A Procedure for Alternate Test Feature Design and Selection
Manuel J. Barragan
,
G. Leger
Article dans une revue
hal-01142581v1
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Performance benchmark of State-of-the-art Sub-6-GHz wideband LNAs Based on an Extensive Survey
Mohamed Khalil Bouchoucha
,
Mathieu Coustans
,
Manuel Barragan
,
Andreia Cathelin
,
Sylvain Bourdel
Communication dans un congrès
hal-04171210v1
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Practical Simulation Flow for Evaluating Analog and Mixed-Signal Test Techniques
Manuel J. Barragan
,
Haralampos-G. Stratigopoulos
,
Salvador Mir
,
Hervé Le-Gall
,
Neha Bhargava
,
et al.
Article dans une revue
hal-01359611v1
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On-Chip Implementation of an Integrator-Based Servo-Loop for ADC Static Linearity Test
G. Renaud
,
Manuel J. Barragan
,
Salvador Mir
Communication dans un congrès
hal-01118116v1
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Nonintrusive Machine Learning-Based Yield Recovery and Performance Recentering for mm-Wave Power Amplifiers: A Two-Stage Class-A Power Amplifier Case Study
Florent Cilici
,
Marc Margalef-Rovira
,
Estelle Lauga-Larroze
,
Sylvain Bourdel
,
Gildas Leger
,
et al.
Article dans une revue
hal-04253273v1
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Analysis and mitigation of timing inaccuracies in high-frequency on-chip sinusoidal signal generators based on harmonic cancellation
Ankush Mamgain
,
Manuel J. Barragan
,
Salvador Mir
Communication dans un congrès
hal-03371398v1
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Journal of Electronic Testing: Special Issue on Analog, Mixed-Signal, and RF Testing
K. Huang
,
Manuel J. Barragan
Ouvrages
hal-01989750v1
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A wideband sub-6GHz continuously tunable gm-boosted CG Low Noise Amplifier in 28 nm FD-SOI CMOS technology
Mohamed Khalil Bouchoucha
,
Manuel Barragan
,
Andreia Cathelin
,
Sylvain Bourdel
Communication dans un congrès
hal-04241250v1
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A 5-DC-parameter MOSFET model for circuit simulation in QucsStudio and SPECTRE
Deni Germano Alves Neto
,
Cristina Missel Adotnes
,
Gabriel Maranhão
,
Mohamed Khalil Bouchoucha
,
Manuel Barragan
,
et al.
Communication dans un congrès
hal-04188231v1
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Simulation process flow for the implementation of industry-standard FD-SOI quantum dot devices
Ioanna Kriekouki
,
Pericles Philippopoulos
,
Félix Beaudoin
,
Salvador Mir
,
Manuel Barragan
,
et al.
Article dans une revue
hal-04221597v1
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Static linearity test of SAR ADCs using an embedded incremental Σ∆ converter
R. Silveira Feitoza
,
Manuel J. Barragan
,
Daniel Dzahini
,
Salvador Mir
Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2019) , Jun 2019, Montpellier, France
Communication dans un congrès
hal-02193107v1
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Mostly-digital design of sinusoidal signal generators for mixed-signal BIST applications using harmonic cancellation
H. Malloug
,
Manuel J. Barragan
,
Salvador Mir
,
H. Le-Gall
IEEE 21st International Mixed-Signal Testing Workshop (IMSTW'16) , Jul 2016, Sant Feliu de Guixols, Spain
Communication dans un congrès
hal-01445084v1
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Interactive Mixed-Signal Testing Through 1687
Michele Portolan
,
Manuel J. Barragan
,
H. Malloug
,
Salvador Mir
First International Test Standards Application Workshop (TESTA'16) , May 2016, Amsterdam, Netherlands
Communication dans un congrès
hal-01445086v1
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Statistical evaluation of digital techniques for Sigma-Delta ADC BIST
M. Dubois
,
H. Stratigopoulos
,
Salvador Mir
,
Manuel J. Barragan
Chapitre d'ouvrage
hal-01469210v1
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Guest Editorial: Analog, Mixed-Signal and RF Testing
Manuel J. Barragan
,
W. Eisenstadt
Ouvrages
hal-01562017v1
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Analog/RF test problem solving with statistically sampled data
M. Dubois
,
H. Stratigopoulos
,
Manuel J. Barragan
,
R. Alhakim
,
Salvador Mir
IEEE VLSI Test Symposium (VTS'14) , May 2014, Napa, California, United States
Communication dans un congrès
hal-01131431v1
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N-Path Mixer with Wide Rejection Including the 7 th Harmonic for Low Power Multi-standard Receivers
Ali Al Shakoush
,
Sana Ibrahim
,
Serge Subias
,
Florence Podevin
,
Manuel J. Barragan
,
et al.
