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Impact of contact and channel resistance on the frequency-dependent capacitance and conductance of pseudo-MOSFET

 S. Sato , G. Ghibaudo , L. Benea , I. Ionica , Y. Omura , et al.
Solid-State Electronics, 2019, 159, pp.197-203. ⟨10.1016/j.sse.2019.03.059⟩
Article dans une revue hal-02321909v1

Electrical characterization of ultra-thin silicon-on-insulator substrates : static and split C–V measurements in the Pseudo–MOSFET configuration

 Piro L. , Diab A. , Ionica I. , Gérard Ghibaudo , Cristoloveanu S.
4th Int. Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Technology (ULSIC ), Jul 2013, Villard de Lans, France. pp.203-208
Communication dans un congrès hal-01182173v1

Parasitic bipolar effect in advanced FD SOI MOSFETs: experimental evidence and gain extraction

 Fanyu Liu , Irina Ionica , Mayline Bawedin , Sorin Cristoloveanu,
10th EUROSOI Workshop, Jan 2014, Tarrogona, Spain
Communication dans un congrès hal-02008226v1
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Second harmonic generation for contactless non-destructive characterization of silicon on insulator wafers

 D. Damianos , L. Pirro , G. Soylu , I. Ionica , V. Nguyen , et al.
Solid-State Electronics, 2016, 115, pp.237 - 243. ⟨10.1016/j.sse.2015.08.006⟩
Article dans une revue hal-01893414v1
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Impact of Blend Morphology on Interface State Recombination in Bulk Heterojunction Organic Solar Cells

 Benjamin Bouthinon , Raphaël Clerc , Jérôme Vaillant , J.-M Verilhac , Jérôme Faure-Vincent , et al.
Advanced Functional Materials, 2015, pp.10.1002/adfm.201401633. ⟨10.1002/adfm.201401633⟩
Article dans une revue hal-01100102v1

Interface trap density evaluation on bare silicon-on-insulator wafers using the quasi-static capacitance technique

 L. Pirro , I. Ionica , G. Ghibaudo , X. Mescot , L. Faraone , et al.
Journal of Applied Physics, 2016, 119 (17), pp.175702. ⟨10.1063/1.4947498⟩
Article dans une revue hal-01947679v1

Transient second harmonic generation and correlation with Ψ-MOSFET in SOI wafers

 D. Damianos , I. Ionica , A. Kaminski-Cachopo , G. Vitrant , S. Cristoloveanu , et al.
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2016, Vienna, Austria. pp.222-225, ⟨10.1109/ULIS.2016.7440093⟩
Communication dans un congrès hal-01974394v1

Low-frequency noise in bare SOI wafers: Experiments and model

 Luca Pirro , Irina Ionica , Sorin Cristoloveanu , Gérard Ghibaudo
2015 ESSDERC - 45th European Solid-State Device Research Conference, Sep 2015, Graz, Austria. pp.286-289, ⟨10.1109/ESSDERC.2015.7324770⟩
Communication dans un congrès hal-02004194v1
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Effet de champ et blocage de Coulomb dans des nanostructures de silicium élaborées par microscopie à force atomique

 Irina Ionica
Physique [physics]. Institut National Polytechnique de Grenoble - INPG, 2005. Français. ⟨NNT : ⟩
Thèse tel-00097465v1

Nanoindentation effects on the electrical caracterizaron in Ψ-MOSFET configuration

 Licinius Benea , Tiphaine Cerba , Maryline Bawedin , Cécile Delacour , Sorin Cristoloveanu , et al.
2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Mar 2018, Granada, Spain. pp.141-144, ⟨10.1109/ULIS.2018.8354754⟩
Communication dans un congrès hal-01948053v1

Volume and interface conduction in InGaAs junctionless transistors

 L. Pirro , H. Park , I. Ionica , M. Bawedin , S. Cristoloveanu , et al.
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2016, Vienna, Austria. pp.104-107, ⟨10.1109/ULIS.2016.7440063⟩
Communication dans un congrès hal-02004340v1
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Field-effect passivation of Si by ALD-Al2O3: second harmonic generation monitoring and simulation

 D Damianos , G. Vitrant , A. Kaminski-Cachopo , D. Blanc-Pélissier , G. Ghibaudo , et al.
Journal of Applied Physics, 2018, 124 (12), pp.125309. ⟨10.1063/1.5041062⟩
Article dans une revue hal-01883529v1

Advances in the pseudo-MOSFET characterization method

 I. Ionica , A. El Hajj Diab , Y.H. Bae , X. Mescot , A. Ohata , et al.
IEEE Conference Proceedings., 2010, France. pp.45-51
Communication dans un congrès hal-00604270v1
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Experimental and simulation investigation of the out-of-equilibrium phenomena on the pseudo-MOSFET configuration under transient linear voltage ramps

 Miltiadis Alepidis , Licinius Benea , Davide Bucci , Xavier Mescot , Maryline Bawedin , et al.
Solid-State Electronics, 2020, 168, pp.107721. ⟨10.1016/j.sse.2019.107721⟩
Article dans une revue hal-03171017v1

Second Harmonic Generation as a Contactless Probe of Al2O3 Passivation Layer

 Dimitrios Damianos , Irina Ionica , Anne Kaminski , Danièle Blanc-Pelissier , J. Changala , et al.
Journées Énergie du Labex LANEF. Photovoltaïque: Couches MInces & Concepts avancés., R. André, V. Consonni, L. Grenet, J.P. Travers, May 2017, Grenoble, France
Communication dans un congrès hal-02016903v1

Parasitic bipolar effect in ultra-thin FD SOI MOSFETs

 F.Y. Liu , I. Ionica , M. Bawedin , S. Cristoloveanu
Solid-State Electronics, 2015, 112, pp.29-36. ⟨10.1016/j.sse.2015.02.009⟩
Article dans une revue hal-02003101v1

Pseudo-MOSFET under illumination: a novel method for extraction of carrier lifetime.

