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Florent Houdellier
85
Documents
Identifiants chercheurs
- florent-houdellier
- 0000-0002-5272-7792
- IdRef : 111155878
Présentation
**Research activities : new instrumental and methodological developments in Transmission Electron Microscopy (TEM)**
Since 2022 : In charge of teaching "Advanced geometrical optics" in the 4th year and "Charged particle optics" in the 5th year of the physics department at INSA-Toulouse (70h)
2022 : Accreditation to Supervise Research (Habilitation à Diriger des Recherches-HDR)
Since 2020 : CNRS Research Engineer (IRHC) at CEMES-CNRS.
2018-2023 : Director of the CNRS/Hitachi High-Technologies (HHT) Joint laboratory "HC-IUMi" (Hitachi-CNRS Infrastructure for Ultrafast Microscopy) located in CEMES-CNRS, which aims to develop the next generation of ultrafast coherent FE-TEM.
2016-2020 : CNRS Research Engineer (IR1) at CEMES-CNRS. Head of the Characterisation platform and TEM service. Member of the Electron Microscopy research group (I3EM).
2007-2016 : CNRS Research Engineer (IR2) at CEMES-CNRS. Head of the TEM service
2006 - 2007 : Post-doctoral position supported by the European ESTEEM project. Development of new holographic methods with elastic and inelastic electrons. Development of CHEF and EMCD experiments with a Cs-corrected microscope.
2003 - 2006 : PhD thesis at CEMES-CNRS (Centre d’Elaboration de Matériaux et d’Etudes Structurales-Centre National de la Recherche Scientifique) : Development of CBED and high resolution electron holography for strain measurements
1998 - 2003 : Engineering School INSA (Institut National des Sciences Appliquées) Toulouse. Speciality : Nanophysics
*Some developments, a selective choice :*
- *Dark field Electron Holography :* <http://archives.cnrs.fr/inp/article/469>
- *New high brightness carbon nanocone CFEG :* <http://archives.cnrs.fr/inp/article/454>
- *I2TEM microscope in collaboration with Hitachi High-Technologies (HHT) :*<http://archives.cnrs.fr/inp/article/584>, <https://videotheque.cnrs.fr/visio=4086>
- *Partnership between CEMES- CNRS and HHT :* <http://archives.cnrs.fr/inp/article/389>
- *New high brightness ultrafast CFEG :* <https://inp.cnrs.fr/fr/cnrsinfo/nouvelle-source-delectrons-pour-la-microscopie-electronique>
- *CNRS-HHT joint laboratory :* <http://archives.cnrs.fr/presse/article/5654>, <http://www.cnrs.fr/fr/un-nouveau-microscope-de-pointe-inaugure-au-cemes-cnrs>
*Awards :*
2020: CNRS Cristal award
2019: Ernst Ruska prize of the German Microscopy Society (DGE)
2019: European Microscopy Society (EMS) 2018 outstanding paper award
2006: Pierre Favard Award of the French Microscopy Society (Sfmu)
Publications
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Time-Resolved Cathodoluminescence in a Transmission Electron Microscope11th International Conference on Metamaterials, Photonic Crystals and Plasmonics (META 2021), Jul 2021, Warsaw, Poland
Communication dans un congrès
hal-04449931v1
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Synthesis and (some) applications of carbon-nanotube-supported pyrolytic carbon nanoconesConference on Carbon Materials "CCM-2019", Indian Carbon Society, Nov 2019, New Delhi, India
Communication dans un congrès
hal-02411274v1
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Micromagnetic Objects and dynamical imaging Interferometry Instrumentation & In situ for Electron MicroscopyMCMeet - GDRs MCM2 et MEETICC, Oct 2017, Strasbourg, France
Communication dans un congrès
hal-01725341v1
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Towards ultrafast TEM based on a modified cold-field emission TEM2016 Houches WE Heraeus Workshop, May 2016, Les Houches, France
Communication dans un congrès
hal-01768918v1
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Ultrafast laser-induced field emission from a single carbon nanotube based nanotip2015 Conference on Lasers and Electro-Optics (CLEO) : Applications and Technology, May 2015, San Jose, United States. pp.JW2A--52, ⟨10.1364/CLEO_AT.2015.JW2A.52⟩
Communication dans un congrès
hal-01430583v1
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Measurement of crystalline lattice strain by transmission electron microscopy”14ème colloque de la Société Française des Microscopies, Jun 2015, Nice, France
Communication dans un congrès
hal-01763051v1
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In situ electron microscopy of hard and soft matterJoint XIII Interamerican Microscopy Congress & XVI Venezuelan Congress for Microscopy and Microanalysis 'CIASEM-2015', Oct 2015, Isla de Margarita, Venezuela
Communication dans un congrès
hal-02123302v1
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Development of TEM and SEM high brightness electron guns using cold field emission from a carbon nanotipPICO-2015, Apr 2015, Jülich, Netherlands
