluation of the Susceptibility Model of an Integrated Phase-Locked Loop. 8th Workshop on Electromagnetic Compatibility of Itnegrated Circuits, Nov 2011, Dubrovnik, Croatia. pp.7, 2011. <hal-00669716>
  • Binhong Li, Nestor Berbel, Alexandre Boyer, Sonia Ben Dhia, Raul Fernandez-Garcia. Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences. European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2011), Oct 2011, Bordeaux, France. pp.1557, 2011. <hal-00669726>
  • Etienne Sicard, Alexandre Boyer. Enhancing Engineers Skills in EMC of Integrated Circuits. 8th Workshop on Electromagnetic Compatibility of Integrated Circuits, Nov 2011, Dubrovnik, Croatia. pp.115, 2011. <hal-00669721>
  • Ali Alaeldine, Alexandre Boyer, Richard Perdriau, Mohamed Ramdani, Etienne Sicard, et al.. A Near-Field Injection Model Including Power Losses for Susceptibility Prediction in Integrated Circuits. 5 èmes JFMMA and TELECOM 2007, Mar 2007, Fès, Morocco. 2007. <hal-00239426>
  • Ali Alaeldine, Alexandre Boyer, Richard Perdriau, Mohamed Ramdani, Etienne Sicard. A Near-Field Injection Model for Susceptibility Prediction in Integrated Circuits. ICONIC 2007, Jun 2007, Saint-Louis, United States. 2007. <hal-00239422>
  • Ghislain Bouesse, N. Ninon, G. Sicard, Marc Renaudin, Alexandre Boyer, et al.. Asynchronous logic Vs Synchronouos logic: Concrete results on electromagnetic emissions and conducted susceptibility. 6th International workshop on electromagnetic compatibility of integrated circuits (EMC Compo'07), Nov 2007, Torino, Italy. pp.99-102, 2007. <hal-00222916>
  • Ali Alaeldine, Alexandre Boyer, Richard Perdriau, Mohamed Ramdani, Etienne Sicard, et al.. Near Field Injection Model Including Power Losses for Susceptibility Prediction in ICs. EMC Europe Workshop 2007, Jun 2007, Paris, France. 2007. <hal-00239430>
  • Anne-Marie Adam, Hélène Delnef, Alexandre Boyer. Britzgyberg-Illfurth (Haut-Rhin) : bref aperçu de l'évolution céramique à partir d'une relecture des fouilles anciennes. B.CHAUME. Colloque international de Dijon, 2006, Dijon, France. pp.297-311, 2009. <halshs-00595417>
  • Michaël Landolt, Sylvie Deffressigne, Marie-Pierre Koenig, Muriel Roth-Zehner, Anne-Marie Adam, et al.. Quelques ensembles céramiques d'Alsace et de Lorraine, du Hallstatt D1 à La Tène A : première synthèse typo-chronologique. Quelques ensembles céramiques d'Alsace et de Lorraine, du Hallstatt D1 à La Tène A : première synthèse typo-chronologique, 2006, Dijon, France. pp.249-295, 2009. <halshs-00611635>

Ouvrage (y compris édition critique et traduction)3 documents

  • Anne-Marie Adam, Sylvie Deffressigne, M.P. Koenig, Marina Lasserre, Alexandre Boyer, et al.. La céramique d'habitat du Bronze final IIIb à La Tène B en Alsace et en Lorraine : essai de typo-chronologie, Dijon : Société Archéologique de l'Est, 2011.. Société Archéologique de l'Est, pp.339, 2011. <halshs-00610972>
  • Anne-Marie Adam, Sylvie Deffressigne, Marie-Pierre Koenig, Marina Lasserre, Alexandre Boyer, et al.. La céramique d'habitat du Bronze final IIIb à La Tène B en Alsace et en Lorraine : essai de typo-chronologie. Société Archéologique de l'Est, pp.339, 2011, ADAM (A.-M.) DEFFRESSIGNE (S.) KOENIG (M.-P.) LASSERRE (M.). <halshs-00600506>
  • Etienne Sicard, Alexandre Boyer. IC-EMC User's Manual Version 2.0. INSA Toulouse France. INSA Toulouse France, pp.310, 2009, <10.ISBN.978.2.87649.056.7>. <hal-00511214>

Autre publication1 document

  • J.  Youssef, O.  Guisset, F.  Camou, C.  Paroissin, M.  Grenouillet-Delacre, et al.. Decrease of circulating dendritic cells in shock: a severe sepsis marker. AFF. 2010. <hal-00868494>

Rapport1 document

  • Rodolphe Le Riche, Alexandre Boyer, Gustavo Silva, Joël Monnatte, Jérôme Molimard. Préconception d'arcs à relâchement d'effort. 2008. <emse-00687638>

Brevet1 document

  • P. Rudent, Alexandre Boyer, A. Giani. Manufacturing method for microthermocouple sensor for a mass flow meter and associated device. Patent n° : EP0927874. 1999. <hal-00327818>

Direction d'ouvrage, Proceedings1 document

  • I. Barth, C. Falcoz, P. Levet, J. Laufer, S. Landireux, et al.. Le Management de la Diversité - Enjeux, fondement et pratiques.. L Harmattan, 310 p., 2007. <halshs-00187090>