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Nanoscale concentration and strain distribution in pseudomorphic films Si1−xGex/Si processed by pulsed laser induced epitaxy
L. Vincent
,
F. Fossard
,
T. Kociniewski
,
L. Largeau
,
Nikolay Cherkashin
,
et al.
Article dans une revue
istex
hal-01736031v1
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Effect of the order of He+ and H+ ion co-implantation on damage generation and thermal evolution of complexes, platelets, and blisters in silicon
Nabil Daghbouj
,
Nikolay Cherkashin
,
François-Xavier Darras
,
Vincent Paillard
,
M. Fnaiech
,
et al.
Article dans une revue
hal-01719485v1
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2D-arrays of Si nanocrystals embedded in thin SiO2 layers for new memory devices
M. Perego
,
S. Ferrari
,
M. Fanciulli
,
D. Mathiot
,
K.H. Heinig
,
et al.
INFMeeting 2004, Jun 2004, Genova, Italy
Communication dans un congrès
hal-00134298v1
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Current understanding and modelling of B diffusion and activation anomalies in preamorphized ultra-shallow junctions
Bernard Colombeau
,
A. Smith
,
N.E.B. Cowern
,
B. Pawlak
,
Fuccio Cristiano
,
et al.
2004, pp.91-102
Communication dans un congrès
hal-00140989v1
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On the modelling of transient diffusion and activation of boron during post-implantation annealing
P. Pichler
,
C.J. Ortiz
,
B. Colombeau
,
N.E.B. Cowern
,
E. Lampin
,
et al.
International Electron Devices Meeting, IEDM 2004, 2004, San Francisco, CA, United States
Communication dans un congrès
hal-00141013v1
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SiGe virtual substrates growth up to 50% Ge concentration for Si/Ge dual channel epitaxy
Y. Bogumilowicz
,
J.M. Hartmann
,
Nikolay Cherkashin
,
Alain Claverie
,
G. Rolland
,
et al.
Article dans une revue
istex
hal-01736080v1
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Strain mapping of advanced electronic devices by TEM based methods.
Alain Claverie
,
Victor Boureau
,
David N Cooper
International Conference on Microscopy and 39th Annual meeting of EMSI, Jul 2018, Bhubaneswar, India
Communication dans un congrès
hal-01767810v1
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Process induced strains in FDSOI devices: a contribution of dark-field electron holography
Victor Boureau
,
Martin Hÿtch
,
Benoit Daniel
,
Alain Claverie
Micro and Nano 2015, Oct 2015, Athenes, Greece
Communication dans un congrès
hal-01763625v1
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Influence of average size and interface passivation on the spectral emission of Si nanocrystals embedded in SiO2
B. Garrido Fernandez
,
M. López
,
C. García
,
A. Pérez-Rodríguez
,
J. Morante
,
et al.
Article dans une revue
hal-02356107v1
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(Invited) Impact of Some Processing Steps onto the Strain Distributions in FD-SOI CMOS Planar Devices: A Contribution of Dark-Field Electron Holography
Victor Boureau
,
Daniel Benoit
,
Alain Claverie
ECS Transactions, 2018, 86 (10), pp.37-50
Article dans une revue
hal-02057250v1
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Characterization of Process-Induced Defects
Nikolay Cherkashin
,
Alain Claverie
Alain Claverie ; Mireille Mouis. Transmission Electron Microscopy in Micro-Nanoelectronics, Wiley-Blackwell, pp.165--198, 2013, ⟨10.1002/9781118579022.ch7⟩
Chapitre d'ouvrage
hal-01736027v1
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Si and Ge nanocrystals for future memory devices
Caroline Bonafos
,
Marzia Carrada
,
Gérard Benassayag
,
Sylvie Schamm-Chardon
,
Jesse Groenen
,
et al.
Article dans une revue
istex
hal-01745013v1
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Une technique de détermination du champ de vitesse dans le front d'une flamme se propageant dans une chambre cylindrique
B. Veyssiere
,
Alain Claverie
,
N. Henneton
,
B. Ponizy
11ème congrès francophone de techniques laser, Sep 2008, Poitiers, France. pp.507-513
Communication dans un congrès
hal-00419262v1
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Laser driven shock wave decay and spall damage within metallic targets in sub-picosecond regime
J.-P. Cuq-Lelandais
,
M. Boustie
,
L. Soulard
,
L. Berthe
,
J. Bontaz-Carion
,
et al.
