Nombre de documents

6

CV de Alexandra Junay


Article dans une revue1 document

  • Alexandra Junay, Sophie Guézo, Pascal Turban, Sylvain Tricot, Arnaud Le Pottier, et al.. Effective Metal Top Contact on the Organic Layer via Buffer-Layer-Assisted Growth: A Multiscale Characterization of Au/Hexadecanethiol/n-GaAs(100) Junctions. Journal of Physical Chemistry C, 2016, 120, pp.24056--24062. <10.1021/acs.jpcc.6b05729>. <hal-01416360>

Communication dans un congrès5 documents

  • Alexandra Junay, Sophie Guézo, Francine Solal, Pascal Turban, Gabriel Delhaye, et al.. Au/Alkanethiols/GaAs(001) : Growth, homogeneity and electronic properties at the nanoscale. Journées Surfaces et Interfaces (JSI-2015), Jan 2015, Toulouse, France. <hal-01126338>
  • Alexandra Junay, Sophie Guézo, Francine Solal, Pascal Turban, Gabriel Delhaye, et al.. STM/BEEM : Probing electron transport through buried interfaces of hybrid heterostructures with a nanometer scale resolution. 7th International Conference on Molecular Electronics (ElecMol), Aug 2014, Strasbourg, France. <hal-01125832>
  • Alexandra Junay, Sophie Guézo, Francine Solal, Soraya Ababou-Girard, Pascal Turban, et al.. Using BEEM (Ballistic Electron Emission Microscopy) to probe buried interfaces in metal-organic monolayer-semiconductorhybrid heterostructures. Journées Nanosciences et Nanotechnologies du Nord Ouest, Nov 2013, Rennes, France. <hal-01126579>
  • Sophie Guézo, Alexandra Junay, Francine Solal, Soraya Ababou-Girard, Gabriel Delhaye, et al.. Ballistic Electron Emission Microscopy (BEEM): local probe of electronic properties at buried interfaces. 3rd Molecular Materials Meeting (International Conference), Jan 2013, Singapour, Singapore. <hal-00880013>
  • Alexandra Junay, Sophie Guézo, Francine Solal, Soraya Ababou-Girard, Pascal Turban, et al.. Using BEEM (Ballistic Electron Emission Microscopy) to probe buried interfaces in metal-organic monolayer-semiconductor hybrid heterostructures. International Conference on Nanoscience and Technology (ICN+T 2013), Sep 2013, Paris, France. <hal-00881462>