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EMC performance analysis of a Processor/Memory System using PCB and Package-On-Package

 Etienne Sicard , Alexandre Boyer , Priscillia Fernandez-Lopez , An Zhou , Nicolas Marier , et al.
10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. 6p
Communication dans un congrès hal-01225364v1
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Susceptibility Analysis of an Operational Amplifier Using On-Chip Measurement

 He Huang , Alexandre Boyer , Sonia Ben Dhia , Bertrand Vrignon
EMC Europe 2014, Sep 2014, Goteborg, Sweden. pp.1-5
Communication dans un congrès hal-01068127v1
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Construction of an Integrated Circuit Emission Model of a FPGA

 Chaimae Ghfiri , André Durier , Alexandre Boyer , Sonia Ben Dhia , Christian Marot
2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC2016), May 2016, Shenzhen, China. pp.402-405, ⟨10.1109/APEMC.2016.7522751⟩
Communication dans un congrès hal-01663667v2
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New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs

 Nabil El-Belghiti , Patrick Tounsi , Alexandre Boyer , Arnaud Viard
27th IEEE North Atlantic Test Workshop, May 2018, Essex, United States. ⟨10.1109/NATW.2018.8388867⟩
Communication dans un congrès hal-01997428v1
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Optimized algorithm to reduce the near-field measurement time on FPGA device

 Sebastien Serpaud , Alexandre Boyer , Sonia Ben Dhia
12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2019), Oct 2019, Haining, China
Communication dans un congrès hal-02319472v1
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New Measurement Method to Investigated Service Life of Protection Networks exposed to ESD

 François Ruffat , Fabrice Caignet , Alexandre Boyer , Fabien Escudié , Guillaume Mejecaze , et al.
33rd European Symposium on Reliability of Electron Devices Failure Physics and Analysis (ESREF2022), Sep 2022, Berlin, Germany. ⟨10.1016/j.microrel.2022.114661⟩
Communication dans un congrès hal-03788168v1
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Detecting PCB Assembly defects using infrared thermal signatures

 Nabil El Belghiti Alaoui , Patrick Tounsi , Alexandre Boyer , Arnaud Viard
27th International Conference Mixed Design of Integrated Circuits and Systems (MIXDES2019), Jun 2019, Wroclaw, Poland. ⟨10.23919/MIXDES.2019.8787089⟩
Communication dans un congrès hal-02319460v1

Fatal case of enterovirus 71 infection and rituximab therapy, france, 2012.

 Somar Kassab , Tahar Saghi , Alexandre Boyer , Marie-Edith Lafon , Didier Gruson , et al.
Emerging Infectious Diseases, 2013, 19, pp.1345-7
Article dans une revue hal-01101199v1
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Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits

 Alexandre Boyer , Sonia Ben Dhia
Journal of Low Power Electronics, 2014, 10 (1), pp.165-172
Article dans une revue hal-00938358v1

La céramique d'habitat du Bronze final IIIb à La Tène B en Alsace et en Lorraine : essai de typo-chronologie, Dijon : Société Archéologique de l'Est, 2011.

 Anne-Marie Adam , Sylvie Deffressigne , M.P. Koenig , Marina Lasserre , Alexandre Boyer , et al.
Société Archéologique de l'Est, pp.339, 2011
Ouvrages halshs-00610972v1

Anemometer based on Seebeck effect

 M. Al Khalfioui , A. Michez , Alain Giani , Alexandre Boyer , A. Foucaran
Sensors and Actuators A: Physical , 2003, 107 (1), pp.36-41. ⟨10.1016/S0924-4247(03)00294-2⟩
Article dans une revue istex hal-00327503v1

Growth parameters effect on thermoelectric characteristics of Bi2Se3 thin films grown by MOCVD system using Ditertiarybutylselenide as a precursor

 A. Al Bayaz , Alain Giani , M. Al Khalfioui , A. Foucaran , F. Pascal-Delannoy , et al.
Journal of Crystal Growth, 2003, 258 (1-2), pp.135-140. ⟨10.1016/S0022-0248(03)01511-2⟩
Article dans une revue istex hal-00327154v1
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Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout

 Nestor Berbel , Raul Fernandez-Garcia , Ignacio Gil , Binhong Li , Alexandre Boyer , et al.
Microelectronics Reliability, 2011, 51 (9), pp.1564
Article dans une revue hal-00669511v1
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Étude du frottement intérieur des borates et phosphoaluminates vitreux par la méthode d'écho d'impulsion (pulse-echo)

 J. Phalippou , Alexandre Boyer , E. Groubert , J. Zarzycki
Revue de Physique Appliquée, 1975, 10 (6), pp.437-442. ⟨10.1051/rphysap:01975001006043700⟩
Article dans une revue istex jpa-00243943v1
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Electro-magnetic robustness of integrated circuits: from statement to prediction

 Sonia Ben Dhia , Alexandre Boyer
2013 9th Intl Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2013), Dec 2013, Nara, Japan. pp.208 - 213, ⟨10.1109/EMCCompo.2013.6735202⟩
Communication dans un congrès hal-00945302v1
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Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC–DC converter