DYMAT 2009, Sep 2009, Bruxelles, Belgium
Communication dans un congrès
hal-00421213v1
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MICRO-ANALYSE DE CRISTAUX EN CROISSANCE SUR UNE SURFACE DE SILICIUM
J. Beauvillain
,
Alain Claverie
,
Yolande Kihn
,
Jean Sévely
,
B. Jouffrey
Article dans une revue
istex
jpa-00223825v1
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Amorphization, recrystallization and end of range defects in germanium
Alain Claverie
,
S. Koffel
,
Nikolay Cherkashin
,
Gérard Benassayag
,
P. Scheiblin
Article dans une revue
istex
hal-01736049v1
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Influence of the initial supersaturation of solute atoms on the size of nanoparticles grown by an Ostwald ripening mechanism
Nikolay Cherkashin
,
Alain Claverie
,
Caroline Bonafos
,
V.V. Chaldyshev
,
N.A. Bert
,
et al.
Article dans une revue
hal-01736067v1
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End of range defects in Ge
S. Koffel
,
Nikolay Cherkashin
,
Florent Houdellier
,
Martin Hÿtch
,
Gérard Benassayag
,
et al.
Article dans une revue
hal-01736054v1
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Strain mapping of tensiley strained silicon transistors with embedded Si1−yCy source and drain by dark-field holography
Florian Hüe
,
Martin Hÿtch
,
Florent Houdellier
,
Hugo Bender
,
Alain Claverie
Article dans une revue
hal-01742020v1
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Time evolution of the depth profile of {113} defects during transient enhanced diffusion in silicon
B. Colombeau
,
N.E.B. Cowern
,
Fuccio Cristiano
,
P. Calvo
,
Nikolay Cherkashin
,
et al.
Article dans une revue
hal-01736110v1
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Atomistic simulation of damage accumulation and amorphization in Ge
José L. Gomez-Selles
,
Alain Claverie
,
Benoit Sklenard
,
Francis Benistant
,
Ignacio Martin-Bragado
Article dans une revue
hal-01719494v1
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Surface self-diffusion of silicon during high temperature annealing
Pablo E. Acosta-Alba
,
Oleg Kononchuk
,
Christophe Gourdel
,
Alain Claverie
Article dans une revue
hal-01719499v1
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Multi-Dot Floating-Gates in MOSFETs for nonvolatile memories - Their ion beam synthesis and morphology
T. Müller
,
K.-H. Heinig
,
Caroline Bonafos
,
H. Coffin
,
Nikolay Cherkashin
,
et al.
Article dans une revue
hal-01736111v1
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High Ge content Si / SiGe heterostructures for microelectronics and optoelectronics purposes
Y. Bogumilowicz
,
J.M. Hartmann
,
J.F. Damlencourt
,
B. Vandelle
,
A. Abbadie
,
et al.
Proceedings - Electrochemical Society, 2004, 7, pp.665-679
Article dans une revue
hal-01736107v1
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Defect engineered blue photoluminescence in ZnO:Al/TiO 2 heterostructures
C. Saini
,
S. Bhowmick
,
A. Barman
,
N. Kumar
,
A. Das
,
et al.
Article dans une revue
hal-03854064v1
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Influence of some process steps onto the deformation of the channels of FD-SOI CMOS transistors
Alain Claverie
,
Victor Boureau
ECS Conference, 2018, Cancun, Mexico
Communication dans un congrès
hal-01763005v1
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Chocs laser dans les solides
M. Boustie
,
T. de Resseguier
,
L. Berthe
,
R. Fabbro
,
M. Nivard
,
et al.
2ème Forum de l'Institut Laser Plasma, Mar 2007, Arcachon, France
Communication dans un congrès
hal-00274033v1
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Effects of the velocity ratio on the mixing in a reactive high-speed subsonic turbulent H2 jet in an air coflow
J. Grondin
,
Alain Claverie
,
M. Bellenoue
14th International Symposium on Applications of Laser Techniques to Fluid Mechanics, Jul 2008, LISBONNE, Portugal. pp.00
Communication dans un congrès
hal-00360558v1
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L'influence des instabilités thermiques sur les conditions d'apparition du phénomène de backdraft
G. Guigay
,
J.-M. Most
,
F. Penot
,
J. Eliasson
,
B. Karlsson
,
et al.
11è Congrès Francophone de Techniques Laser, Sep 2008, Futuroscope, France. pp.175-182
Communication dans un congrès
hal-00418887v1
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In-situ transmission electron microscopy studies of the crystallization of N-doped Ge-rich GeSbTe materials
Marta Agati
,
François Renaud
,
Daniel Benoit
,
Alain Claverie
Article dans une revue
hal-02061850v1
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