 M. Daanoune , S. Sirajeddine , A. Diab , A. Kaminski-Cachopo , I. Ionica , et al.
EuroSOI 2013, Jan 2013, Paris, France. pp.P1.2
Communication dans un congrès hal-01067987v1

Electrical detection of bacteria on SOI film using the pseudo-MOSFET configuration

 Médéric Vindret , Licinius Benea , Irina Ionica , Cécile Delacour , Pascal Xavier , et al.
International Workshop on Semi-conducting Nanomaterials for Health, Environment and Security Applications, Nanonets2Sense, Nov 2018, Grenoble, France
Communication dans un congrès hal-02016817v1

Effect of back gate on parasitic bipolar effect in FD SOI MOSFETs

 Fanyu Liu , Irina Ionica , Mayline Bawedin , Sorin Cristoloveanu
2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2014, Millbrae, United States. pp.5.8, ⟨10.1109/S3S.2014.7028210⟩
Communication dans un congrès hal-02003967v1

Scanning microwave microscopy for non-destructive characterization of SOI wafers

 L. Michalas , I. Ionica , E. Brinciotti , L. Pirro , F. Kienberger , et al.
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2016, Vienna, Austria. pp.238-241, ⟨10.1109/ULIS.2016.7440097⟩
Communication dans un congrès hal-02004364v1

Back-gated InGaAs-on-insulator lateral N+NN+ MOSFET: Fabrication and typical conduction mechanisms

 H.J. Park , L. Pirro , L. Czornomaz , I. Ionica , M. Bawedin , et al.
Solid-State Electronics, 2017, 128, pp.80-86. ⟨10.1016/j.sse.2016.10.019⟩
Article dans une revue hal-02003226v1

Special characterization techniques for advanced FDSOI process

 S. Cristoloveanu , M. Bawedin , I. Ionica
2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2015, Rohnert Park, United States. pp.9a.1, ⟨10.1109/S3S.2015.7333543⟩
Communication dans un congrès hal-02004273v1

Second Harmonic Generation: A Non-Destructive Characterization Method for Dielectric-Semiconductor Interfaces

 I. Ionica , D. Damianos , A. Kaminski-Cachopo , A. Bouchard , X. Mescot , et al.
2018 International Semiconductor Conference (CAS), Oct 2018, Sinaia, Romania. pp.35-42, ⟨10.1109/SMICND.2018.8539758⟩
Communication dans un congrès hal-01974421v1

Out-of-equilibrium body potential measurements in pseudo-MOSFET for biosensing

 Licinius Benea , Maryline Bawedin , Cécile Delacour , Sorin Cristoloveanu , Irina Ionica
2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2017, Athens, Greece. pp.19-22, ⟨10.1109/ULIS.2017.7962590⟩
Communication dans un congrès hal-02007128v1

Second harmonic generation for non-destructive characterization of silicon-on-insulator substrates

 I. Ionica , L. Pirro , V. Nguyen , A. Kaminski , G. Vitrant , et al.
2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2015, Bologna, Italy. pp.185-188, ⟨10.1109/ULIS.2015.7063744⟩
Communication dans un congrès hal-02004048v1

Potential of nanonets for the 3D integration of biosensors on CMOS (invited)

 Mireille Mouis , Maxime Legallais , Thibauld Cazimajou , Fanny Morisot , Thuy Thi Thu Nguyen , et al.
Journées Nationales Nanofils Semiconducteurs Journées Nationales Nanofils Semiconducteurs, Lyon, 13-15 Nov. 2019, Nov 2019, Lyon, France
Communication dans un congrès hal-02400730v1

Split-CV for pseudo-MOSFET characterization: Experimental setups and associated parameter extraction methods

 L. Pirro , I. Ionica , G. Ghibaudo , S. Cristoloveanu
2014 International Conference on Microelectronic Test Structures (ICMTS), Mar 2014, Udine, Italy. pp.14-19, ⟨10.1109/ICMTS.2014.6841461⟩
Communication dans un congrès hal-02003797v1

(Invited) Non-Destructive Characterization of Dielectric - Semiconductor Interfaces by Second Harmonic Generation

 I. Ionica , D. Damianos , A. Kaminski , G. Vitrant , D. Blanc-Pélissier , et al.
229th ECS Meetings: 7th Int. Symposium on Dielectrics for Nanosystems: Materials Science, Processing, Reliability and Manufaturing - and - Solid State Topics General Session, D. Misra, K. Sundaram, H. Iwai, T. Chikyo, Y. Obeng, Z. Chen, D. Bauza, O. Leonte and K. Shimanura, May 2016, San Diego, United States
Communication dans un congrès hal-02007827v1

Layer thickness impact on Second Harmonic Generation characterization of SOI wafers

 D. Damianos , I. Ionica , J. Changala , M. Lei , A. Kaminski-Cachopo , et al.
2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2017, Athens, Greece. pp.184-187, ⟨10.1109/ULIS.2017.7962557⟩
Communication dans un congrès hal-01974416v1

Optical Switching of Porphyrin-Coated Silicon Nanowire Field Effect Transistors

 Clemens Winkelmann , Irina Ionica , Xavier Chevalier , Guy Royal , Christophe Bucher , et al.
Nano Letters, 2007, 7 (6), pp.1454-1458. ⟨10.1021/nl0630485⟩
Article dans une revue hal-00700064v1
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