Communication dans un congrès
hal-02123316v1
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Synthesis and applications of individual carbon-nanotube-supported carbon nanoconesIEEE Nanotechnology Materials and Devices Conference, Oct 2014, Aci Castello, Italy
Communication dans un congrès
hal-02123308v1
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Comparaison des modes d'imagerie fond noir TEM et STEM pour l'observation de structures moléculaires47. Journées du GUMP, Société Française des Microscopies (SFµ). Paris, FRA., May 2011, Guadeloupe, France. 1 p
Communication dans un congrès
hal-02810543v1
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Strain Mapping of Layers and Devices Using Electron HolographyECS Trans. 2010, 2010, Unknown, Unknown Region. ⟨10.1149/1.3487533⟩
Communication dans un congrès
hal-01736051v1
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Recent advances in Transmission Electron Microscopy illustrated by an application to atomic scale characterization of nanoscale precipitationPTM2010 - International Conference on Solid-Solid Phase Transformations, 2010, AVIGNON, France
Communication dans un congrès
hal-00610638v1
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Critical Analysis of Different Techniques for Measuring Strain in Si1-yCy Layers Grown by CVD on a Si SubstrateECS Transactions, May 2008, Unknown, Unknown Region. ⟨10.1149/1.2911510⟩
Communication dans un congrès
hal-01736065v1
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Determination of strain within Si1-yCy layers grown by CVD on a Si substrateSymposium C – Quantitative Electron Microscopy for Materials Science, 2007, undetermined, France. pp.12-19, ⟨10.1557/PROC-1026-C07-03⟩
Communication dans un congrès
hal-01736057v1
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Comparative molecular dark field modes in cell imagingPoster de conférence hal-02820670v1 |
Étonnante physiqueSéverine Martrenchard. CNRS Editions, pp.422, 2023, 9782271148902
Ouvrages
hal-04318170v1
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Chapter One - Characterization of nanomaterials properties using FE-TEMCoherent Electron Microscopy: Designing Faster and Brighter Electron Sources, 227, pp.1-105, 2023, Advances in Imaging and Electron Physics, 978-0-443-19324-8. ⟨10.1016/B978-0-443-19324-8.00001-8⟩
Chapitre d'ouvrage
hal-04185377v1
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Chapter Two - Cold field emission electron source: From higher brightness to ultrafast beamCoherent Electron Microscopy: Designing Faster and Brighter Electron Sources, 227, Elsevier, pp.107-161, 2023, Advances in Imaging and Electron Physics, 978-0-443-19324-8. ⟨10.1016/B978-0-443-19324-8.00002-X⟩
Chapitre d'ouvrage
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Chapter Three - Every electron counts: Toward the development of aberration-optimized and aberration-corrected electron sourcesCoherent Electron Microscopy: Designing Faster and Brighter Electron Sources, 227, Elsevier, pp.163-216, 2023, Advances in Imaging and Electron Physics, 978-0-443-19324-8. ⟨10.1016/B978-0-443-19324-8.00003-1⟩
Chapitre d'ouvrage
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Ultrafast Transmission Electron Microscopy: Historical Development, Instrumentation, and ApplicationsPeter W. Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France. Advances in Electronics and Electron Physics, 207, Elsevier, 2018, 1076-5670. ⟨10.1016/bs.aiep.2018.06.001⟩
Chapitre d'ouvrage
hal-01839320v1
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Dark-Field Electron Holography for Strain MappingAlain Claverie; Mireille Mouis. Transmission Electron Microscopy in Micro-Nanoelectronics, Wiley-Blackwell, pp.81--106, 2013, ⟨10.1002/9781118579022.ch4⟩
Chapitre d'ouvrage
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CHAPTER 6 - Aberration Correction With the SACTEM-Toulouse: From Imaging to DiffractionP.W.Hawkes. Advances in Imaging and Electron Physics vol 153, 153, Academic press, 2008, Aberration-Corrected Electron Microscopy, 978-0-12-374220-9. ⟨10.1016/S1076-5670(08)01006-9⟩
Chapitre d'ouvrage
hal-01742322v1
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Contribution au développement du CBED et de l’holographie HREM pour l’analyse des déformations de couches épitaxiéesOptique [physics.optics]. INSA Toulouse; CNRS-CEMES, 2006. Français. ⟨NNT : ⟩
Thèse
tel-01754061v1
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COHERENT ELECTRON MICROSCOPY: CONTRIBUTIONS AND PROJECT. Towards aberration-corrected bright electron sourceOptics [physics.optics]. Université Toulouse 3 Paul Sabatier, 2022
HDR
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