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		Dark-field electron holography as a recording of crystal diffraction in real space: a comparative study with high-resolution X-ray diffraction for strain analysis of MOSFETs Victor Boureau , Aurèle Durand , Patrice Gergaud , Delphine Le Cunff , Matthew Wormington , et al. Journal of Applied Crystallography, 2020, 53 (4), pp.885-895. ⟨10.1107/S1600576720006020⟩ Article dans une revue hal-03001931v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Strain evolution of SiGe-on-insulator obtained by the Ge-condensation technique Victor Boureau , Shay Reboh , Daniel Benoit , Martin Hÿtch , Alain Claverie APL Materials, 2019, 7 (4), pp.041120. ⟨10.1063/1.5088441⟩ Article dans une revue hal-03015401v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Déformations introduites lors de la fabrication de transistors FDSOI : une contribution de l'holographie électronique en champ sombre Victor Boureau Physique [physics]. Université de Toulouse III - Paul Sabatier, 2016. Français. ⟨NNT : ⟩ Thèse tel-01786799v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Germanium condensation for co-integration: Strain study by dark-field electron holography Victor Boureau , Daniel Benoit , Bénédicte Warot-Fonrose , Martin Hÿtch , Alain Claverie Nanotechnology Materials and Devices Conference (NMDC), 2014 IEEE 9th, 2014, Unknown, Unknown Region. pp.34-36, ⟨10.1109/NMDC.2014.6997415⟩ Communication dans un congrès hal-01719498v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Strain/composition interplay in thin SiGe layers on insulator processed by Ge condensation Victor Boureau , Daniel Benoit , Bénédicte Warot-Fonrose , Martin Hÿtch , Alain Claverie Materials Science in Semiconductor Processing, 2016, 42, pp.251 - 254. ⟨10.1016/j.mssp.2015.07.034⟩ Article dans une revue hal-01707172v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		High-sensitivity mapping of magnetic induction fields with nanometer-scale resolution: comparison of off-axis electron holography and pixelated differential phase contrast Victor Boureau , Michal Staňo , Jean-Luc Rouviere , Jean-Christophe Toussaint , Olivier Fruchart , et al. Journal of Physics D: Applied Physics, 2021, 54 (8), pp.085001. ⟨10.1088/1361-6463/abc77d⟩ Article dans une revue hal-02919930v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Influence of some process steps onto the deformation of the channels of FD-SOI CMOS transistors Alain Claverie , Victor Boureau ECS Conference, 2018, Cancun, Mexico Communication dans un congrès hal-01763005v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Correlative investigation of Mg doping in GaN layers grown at different temperatures by atom probe tomography and off-axis electron holography Lynda Amichi , Isabelle Mouton , Victor Boureau , Enrico Di Russo , Philippe Vennegues , et al. Nanotechnology, 2020, 31 (4), pp.045702. ⟨10.1088/1361-6528/ab4a46⟩ Article dans une revue hal-02406102v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Combining high-resolution X-ray reciprocal space mapping and dark-field electron holography for strain analysis in 20 nm pMOS structures Aurèle Durand , Victor Boureau , Delphine Lecunff , Axel Hourtane , Daniel Benoit , et al. Nanotechnology (IEEE-NANO) 2015 IEEE 15th International Conference on, 2015, Unknown, Unknown Region. pp.785-788, ⟨10.1109/NANO.2015.7388727⟩ Communication dans un congrès hal-01719495v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Crystal growth of bullet-shaped magnetite in magnetotactic bacteria of the Nitrospirae phylum Jinhua Li , Nicolas Menguy , Christophe Gatel , Victor Boureau , Etienne Snoeck , et al. Journal of the Royal Society Interface, 2015, 12 (103), pp.20141288--20141288. ⟨10.1098/rsif.2014.1288⟩ Article dans une revue hal-01707385v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Off-axis electron holography combining summation of hologram series with double-exposure phase-shifting: Theory and application Victor Boureau , Robert Mcleod , Benjamin Mayall , David Cooper Ultramicroscopy, 2018, 193, pp.52-63 Article dans une revue hal-02057211v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		(Invited) Impact of Some Processing Steps onto the Strain Distributions in FD-SOI CMOS Planar Devices: A Contribution of Dark-Field Electron Holography Victor Boureau , Daniel Benoit , Alain Claverie ECS Transactions, 2018, 86 (10), pp.37-50 Article dans une revue hal-02057250v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Strain mapping of advanced electronic devices by TEM based methods. Alain Claverie , Victor Boureau , David N Cooper International Conference on Microscopy and 39th Annual meeting of EMSI, Jul 2018, Bhubaneswar, India Communication dans un congrès hal-01767810v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Process induced strains in FDSOI devices: a contribution of dark-field electron holography Victor Boureau , Martin Hÿtch , Benoit Daniel , Alain Claverie Micro and Nano 2015, Oct 2015, Athenes, Greece Communication dans un congrès hal-01763625v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Three-dimensional measurement of Mg dopant distribution and electrical activity in GaN by correlative atom probe tomography and off-axis electron holography Lynda Amichi , Isabelle Mouton , Enrico Di Russo , Victor Boureau , Frédéric Barbier , et al. Journal of Applied Physics, 2020, 127 (6), pp.065702. ⟨10.1063/1.5125188⟩ Article dans une revue hal-02991526v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Coupled As and Mn redox transformations in an Fe(0) electrocoagulation system: competition for reactive oxidants and sorption sites Charlotte Catrouillet , Sachiko Hirosue , Nathalie Manetti , Victor Boureau , Jasquelin Peña Environmental Science and Technology, 2020, 54, pp.7165 - 7174. ⟨10.1021/acs.est.9b07099⟩ Article dans une revue hal-03820607v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Lattice contraction due to boron doping in silicon Victor Boureau , Jean Michel Hartmann , Alain Claverie Materials Science in Semiconductor Processing, 2018, 87, pp.65-68. ⟨10.1016/j.mssp.2018.07.011⟩ Article dans une revue hal-02061809v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Strain imaging of processed layers and devices by dark field electron holography Alain Claverie , Victor Boureau , Martin Hÿtch , Nikolay Cherkashin Congress of the Electron Microscopy Society of India, Jul 2014, ??, India Communication dans un congrès hal-01763638v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Impact of Some Processing Steps onto the Strain Distributions in FD-SOI CMOS Planar Devices: A Contribution of Dark-Field Electron Holography V. Boureau , D. Benoit , Alain Claverie ECS Journal of Solid State Science and Technology, 2018, 7 (9), pp.P473-P479. ⟨10.1149/2.0161809jss⟩ Article dans une revue hal-02057241v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Direct comparison of off-axis holography and differential phase contrast for the mapping of electric fields in semiconductors by transmission electron microscopy Benedikt Haas , Jean-Luc Rouviere , Victor Boureau , Remy Berthier , David Cooper Ultramicroscopy, 2019, 198, pp.58-72. ⟨10.1016/j.ultramic.2018.12.003⟩ Article dans une revue cea-02186458v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		An electron holography study of perpendicular magnetic tunnel junctions nanostructured by deposition on pre-patterned conducting pillars V. Boureau , V. D Nguyen , Aurélien Masseboeuf , A. Palomino , E Gautier , et al. Nanoscale, 2020, 12 (33), pp.17312-17318. ⟨10.1039/D0NR03353G⟩ Article dans une revue hal-02953621v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Effect of Bias on the Response of GaN Axial p–n Junction Single-Nanowire Photodetectors Sergi Cuesta , M. Spies , V. Boureau , F. Donatini , Moïra Hocevar , et al. Nano Letters, 2019, 19 (8), pp.5506-5514. ⟨10.1021/acs.nanolett.9b02040⟩ Article dans une revue hal-02326742v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Improved measurement of electric fields by nanobeam precession electron diffraction L. Bruas , V. Boureau , A. Conlan , S. Martinie , Jean-Luc Rouviere , et al. Journal of Applied Physics, 2020, 127 (20), pp.205703. ⟨10.1063/5.0006969⟩ Article dans une revue hal-03798997v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More