 He Huang , Alexandre Boyer , Sonia Ben Dhia
Microelectronics Reliability, 2015, 55 (9-10), pp. 2061-2066. ⟨10.1016/j.microrel.2015.06.058⟩
Article dans une revue hal-01225333v1
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Methodology of modeling of the internal activity of a FPGA for conducted emission prediction purpose

 Chaimae Ghfiri , André Durier , Christian Marot , Alexandre Boyer , Sonia Ben Dhia
11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017), Jul 2017, Saint-Petersbourgh, Russia. 6p
Communication dans un congrès hal-01574384v1
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Modeling the internal activity of an FPGA for conducted emission prediction purpose

 Chaimae Ghfiri , André Durier , C. Marot , Alexandre Boyer , Sonia Ben Dhia
2018 Joint IEEE EMC & APEMC Symposium, May 2018, Singapour, Singapore. 6p
Communication dans un congrès hal-01839745v1

Modèle d'injection électromagnétique en champ proche sur circuit intégré

 Rachid Omarouayache , Jérémy Raoult , Pierre Payet , Laurent Chusseau , Bertrand Vrignon , et al.
19èmes Journées Nationales Microondes - JNM 2015, Jun 2015, Bordeaux, France
Communication dans un congrès hal-01892688v1
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Electronic counterfeit detection based on the measurement of electromagnetic fingerprint Electronic counterfeit detection based on the measurement of electromagnetic fingerprint

 He Huang , Alexandre Boyer , Sonia Ben Dhia
26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2015), Oct 2015, Toulouse, France
Communication dans un congrès hal-01225354v1
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Sequential adaptive sampling algorithm to reduce the near field measurement time

 Sébastien Serpaud , Alexandre Boyer , Sonia Ben Dhia
International Symposium on Electromagnetic Compatibility (EMC Europe 2019), Sep 2019, Barcelona, Spain
Communication dans un congrès hal-02319466v1
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Low-Cost Broadband Electronic Coupler for Estimation of Radiated Emission of Integrated Circuits in TEM Cell

 Alexandre Boyer , Sonia Ben Dhia
IEEE Transactions on Electromagnetic Compatibility, 2021, 63 (2), pp.636-639. ⟨10.1109/TEMC.2020.3021135⟩
Article dans une revue hal-02937460v1
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Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes

 Alexandre Boyer , Nicolas Nolhier , Fabrice Caignet , Sonia Ben Dhia
IEEE Transactions on Instrumentation and Measurement, 2021, 70, ⟨10.1109/TIM.2021.3126376⟩
Article dans une revue hal-03423272v1
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APPLICATION DES METHODES DE MESURES INDIRECTES DE PARAMETRES " S " EN VUE DE LA GESTION DE L'OBSOLESCENCE DES COMPOSANTS EN IMMUNITE CONDUITE

 Saliha Chetouani , Alexandre Boyer , Sébastien Serpaud , Sonia Ben Dhia
20e Colloque International et Exposition sur la Compatibilité Electromagnétique CEM2021, Apr 2021, Lyon (virtuel), France
Communication dans un congrès hal-03201537v1
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Correlation between Near-Field Scan Immunity and Radiated Susceptibility at Integrated Circuit Level

 Alexandre Boyer , Nicolas Nolhier , Fabrice Caignet , Sonia Ben Dhia
International Symposium on Electromagnetic Compatibility (EMC Europe 2022), Sep 2022, Goteborg, Sweden. ⟨10.1109/EMCEurope51680.2022.9900970⟩
Communication dans un congrès hal-03773209v1
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A Comparative Study of DPI levels on BMS IC With an On-Hand Analytical Model to Predict Resonances

 Badr Guendouz , Kamel Abouda , Alexandre Boyer , Sonia Ben Dhia , Hiba Mediouni , et al.
International Symposium and Exhibition on Electromagnetic Compatibility (EMC Europe 2022), Sep 2022, Goteborg, Sweden. ⟨10.1109/EMCEurope51680.2022.9901210⟩
Communication dans un congrès hal-03773305v1
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Performance Charaterisation of the Decoupling Capacitor Network using the Near-Field Measurement

 Alexandre Boyer , Sébastien Serpaud , Sonia Ben Dhia , Fabio Coccetti
EMC Europe 2023, Sep 2023, Cracovie, Poland
Communication dans un congrès hal-04227864v1
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Modeling and Simulation of LDO Voltage Regulator Susceptibility to Conducted EMI

 Jianfei Wu , Alexandre Boyer , Jiancheng Li , Bertrand Vrignon , Etienne Sicard , et al.
IEEE Transactions on Electromagnetic Compatibility, 2014, 56 (3), pp.726-735. ⟨10.1109/TEMC.2013.2294951⟩
Article dans une revue hal-01159232v1

IC-EMC User's Manual Version 2.0

 Etienne Sicard , Alexandre Boyer
INSA Toulouse France. INSA Toulouse France, pp.310, 2009, 978.2.87649.056.7
Ouvrages hal-00511214v1
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Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project

 Sonia Ben Dhia , Alexandre Boyer
Microelectronics Reliability, 2013, 53, pp.1266-1272. ⟨10.1016/j.microrel.2013.08.016⟩
Article dans une revue hal-00938353v1
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