Communication dans un congrès
hal-03852364v1
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Harmonic cancellation strategies for on-chip sinusoidal signal generation using digital resources
H. Malloug
,
Manuel J. Barragan
,
Salvador Mir
,
H. Le Gall
Communication dans un congrès
hal-01702703v1
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Reduced-Code Techniques for On-Chip Static Linearity Test of SAR ADCs
R. Silveira Feitoza
,
Manuel J. Barragan
,
Salvador Mir
Communication dans un congrès
hal-02165220v1
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28 nm UTBB FD-SOI technology for Silicon-based quantum dots and Cryo-CMOS electronics
I. Kriekouki
,
Sophie Rochette
,
Claude Rohrbacher
,
J. Camirand Lemyre
,
Michel Pioro-Ladriere
,
et al.
Silicon Quantum Electronics Workshop (SiQEW 2019) , Oct 2019, San Sabastian, Spain
Communication dans un congrès
hal-03178723v1
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Evaluation of low-cost mixed-signal test techniques for circuits with long simulation times
Haralampos-G. Stratigopoulos
,
Manuel J. Barragan
,
Salvador Mir
,
Hervé Le-Gall
,
Neha Bhargava
,
et al.
Communication dans un congrès
hal-01259637v1
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On the use of causal feature selection in the context of machine-learning indirect test
Manuel J. Barragan
,
G. Leger
,
F. Cilici
,
Estelle Lauga-Larroze
,
Sylvain Bourdel
,
et al.
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) , Mar 2019, Florence, France. pp.276-279
Communication dans un congrès
hal-02231655v1
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Analysis of an efficient on-chip servo-loop technique for reduced-code static linearity test of pipeline ADCs
G. Renaud
,
Marc Margalef-Rovira
,
Manuel J. Barragan
,
Salvador Mir
VLSI Test Symposium (VTS 2017) , Apr 2017, Las Vegas, United States
Communication dans un congrès
hal-01702764v1
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Design of a sinusoidal signal generator with calibrated harmonic cancellation for mixed-signal BIST in a 28 nm FDSOI technology
H. Malloug
,
Manuel J. Barragan
,
Salvador Mir
,
L. Basteres
,
H. Le Gall
Communication dans un congrès
hal-01702765v1
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Evaluation of digital ternary stimuli for dynamic test of ΣΔ ADCs
M. Dubois
,
Haralampos-G Stratigopoulos
,
Salvador Mir
,
Manuel J. Barragan
IFIP/IEEE 22nd International Conference on Very Large Scale Integration (VLSI-SoC'14) , Oct 2014, Playa del Carmen, Mexico, Mexico. pp.1-6,
⟨10.1109/VLSI-SoC.2014.7004153⟩
Communication dans un congrès
hal-01118108v1
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Design of an on-chip stepwise ramp generator for ADC static BIST applications
G. Renaud
,
Manuel J. Barragan
,
Salvador Mir
IEEE International Mixed-Signal Testing Workshop (IMS3TW'15) , Jun 2015, Paris, France. pp.1-6
Communication dans un congrès
hal-01393841v1
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Evaluation of harmonic cancellation techniques for sinusoidal signal generation in mixed-signal BIST
H. Malloug
,
Manuel J. Barragan
,
Salvador Mir
IEEE International Mixed-Signal Testing Workshop (IMS3TW'15) , Jun 2015, Paris, France
Communication dans un congrès
hal-01393842v1
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Filtre ultra compact à lignes à ondes lentes 3D en technologie BiCMOS à 29 GHz
Olivier Occello
,
Marc Margalef-Rovira
,
Manuel J. Barragan
,
Cédric Durand
,
Philippe Ferrari
22èmes Journées Nationales Microondes , Jun 2022, Limoges, France
Communication dans un congrès
hal-03702506v1
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A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ΣΔ ADC
Manuel J. Barragan
,
Rshdee Alhakim
,
Haralampos-G. Stratigopoulos
,
Matthieu Dubois
,
Salvador Mir
,
et al.
Article dans une revue
hal-01447789v1
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Interpretation of 28 nm FD-SOI quantum dot transport data taken at 1.4 K using 3D Quantum TCAD simulations
Ioanna Kriekouki
,
Félix Beaudoin
,
Pericles Philippopoulos
,
Chenyi Zhou
,
Julien Camirand-Lemyre
,
et al.
8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS 2022) , May 2022, Udine, Italy.
⟨10.1016/j.sse.2022.108355⟩
Communication dans un congrès
hal-03765899v1
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