Filtrer vos résultats

Dark-field electron holography as a recording of crystal diffraction in real space: a comparative study with high-resolution X-ray diffraction for strain analysis of MOSFETs

Strain evolution of SiGe-on-insulator obtained by the Ge-condensation technique

Déformations introduites lors de la fabrication de transistors FDSOI : une contribution de l'holographie électronique en champ sombre

Germanium condensation for co-integration: Strain study by dark-field electron holography

Strain/composition interplay in thin SiGe layers on insulator processed by Ge condensation

High-sensitivity mapping of magnetic induction fields with nanometer-scale resolution: comparison of off-axis electron holography and pixelated differential phase contrast

Influence of some process steps onto the deformation of the channels of FD-SOI CMOS transistors

Correlative investigation of Mg doping in GaN layers grown at different temperatures by atom probe tomography and off-axis electron holography

Combining high-resolution X-ray reciprocal space mapping and dark-field electron holography for strain analysis in 20 nm pMOS structures

Crystal growth of bullet-shaped magnetite in magnetotactic bacteria of the Nitrospirae phylum

Off-axis electron holography combining summation of hologram series with double-exposure phase-shifting: Theory and application

(Invited) Impact of Some Processing Steps onto the Strain Distributions in FD-SOI CMOS Planar Devices: A Contribution of Dark-Field Electron Holography

Strain mapping of advanced electronic devices by TEM based methods.

Process induced strains in FDSOI devices: a contribution of dark-field electron holography

Three-dimensional measurement of Mg dopant distribution and electrical activity in GaN by correlative atom probe tomography and off-axis electron holography

Coupled As and Mn redox transformations in an Fe(0) electrocoagulation system: competition for reactive oxidants and sorption sites

Lattice contraction due to boron doping in silicon

Strain imaging of processed layers and devices by dark field electron holography

Impact of Some Processing Steps onto the Strain Distributions in FD-SOI CMOS Planar Devices: A Contribution of Dark-Field Electron Holography

Direct comparison of off-axis holography and differential phase contrast for the mapping of electric fields in semiconductors by transmission electron microscopy

An electron holography study of perpendicular magnetic tunnel junctions nanostructured by deposition on pre-patterned conducting pillars

Effect of Bias on the Response of GaN Axial p–n Junction Single-Nanowire Photodetectors

Improved measurement of electric fields by nanobeam precession electron diffraction