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270 résultats
Classical vs. neural approaches for on-board image satellite analysis2nd round table on Micro-Nano Tehnologies for Space (ESTEC'97), Oct 1997, Noordwijk, Netherlands
Communication dans un congrès
hal-01388686v1
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Validation by Fault Injection of a Hardening Technique for Matrix Multiplication AlgorithmsEuropean Workshop on Radiation Effects on Components and Systems (RADECS'08), Sep 2008, Jyväskylä, Finland. pp.321-324
Communication dans un congrès
hal-00374751v1
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Fault localisation when testing complex circuitsG Electronic Circuits and Systems, 1985, Oct. ; 132(5), pp.241-5
Article dans une revue
hal-00013349v1
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SEU fault tolerance in artificial neural networksIEEE Transactions on Nuclear Science, 1995, Dec. 1995; 42(6) pt. 1, pp.1856-62. ⟨10.1109/23.489227⟩
Article dans une revue
hal-00008257v1
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Physical fault injection: a suitable method for the evaluation of functional test efficiency1991, pp.179-182, ⟨10.1109/DFTVS.1991.199960⟩
Communication dans un congrès
hal-00008269v1
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Upset hardened memory design for submicron CMOS technologyIEEE Transactions on Nuclear Science, 1996, Dec. 1996; 43(6) pt. 1, pp.2874-8. ⟨10.1109/23.556880⟩
Article dans une revue
hal-00008251v1
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Bit flip injection in processor-based architectures: a case study2002, pp.117-127, ⟨10.1109/OLT.2002.1030194⟩
Communication dans un congrès
hal-00008208v1
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Injecting multiple upsets in a SEU tolerant 8051 micro-controller8th IEEE International On-Line Testing Workshop (IOLTW 2002), 2002, Isle of Bendor, France. pp.194, ⟨10.1109/OLT.2002.1030217⟩
Communication dans un congrès
hal-00008207v1
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Memory cell insensitive to collisions of heavy ionsFrance, Patent n° : US5640341. http://v3.espacenet.com/textdoc?IDX=EP0689713&CY=ep&LG=en&DB=EPODOC. 1997
Brevet
hal-00008388v1
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Error Rate Estimation for a Flight Application Using the CEU Fault Injection Approach2002, pp.195, ⟨10.1109/OLT.2002.1030218⟩
Communication dans un congrès
hal-00008205v1
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Methodologies and Tools for the Evaluation of the Sensitivity to Radiation of SRAM-based FPGAs23rd International Conference on Design of Circuits and Integrated Systems (DCIS'08), Nov 2008, Grenoble, France. pp.session 6D1
Communication dans un congrès
hal-00347662v1
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A generic platform for remote accelerated tests and high altitude SEU experiments on advanced ICs: Correlation with MUSCA SEP3 calculationsInternational On-Line Test Symposium (IOLTS'09), Jun 2009, Sesimbra-Lisbon, Portugal. pp.180, ⟨10.1109/IOLTS.2009.5196005⟩
Communication dans un congrès
hal-00472089v1
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On the Use of Model Checking for the Verification of a Dynamic Signature Monitoring ApproachIEEE Transactions on Nuclear Science, 2005, 52 (5), pp.1555-1561. ⟨10.1109/TNS.2005.855819⟩
Article dans une revue
hal-00419358v1
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THESIC: A testbed suitable for the qualification of integrated circuits devoted to operate in harsh environmentIEEE European Test Workshop (ETW'98), May 1998, Barcelone, Espagne
Communication dans un congrès
hal-01384973v1
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Single Events in a COTS Soft-Error Free SRAM at Low Bias Voltage NeutronsIEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2072-2079. ⟨10.1109/TNS.2016.2522819⟩
Article dans une revue
hal-01909814v1
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Assessing the Static and Dynamic Sensitivity of a Commercial Off-the-Shelf Multicore Processor for Noncritical Avionic ApplicationsJournal of Nanotechnology, 2018, 2018 (ID 2926392), pp.1-8. ⟨10.1155/2018/2926392⟩
Article dans une revue
hal-01911180v1
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Evidences of Bayesian Machines Robustness Against SEUs and SETsRadiation and its Effects on Components and Systems (RADECS'16), Sep 2016, Bremen, Germany
Communication dans un congrès
hal-01477233v1
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Statistical anomalies of bitflips in SRAMS to discriminate MCUS SEUSConference on Radiation Effects on Components and Systems (RADECS 2015), Sep 2015, Moscow, Russia. IEEE, Proceedings of the 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2015), pp.1-4, 2015, ⟨10.1109/RADECS.2015.7365670⟩
Poster de conférence
in2p3-01199459v1
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SEU fault-injection at system level: method, tools and preliminary resultsLatin American Test Workshop (LATW), Mar 2014, Fortaleza, Brazil
Communication dans un congrès
hal-01061310v1
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Assessing the soft error rate of digital architectures devoted to operate in radiation environment: a case studiedIEEE Latin-American Test Workshop (LATW'01), Feb 2001, Cancun, Mexique
Communication dans un congrès
hal-01391624v1
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Performance evaluation and failure prediction for the soft implemented error detection technique10th International On-Line Testing Symposium (IOLTS'04), Jul 2004, Funchal, Mareira, Portugal
Communication dans un congrès
hal-01393246v1
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Two complementary approaches for studying the effects of SEUs on HDL-based designs20th IEEE International On-Line Testing Symposium (IOLTS’14), Jul 2014, Platja d'Aro, Girona Spain. pp.220-221
Communication dans un congrès
hal-01413194v1
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Assessment of a Hardware-Implemented Machine Learning Technique under Neutron IrradiationIEEE Transactions on Nuclear Science, 2019, 66 (7), pp.1441-1448. ⟨10.1109/TNS.2019.2920747⟩
Article dans une revue
hal-02193158v1
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SEU sensitivity trends of three successive generations of COTS SRAMs at ultra low bias voltageConference on Radiation Effects on Components and Systems (RADECS 2017), Oct 2017, Geneva, Switzerland. , 2017
Poster de conférence
in2p3-01735635v1
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NETFI-2: An Automatic Method for Fault Injection on HDL-Based DesignsDesign, Automation & Test in Europe (DATE 2017), Mar 2017, Lausanne, Switzerland. IEEE Circuits and Systems society
Poster de conférence
hal-01730869v1
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Error-rate prediction for applications implemented in Multi-core and Many-core processorsConference on Radiation Effects on Components and Systems (RADECS 2017), Oct 2017, Geneva, Switzerland. , 2017
Poster de conférence
in2p3-01735643v1
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SEU Impact in Processor's Control-Unit: Preliminary Results Obtained for LEON3 Soft-Core18th IEEE Latin American Test Symposium (LATS’17), Mar 2017, Bogota, Colombia. pp.1-4
Communication dans un congrès
hal-01523901v1
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Single event upsets simulations on neural networks2nd LAAS International Conference on Computer Simulation, Sep 1997, Beyrouth, Liban
Communication dans un congrès
hal-01384968v1
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An Automated SEU Fault-Injection Method and Tool for HDL-Based DesignsIEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2728 - 2733. ⟨10.1109/TNS.2013.2267097⟩
Article dans une revue
hal-01137310v1
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Error-Rate Estimation Combining SEE Static Cross-Section Predictions and Fault-Injections Performed on HDL-Based DesignsIEEE Transactions on Nuclear Science, 2013, 60, December (6), pp.4238-4242
Article dans une revue
hal-01137311v1
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