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345 résultats
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LIFTING: an Open-Source Logic SimulatorDATE 2009 - Design, Automation and Test in Europe Conference and Exhibition, Apr 2009, Nice, France
Communication dans un congrès
lirmm-00407166v1
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Multi-Objective Application-driven Approximate Design MethodIEEE Access, 2021, 9, pp.86975-86993. ⟨10.1109/ACCESS.2021.3087858⟩
Article dans une revue
hal-03257706v1
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Learning-Based Cell-Aware Defect Diagnosis of Customer ReturnsETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia. pp.1-2, ⟨10.1109/ETS48528.2020.9131601⟩
Communication dans un congrès
lirmm-03035669v1
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Hitless memory-reconfigurable photonic reservoir computing architecture2022
Pré-publication, Document de travail
hal-03754449v1
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Guest Editorial: Computation-In-Memory (CIM): from Device to ApplicationsACM Journal on Emerging Technologies in Computing Systems, 2021, 18 (2), pp.1-3. ⟨10.1145/3503263⟩
Article dans une revue
hal-04139263v1
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A Modular Memory BIST for Optimized Memory RepairIEEE Computer Society. IOLTS: International On-Line Testing Symposium, Jul 2008, Rhodes, Greece. 14th International On-Line Testing and Robust System Design Symposium, pp.171-172, 2008, ⟨10.1109/IOLTS.2008.30⟩
Poster de conférence
lirmm-00363724v1
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Editorial: Special issue on Advancing on Approximate Computing: Methodologies, Architectures and AlgorithmsFuture Generation Computer Systems, 2021, 124, pp.54-55. ⟨10.1016/j.future.2021.05.027⟩
Article dans une revue
hal-03266799v1
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Design Space Exploration of Approximation-Based Quadruple Modular Redundancy Circuits2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD), Nov 2021, Munich, Germany. pp.1-9, ⟨10.1109/ICCAD51958.2021.9643561⟩
Communication dans un congrès
hal-03537351v2
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Protecting combinational logic in pipelined microprocessor cores against transient and permanent faultsDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.223-225, ⟨10.1109/DDECS.2014.6868794⟩
Communication dans un congrès
lirmm-01248598v1
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Optimized March Test Flow for Detecting Memory Faults in SRAM Devices Under Bit Line CouplingDDECS'11: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits ans Systems, Netherlands. pp.353-358
Communication dans un congrès
lirmm-00592182v1
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Improving Defect Localization Accuracy by means of Effect-Cause Intra-Cell Diagnosis at Transistor LevelSDD: Silicon Debug and Diagnosis, Sep 2013, Anaheim, CA, United States
Communication dans un congrès
lirmm-00806872v1
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Test des Mémoires FLASH NANDColloque GDR SoC-SiP, France. 2009
Poster de conférence
lirmm-00433770v1
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Power-Aware Test Pattern Generation for At-Speed LOS TestingATS: Asian Test Symposium, Nov 2011, New Delhi, India. pp.506-510
Communication dans un congrès
lirmm-00651917v1
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Adaptive Voltage Scaling via Effective On-Chip Timing Uncertainty MeasurementsColloque GDR SoC-SiP, 2012, Paris, France
Communication dans un congrès
lirmm-00806859v1
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Power Supply Noise and Ground Bounce Aware Pattern Generation for Delay TestingNEWCAS: International New Circuits and Systems Conference, Jun 2011, Bordeaux, France. pp.73-76, ⟨10.1109/NEWCAS.2011.5981222⟩
Communication dans un congrès
lirmm-00647815v1
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A Study of Path Delay Variations in the Presence of Uncorrelated Power and Ground Supply NoiseDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2011, Cottbus, Germany. pp.189-194, ⟨10.1109/DDECS.2011.5783078⟩
Communication dans un congrès
lirmm-00592000v1
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Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural NetworksLATS 2021 - IEEE 22nd Latin American Test Symposium, Oct 2021, Punta del Este, Uruguay. pp.1-5, ⟨10.1109/LATS53581.2021.9651807⟩
Communication dans un congrès
lirmm-03435567v1
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Setting Test Conditions for Detecting Faults Induced by Random Dopant Fluctuation in SRAM Core-CellsVARI: Workshop on CMOS Variability, 2010, Montpellier, France
Communication dans un congrès
lirmm-00553626v1
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Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failuresDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Mar 2013, Abu Dhabi, United Arab Emirates. pp.39-44, ⟨10.1109/DTIS.2013.6527775⟩
Communication dans un congrès
lirmm-01248603v1
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SEU Monitoring in Mixed-Field Radiation Environments of Particle AcceleratorsRADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937419⟩
Communication dans un congrès
lirmm-00839085v1
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Worst-Case Power Supply Noise and Temperature Distribution Analysis for 3D PDNs with Multiple Clock DomainsNEWCAS: New Circuits and Systems, Jun 2013, Paris, France. ⟨10.1109/NEWCAS.2013.6573628⟩
Communication dans un congrès
lirmm-00839042v1
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Evaluation of Test Algorithms Stress Effect on SRAMs under Neutron RadiationIOLTS: International On-Line Testing Symposium, Jun 2012, Sitges, Spain. pp.212-222, ⟨10.1109/IOLTS.2012.6313853⟩
Communication dans un congrès
lirmm-00805373v1
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On Using Address Scrambling to Implement Defect Tolerance in SRAMsITC'2011: International Test Conference, Sep 2011, Anaheim, CA, United States. pp.N/A
Communication dans un congrès
lirmm-00647773v1
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Using TMR Architectures for SoC Yield ImprovementVALID'09: The First International Conference on Advances in System Testing and Validation Lifecycle, 2009, Porto, Portugal. pp.155-160
Communication dans un congrès
lirmm-00406967v1
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Rapport Technique de fin d'année, Contrat TOETS CT 302, Programme CEE CATRENE2011
Autre publication scientifique
lirmm-00679022v1
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Exploiting Approximate Computing to Increase System Lifetime2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC), Oct 2019, Cuzco, Peru. pp.311-316, ⟨10.1109/VLSI-SoC.2019.8920315⟩
Communication dans un congrès
hal-03777619v1
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How novel technologies can boost neuromorphic computing? A view from European project consortia (Invited)Workshop NEUROTECH, 2021
Autre publication scientifique
hal-03408059v1
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Fault injection tools based on Virtual MachinesReCoSoC: Reconfigurable and Communication-Centric Systems-on-Chip, May 2014, Montpellier, France. ⟨10.1109/ReCoSoC.2014.6861351⟩
Communication dans un congrès
hal-01075479v1
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Multiple Cell Upset Classification in Commercial SRAMsIEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1747-1754. ⟨10.1109/TNS.2014.2313742⟩
Article dans une revue
lirmm-01234446v1
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Silicon Systems for Wireless LANWorld Scientific, 2020, ⟨10.1142/11564⟩
Ouvrages
hal-03111194v1
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