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Dark-field electron holography as a recording of crystal diffraction in real space: a comparative study with high-resolution X-ray diffraction for strain analysis of MOSFETs
Victor Boureau
,
Aurèle Durand
,
Patrice Gergaud
,
Delphine Le Cunff
,
Matthew Wormington
,
et al.
Article dans une revue
hal-03001931v1
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Strain evolution of SiGe-on-insulator obtained by the Ge-condensation technique
Victor Boureau
,
Shay Reboh
,
Daniel Benoit
,
Martin Hÿtch
,
Alain Claverie
Article dans une revue
hal-03015401v1
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Déformations introduites lors de la fabrication de transistors FDSOI : une contribution de l'holographie électronique en champ sombre
Victor Boureau
Physique [physics]. Université de Toulouse III - Paul Sabatier, 2016. Français. ⟨NNT : ⟩
Thèse
tel-01786799v1
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Germanium condensation for co-integration: Strain study by dark-field electron holography
Victor Boureau
,
Daniel Benoit
,
Bénédicte Warot-Fonrose
,
Martin Hÿtch
,
Alain Claverie
Nanotechnology Materials and Devices Conference (NMDC), 2014 IEEE 9th, 2014, Unknown, Unknown Region. pp.34-36, ⟨10.1109/NMDC.2014.6997415⟩
Communication dans un congrès
hal-01719498v1
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Strain/composition interplay in thin SiGe layers on insulator processed by Ge condensation
Victor Boureau
,
Daniel Benoit
,
Bénédicte Warot-Fonrose
,
Martin Hÿtch
,
Alain Claverie
Article dans une revue
hal-01707172v1
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High-sensitivity mapping of magnetic induction fields with nanometer-scale resolution: comparison of off-axis electron holography and pixelated differential phase contrast
Victor Boureau
,
Michal Staňo
,
Jean-Luc Rouviere
,
Jean-Christophe Toussaint
,
Olivier Fruchart
,
et al.
Article dans une revue
hal-02919930v1
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Influence of some process steps onto the deformation of the channels of FD-SOI CMOS transistors
Alain Claverie
,
Victor Boureau
ECS Conference, 2018, Cancun, Mexico
Communication dans un congrès
hal-01763005v1
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Correlative investigation of Mg doping in GaN layers grown at different temperatures by atom probe tomography and off-axis electron holography
Lynda Amichi
,
Isabelle Mouton
,
Victor Boureau
,
Enrico Di Russo
,
Philippe Vennegues
,
et al.
Article dans une revue
hal-02406102v1
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Combining high-resolution X-ray reciprocal space mapping and dark-field electron holography for strain analysis in 20 nm pMOS structures
Aurèle Durand
,
Victor Boureau
,
Delphine Lecunff
,
Axel Hourtane
,
Daniel Benoit
,
et al.
Nanotechnology (IEEE-NANO) 2015 IEEE 15th International Conference on, 2015, Unknown, Unknown Region. pp.785-788, ⟨10.1109/NANO.2015.7388727⟩
Communication dans un congrès
hal-01719495v1
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Crystal growth of bullet-shaped magnetite in magnetotactic bacteria of the Nitrospirae phylum
Jinhua Li
,
Nicolas Menguy
,
Christophe Gatel
,
Victor Boureau
,
Etienne Snoeck
,
et al.
Article dans une revue
hal-01707385v1
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Off-axis electron holography combining summation of hologram series with double-exposure phase-shifting: Theory and application
Victor Boureau
,
Robert Mcleod
,
Benjamin Mayall
,
David Cooper
Ultramicroscopy, 2018, 193, pp.52-63
Article dans une revue
hal-02057211v1
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(Invited) Impact of Some Processing Steps onto the Strain Distributions in FD-SOI CMOS Planar Devices: A Contribution of Dark-Field Electron Holography
Victor Boureau
,
Daniel Benoit
,
Alain Claverie
ECS Transactions, 2018, 86 (10), pp.37-50
Article dans une revue
hal-02057250v1
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Strain mapping of advanced electronic devices by TEM based methods.
Alain Claverie
,
Victor Boureau
,
David N Cooper
International Conference on Microscopy and 39th Annual meeting of EMSI, Jul 2018, Bhubaneswar, India
Communication dans un congrès
hal-01767810v1
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Process induced strains in FDSOI devices: a contribution of dark-field electron holography
Victor Boureau
,
Martin Hÿtch
,
Benoit Daniel
,
Alain Claverie
Micro and Nano 2015, Oct 2015, Athenes, Greece
Communication dans un congrès
hal-01763625v1
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Three-dimensional measurement of Mg dopant distribution and electrical activity in GaN by correlative atom probe tomography and off-axis electron holography
Lynda Amichi
,
Isabelle Mouton
,
Enrico Di Russo
,
Victor Boureau
,
Frédéric Barbier
,
et al.
Article dans une revue
hal-02991526v1
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Coupled As and Mn redox transformations in an Fe(0) electrocoagulation system: competition for reactive oxidants and sorption sites
Charlotte Catrouillet
,
Sachiko Hirosue
,
Nathalie Manetti
,
Victor Boureau
,
Jasquelin Peña
Article dans une revue
hal-03820607v1
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Lattice contraction due to boron doping in silicon
Victor Boureau
,
Jean Michel Hartmann
,
Alain Claverie
Article dans une revue
hal-02061809v1
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Strain imaging of processed layers and devices by dark field electron holography
Alain Claverie
,
Victor Boureau
,
Martin Hÿtch
,
Nikolay Cherkashin
Congress of the Electron Microscopy Society of India, Jul 2014, ??, India
Communication dans un congrès
hal-01763638v1
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Impact of Some Processing Steps onto the Strain Distributions in FD-SOI CMOS Planar Devices: A Contribution of Dark-Field Electron Holography
V. Boureau
,
D. Benoit
,
Alain Claverie
Article dans une revue
hal-02057241v1
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Direct comparison of off-axis holography and differential phase contrast for the mapping of electric fields in semiconductors by transmission electron microscopy
Benedikt Haas
,
Jean-Luc Rouviere
,
Victor Boureau
,
Remy Berthier
,
David Cooper
Article dans une revue
cea-02186458v1
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An electron holography study of perpendicular magnetic tunnel junctions nanostructured by deposition on pre-patterned conducting pillars
V. Boureau
,
V. D Nguyen
,
Aurélien Masseboeuf
,
A. Palomino
,
E Gautier
,
et al.
Article dans une revue
hal-02953621v1
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Effect of Bias on the Response of GaN Axial p–n Junction Single-Nanowire Photodetectors
Sergi Cuesta
,
M. Spies
,
V. Boureau
,
F. Donatini
,
Moïra Hocevar
,
et al.
Article dans une revue
hal-02326742v1
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Improved measurement of electric fields by nanobeam precession electron diffraction
L. Bruas
,
V. Boureau
,
A. Conlan
,
S. Martinie
,
Jean-Luc Rouviere
,
et al.
Article dans une revue
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